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- Pickering Interfaces Inc.
product
PCI Resistor Card 2-Channel 1.5 Ohm To 4.09k Ohm With SPDT
50-293-123
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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128 DIOs JTAG Boundary Scan Resources Unit
YAV9JTAG
Boundary-scan is a widely practiced test methodology that is reducing costs, speeding development, and improving product quality for electronics manufacturers around the world. By relying on an industry standard, IEEE 1149.1, it is relatively quick, easy, and inexpensive to deploy a highly effective test procedure. In addition, today’s PCBs have little alternative because of limited access to board-level circuitry.
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Laser Diode Burn-in Reliability Test System
58604
The Chroma 58604 is a high density, multi-function, and temperature controlled module for laser diode burn-in and lifetime tests. Each module has up to 256 SMU channels which can source current and measure voltage in various control modes as described below.
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Headlamp Test Platform
Leverage 25+ years of automotive test experience, with the specialized design and manufacturing of automotive lighting testers. Using specialized know-how in this field, including photometric, electro-mechanical equipment and software solutions, accelerate your time to market with a higher quality product.
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Run-time production test environment
XJRunner
XJRunner is the specialised run-time environment for executing pre-compiled XJDeveloper projects. With a range of special features it is particularly aimed at board manufacturers and in-field support.
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500KG MicrocomputerTensile Test Machine
CX-106
Shenzhen Chuangxin Instruments Co., Ltd.
The Tensile Testing Machine is widely applied to test the tensile, tear, peel, and bend of all kinds of materials, such as metal, cable and etc, it’s used to test the tensile, tear, peel, compressive strength and bending of the material. It conforms to the standard of GB, ISO7500/1, JJG475-88, ASTME4, DIN5122, JISB7721/B7733, EN1002-2, BS1610, and CNS9471/9470.
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Test Fixtures
Test fixtures are a product for the test and the testing of printed circuit boards. The test adapters offered by uwe electronic are suitable for both manual testing and automated testing with vacuum operation. The test fixture can be either fully equipped and wired or delivered without installed components. Pneumatic, Mechanical and Vacuum Fixtures.
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Microelectronics Test & Engineering Services
EAG's Microelectronics Test and Engineering lab network provides semiconductor and electronics design firms worldwide with test, debug, and early engineering support to help you with new product introduction. We actively service a broad range of semiconductor and electronics companies worldwide. Services include ATE testing, Reliability testing and qualification, ESD testing, Failure Analysis, FIB Circuit Edit and Debug. for both ICs and systems
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Drop Test Machine
Single-wing Drop Test Machine Simulate the drop conditions of packaged products when different faces, edges and corners fall to the ground from different heights, thus to understand the damage of the product and evaluate the drop height and impact resistance that the packaging materials can endure while falling down, so as to improve and optimize package design according to actual conditions of the product and national standard range.
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Cable Harness Test System
Data Patterns has built high reliability Cable Harness Test Systems for large installations. These are primarily used in launch vehicle aircraft and missile level cable harness test validation. Installations with upto 20,000 lines test capability at a single location have been supplied by Data Patterns. Portable version capable handling of as small as 384 points have also been addressed.
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EN60350-2：2013 Cookware Test Pot Test Vesssel
CX-G08
Shenzhen Chuangxin Instruments Co., Ltd.
EN60350-2：2013 cookware test pot test vesssel
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Ethernet Test and Simulation Instruments for Speeds from 10 Mbit/s to 25 Gbit/s
Avionics Interface Technologies
AIT’s Ethernet test instruments provide Ethernet test features for 10Mbit, 100Mbit, 1Gbit, and 10Gbit Ethernet networks, for both Optical and Copper media. All instruments are supported by Analyzer and Simulator software applications (GUIs) and additionally software API’s allowing integration into user applications.
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MECHANICAL TEST FIXTURE KITS
TX-MT-100 SERES
Test-X MT-100 Series mechanical kits are an inexpensive solution for testing smaller printed circuit boards and other devices.The MT-100 Series features a 1/2" thick FR4 probe plate and a 3/8" thick Lexan top plate. Precision alignment is assured through tooling holes in both the probe and top plates. Units are available with a 2-1/2" pan or an upper head assembly
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High Power Burn-In Test
Easily test the reliability of your high power laser devices with the Y2000H burn-in and life-test system. It will quickly identify defective laser devices so you can prevent them reaching your customers. Y2000H's full automation and expandable capacity helps you work through your tests more productively. And its user-friendly software makes testing your devices easier than ever.
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Communication Test System
CTS-2700
The CTS-2700 is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The field-upgradeable, software-defined architecture features easy-to-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets can be created easily using the included TestEZ® software suite.
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Pump Test System
This automated test system evaluates a wide range of performance metrics for a cooling pump assembly. The LabVIEW based system programs the DUT then initiates a series of tests to check:Serial communication verificationMotor voltage & currentImpeller speed and flowAir and water temperaturesLeak and level sensor functions
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NBS Abrasion Tester
UI-FT40
NBS Abrasion Tester is used to test rubber abrasion resistance and to know material nbs abrasion index. NBS abrasion test is suitable for vulcanized rubber used for soles and heels of footwear. Unuo NBS Rubber Abrasion Tester is designed and applicable according to ASTM D1630. Here for More Abrasion Tester.
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Quickly Upgrade RF ATE Testers
MP5800 / MP5806
*MP5800 Quickly Provides 3380 / 3650 RF ATE Test Capabilities*MP5800 and 3380/3650 hardware and software are fully integrated*Provide complete and user-friendly RF / Digital debug tools*Provide a complete solution for IOT applications*Provide API for production automation software*Integrate Zimmer 3380/3650 to provide RF/Digital comprehensive ATE test solution
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HYBRID LED CIRCUIT TESTER, 12-42V
MD1651
*Tests standard automotive electrical DC 12-42V circuits*Safe for low current circuits and hybrid vehicles*Automatic voltage identification featuring blue for under 40V and red for over 40V
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PXIe-S5090 2-Port 9 GHz Analyzer
PXIe-S5090
The PXIe-S5090 delivers metrology-grade VNA performance and speed to National Instruments’ PXI system. This high-performance vector network analyzer allows testing of two-port devices from the bench to the production floor in a compact, modular form factor. With 138 dB dynamic range and +13 dBm maximum power, this VNA is engineered for short time to first measurement and also for high performance automation with fast test times.
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cRIO-PB-MS, Master/Slave, C Series PROFIBUS Interface Module
781352-01
Master/Slave, C Series PROFIBUS Interface Module - The cRIO-PB-MS connects NI programmable automation controllers (PACs) to PROFIBUS industrial networks as powerful masters or slaves. The interface includes the NI‑PROFIBUS for CompactRIO instrument driver for human machine … interface (HMI) and SCADA applications, as well as a graphical networking Configurator software. You can perform PROFIBUS device automated test using these interfaces. The cRIO-PB-MS is compatible with only CompactRIO systems.
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Amine Blush Chip Screen Test Kit
Elcometer 139
The presence of amine blush is indicated by a visual change of colour of the test solution when compared with a control sample. The Elcometer 139 determines whether amine blush is or is not present on the coating’s surface.
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IL/RL Testing Platform
JW18001
Shanghai Joinwit Optoelectronic Tech,co.,Ltd
To meet the test requirements of MPO devices, we adopt the JW18001 optical device testing platform,JW1608 No-mandrel IL/RL tester module, JW1606 multi-channel optical switch module and form an integrated solution for MPO testing. The application of No-mandrel technique solves the problem that the multi-core optical device can not be winded and needs fiber matching cream, thereby the testing efficiency of the insertion loss and return loss of the multi-core / ribbon fiber has been greatly improved. At the same time, MPO applications can configure a variety of testing mode, test reports, threshold setting function, so multi-core optical device testing is no longer complicated.
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Volt Tester
PPTACT1CS
THE PROBE 12-Volt Test Light with Haptic Feedback, (PPTACT1CS) this tool vibrates and lights when voltage over 12 volts is detected. When a voltage is below 12 volts, this functions as a standard test light. Just push the button and go! Shows positive voltage, ground, and continuity “all in one tool” with haptic advantage.
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Compliance Test, Development and Test Service
DinoStor
With its focus on solving critical backup problems associated with Network-Attached Storage (NAS), DinoStor delivers a broad range of products and services to benefit users and vendors of NAS solutions.
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Anti-Interference Test Equipment
Beijing KeHuan Century EMC Technology Co,.LTD
Anti-Jamming Test Equipment.
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PXI 32 Channel I/O, Low Side Driver
40-413-002
A 32 channel Digital I/O module with high output voltage and current capability and a dual variable threshold input. The 40-413 range is available in three configurations, a high side only, a low side only (shown here)and a combined high and low side each capable of driving 2A loads. Each output is fully protected against over-voltage, over-current and thermal overload, ensuring robust and reliable operation in the toughest test environments. For high side voltage driving the high side voltage source is supplied from an external voltage source, permitting the module to drive high capacity loads without impacting the PXI chassis power supply.
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FPGA Image Processing (IP) Development Kit
ProcVision
Gidel’s Vision Pro Development Kit is an optimal solution for developing,validating, demonstrating and evaluating Image Processing (IP) andpipeline designs on FPGA.The suite is designed to provide a complete and convenient envelop enablingthe developer to focus strictly on the proprietary image processingdesign. The entire Vision Pro flow is within a single FPGA, independentof the final target application(s). The Vision Pro flow is composedof a pipeline that streams simulated data to the user image processingdesign under test (DUT) and then captures the design’s output streamfor displaying, storing, analysis and/or co-processing on host software.The entire process is performed on a single FPGA without the need foradditional peripheral connectivity or tools.Vision Pro suite is plug-and-play enabling the developer to begin at oncethe IP design development and validation. A simple design example providesthe developer immediate hands-on familiarization with the systemflow and supporting tools. The final design can be ported to any IntelFPGA device or other vendors’ devices (FPGA or ASIC) by replacing basiclibraries. To significantly reduce compilation time, initial design developmentmay be on a small FPGA device and later compiled for the targetdevice(s). The target implementation may use any FPGA board. For a fullImaging/Vision system solution, Gidel offers a number of off-the-shelfgrabbers and FPGA accelerators that are designed to utilize these imageprocessing blocks and Gidel Imaging Library (GIL).
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SCSI V Cable Tester
PR-09SCSIV
The Universal Cable Tester is a compact, stand-alone unit which gives technicians an affordable way to test PC, serial ATA, network, telecom, coaxial, USB A/B, mini USB A/B/AB, 1394 Firewire 4/6, and SCSI I, II, III, and V cables for continuity, wiring configuration, opens, shorts, miswiring, and cross-connected wires.
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Time Sensitive Networking Evaluation-Kit
The evaluation kit offers developers the possibility to test and evaluate Ethernet TSN for their own applications. It consists of either a Smartzync board (Xilinx) or a Netleap board (Intel/Altera) with an optionally implemented IPMS TSN-IP core for endpoint applications (TSN-EP), switched endpoint applications (TSN-SE) or switch applications (TSN- SW). Linux drivers with application examples, as well as RTOS test applications and TSN network configuration examples are also available.
