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- Pickering Interfaces Inc.
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eBIRST™ – Switching System Test Tools
The eBIRST toolset consists of four different tools that support 200-pin LFH, 104-pin, 78-pin and 50-pin D-type connectors and a set of adaptors that allow connection to other connector types. A supplied application program controls the eBIRST tools via a USB2 port that also provides the tool power and controls the switching system using a Test Definition File to define the test sequence.
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Modbus Diagnostic Program
Modsak
Modsak is a versatile Modbus diagnostic program. It will be of interest to device manufacturers, software developers, system integrators and field service engineers. Modsak can be used to test or simulate almost any device or system that uses the Modbus protocol: slave devices, PLC's, HMI's, MMI's, DCS's, RTU's, SCADA systems, bridges, gateways, device servers, etc.
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Inertial Systems
ACEINNA’s inertial systems provide end-users and systems integrators with fully-qualified MEMS-based solutions for measurement of static and dynamic motion in a wide variety of challenging environments, including; avionics, remotely operated vehicles, agricultural and construction vehicles, and automotive test.
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IEC 61850 Client Simulator
The SimFlex IEC 61850 Client Simulator is an advanced IEC 61850 tool that enables manufacturers, system integrators, utilities and conformance test laboratories to automatically verify IEC 61850 based IEDs. The SimFlex Client Simulator comes with an extensive test suite that implements the test cases defined in IEC 61850-10. Through test scripts that can be individually selected and executed this tool provides a highly flexible and easy to use test environment.
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Imaging Gauge Software Test System
The IMAGING GAUGETM quality analysis system was developed by APPLIED IMAGE to address the growing need to standardize the evaluation of camera image quality. The system includes a Test Chart manufactured using our ACCUedge® technology, along with unique Image Analysis Software, used together to analyze the quality of the imaging system, and then provide a summary report on the various image quality metrics. Our goal is to provide a simple to use, unique image analysis system, that can be utilized by R&D, scientists, system integrators, technicians and field operators to evaluate the camera quality or imaging system.
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High-power DC Electronic Load (6kW~60kW)
FT68200A/AL/E Series
Shenzhen FaithTech Technology Co., Ltd.
FT68200 series high performance high-power DC electronic load provides three voltage ranges 150 V/600 V/1200 V, maximum current 2400 A per single unit, stand-alone power from 4 kW to 60 kW, expandable up to 600 kW, 10000A by master-slave paralleling. Ultra-high power density, 6kW is with only 4U height. Wider operating region, faster dynamic frequency, as well as transient mode, OCP/OPP test, sequence test, automatic test and battery discharge test functions greatly enhances its test strength and expands application coverage. Furthermore, two times instantaneous overpower loading capability can effectively reduces user’s test cost. Built-in standard RS232, RS485, LAN, USB (serial), optional GPIB and CAN interface, supports SCPI, ModBus RTU and CANopen protocol, which facilitates system integrators. FT68200 series has full protection functions, which can be applied to power battery discharge, DC charging station, charging piles, charging pile modules, vehicle On Board chargers (OBC), high-power switching power supplies, power electronics and other power electronics products.
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SCL Checker
The SCL checker is a tool that checks SCL files for conformance with the IEC 61850 SCL schema (Edition 1 and Edition 2) and performs various tests on the contents of the SCL file.The SimFlex™ SCL Checker enables utilities, manufacturers, system integrators and conformance test laboratories to automatically verify SCL files.
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The Integrated Solution To GNSS + GBAS Functional Testing
GSS4150
To help developers and integrators test the airborne GNSS receiver in their GBAS landing system (GLS), Spirent has developed the GSS4150 solution. The GSS4150 is a VHF signal source generator, supporting multiple different message types, enabling you to build the solutions that power the future of aviation.
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Microwave System Amplifier, 2 GHz To 8 GHz
87415A
The Keysight 87415A microwave component amplifier brings compact, reliable gain block performance to systems integrators and microwave designers. With 25 dB minimum gain and over 23 dBm output power from 2 to 8 GHz, this amplifier offers output power where it is needed: at the test port.
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Test System
LPDDR4 and LPDDR3
Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.
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Advanced Serial Protocol Analyzer
Most data networks are complicated, not just the hardware and network issues, but also the high-level protocols that devices use to communicate; and to make things even more complicated, many manufacturers have incorporated proprietary protocols for their devices. Integrating different devices and protocols within a data network is always the most challenging task for system integrators, firmware / software developers, and site engineers. From the simplest loopback test to complicated checksum calculation and sophisticated firmware and GUI software development, the 232Analyzer is designed to tackle all these challenges.
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Test Cell Controller
RAPID
The Rapid II Test Cell Controller is an integrated, multi-loop control and data acquisition system for test cell applications, designed to provide maximum performance at an affordable price. Rapid II combines the latest in digital control technology with off-the-shelf hardware to produce one of the industry's most powerful, flexible and advanced controllers at a cost-effective price. This high-speed, 4-channel PID controller includes ample I/O to act both as a system controller and a data acquisition system, reducing overall system cost and complexity. Designed for integrators, OEMs, and DIYers, these systems can be configured to fit your needs with little upfront costs and minimal risk while benefiting from a stable, powerful platform.
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BGAN Network Emulator
BNE
Square Peg Communications Inc.
The Gatehouse BGAN Network Emulator (BNE) is a test tool developed and optimized to work in concert with the Square Peg BPLT to provide end-to-end emulation of the BGAN Network. The combination of the BPLT and BNE provides an on-the-bench emulation of the I4 satellites, the BGAN Radio Access Network (RAN) and the Core Network (CN). It is a very powerful test solution that enables terminal manufacturers, system integrators and application developers to test their applications thoroughly and consistently and to verify that applications are optimized to work under any network condition thereby providing the best possible user experience.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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ESD Test System
58154 Series
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Test System Replication/Build-to-Print
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Communications Test System for Frontline Diagnostics
ATS3000P
The ATS3000P is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000P also includes the sophisticated IF and baseband I/Q DigitalSignal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easyto-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets are available for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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Communications Test System for Frontline Diagnostics
CTS-2750
The CTS-2750 is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The field-upgradeable, software-defined architecture features easy-to-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets can be created easily using the included TestEZ® software suite.
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PXI Semiconductor/IC Test System
A high-density 100MHz PXIe digital IO card designed for characterizing, validating, and testing a variety of digital and mixed-signal ICs. Each IO card consists of a Sequencer Pattern Generator (SQPG) and 32 channels of full ATE-like features. The 33010 IO card is expandable up to 256 channels. Some unique features of the 33010 include an on-board SQPG, per pin timing/levels/ PMU/TFMU, multiple time domains, and multithreaded testing for complex IC testing. Each channel is also equipped with 64M vector memory, 16 timing sets with on-the-fly timing change, and per pin timing and frequency measurements up to 400 MHz.
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Test Executive for Visual Development, Database Storage, and Run-Time Execution of Test Strategies
TestBase
TYX TestBase is a test executive that supports the visual development, database storage and run-time execution of test strategies (also known as test plans or test sequences).TestBase integrates third-party applications such as: test programming languages, document viewers, report generators, database engines, Configuration Management systems and diagnostic tools.Its modular and open architecture enables system integrators and end-users to customize and extend the product and to integrate additional third-party applications.
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Test System
BMS HIL
The BMS Hardware-in-the-Loop (HIL) Test System is a high performance platform providing all necessary input signals used for battery pack simulation. A real-time operating system executes complex cell and pack models commonly used for BMS algorithm development and firmware regression testing.
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Photodiode Burn-in Reliability Test System
58606
The Chroma 58606 PD/APD Burn-in system is a high density, multifunction and temperature controlled module based system for photo diode burn-in and lifetime test. Each module has up to 256 Source Measurement Unit channels which can source current and measure voltage in various scenarios such as one described below. The system can accommodate 7 modules for a total of 1,792 device channels.
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VXI Digital Multiplier
4152A
The 4152A’s advanced features like limit testing, averaging, speed/resolution trade-offs, and fast function changes provide the high “test system” throughput required in today’s production test environments.
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Mini LED Backlight Module Automatic Optical Test System
7661-K003
Chroma 7661-K003 Mini LED Backlight Module Automatic Optical Test System contains a 71803-2 2D color analyzer to measure chromaticity and brightness
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In-Circuit Test Systems For Sale
Forwessun offers a comprehensive range of global services for a variety of Test Systems. We provide refurbished systems that have undergone rigorous testing, giving you reliable performance at a fraction of the cost of new equipment. Whether you’re looking for a long-term solution to enhance your testing capabilities or a temporary setup to meet increased production demands, we have flexible options to suit your needs. - HP3070- Agilent - Keysight- GenRad- Teradyne Our bespoke rental agreements make it easy to scale up without permanent investment—simply return the system when it’s no longer required. For ongoing support, we offer calibration, repair, and maintenance services through convenient service contracts. If you’re looking to retire any outdated or non-functional In-Circuit Test (ICT) systems, we’ll offer fair market prices, helping you maximise value on any surplus equipment.
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Semiconductor Test System
TS-960e
The GENASYS Semi TS-960e PXI Express Semiconductor Test System is an integrated test platform that offers comparable system features and capabilities found in proprietary ATE systems. Available as a bench top system or with an integrated manipulator, the TS-960e takes full advantage of the PXI architecture to achieve a cost-effective and full-featured test solution for device, SoC and SiP test applications.
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Systems Certification
Project integration offering a complete turnkey solution including design, engineering, FAA and international regulatory certification services and testing, and installation kit manufacturing.
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Aircraft Data Systems
Aircraft data systems for commercial and military applications, including Aircraft Interface Devices (AID), avionics I/O computers, avionics test & simulation interfaces, and Embedded avionics interfaces.
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Regenerative Battery Pack Test System
17040
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
