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- Virginia Panel Corporation
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Tool, Extraction, 50 Ohm Coax & Power Surface
910112112
Tool, Extraction, 50 Ohm Coax & Power Surface
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3D Optical Profilers
ZYGO's 3D Optical Profiler instruments enable precise, quantitative, ISO-compliant, non-contact surface measurement and characterization of micro- and nano-scale surface features, capturing up to two million data points in just seconds. Applications range from topography and waviness to roughness and microstructure characterization on samples as that vary from ultra-smooth sub-angstrom optical surfaces, to extremely rough and diffuse 3D printed surfaces.
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Surface Profilers
Taylor Hobson offers a world leading range surface form, surface finish and metrology solutions for 3D contour,ideal for the most demanding applications.
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3D Profilers
AEP Technology offers different kinds of 3D profilers. Rugged platform, advanced electronic equipment, clean test space, low carbon emission, low machine noise, high-end lens, etc., make our surface profiler unique in the imaging world. In addition to providing stand-alone contact 3D profilers and optical 3D profilers, we also provide the world's only cross-platform, dual-mode 3D profiler that is compatible with both tactile and optical profilometers.
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Optical Profilometers
Profilm3D® and Zeta™ optical profilometers provide fast, easy, non-contact solutions for 3D surface topography measurements. Our portfolio of optical profilers supports a variety of measurement techniques, including white light interferometry, True Color imaging and ZDot™ confocal grid structured illumination. KLA Instruments can help guide you to the right optical profiler solution for your unique needs.
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Surface Analysis
Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.
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Surface Profiler Measurement System
SP series
SP series, high accuracy 3D surface profiler measurement system with white light interferometry.
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Profilometer
NANOVEA Optical Profiler is a 3D, non-contact profilometer designed with Chromatic Confocal technology, which uses wavelengths of light to accurately determine physical height. The Optical Profilers NANOVEA offers include compact, stand-alone and portable profilometer models. High-speed sensors are available to scan large surface at high accuracy.
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Surface Analysis
Bruker Nano Surfaces provides industry-leading surface analysis instruments for the research and production environment. Our broad range of 2D and 3D surface profiler solutions supply the specific information needed to answer R&D, QA/QC, and surface measurement questions with speed, accuracy, and ease. Bruker’s AFMs are enabling scientists around the world to make discoveries and advance their understanding of materials and biological systems. Our tribometers and mechanical testers deliver practical data used to help improve development of materials and tribological systems.
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Stylus Profilometry
Dektak®
Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
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Robotic Vehicle Gap / Flush Measurement System
Automation
LaserGauge® Automation is a robotic system for measuring vehicle gap/flush on a moving assembly line. It is cost-effective, fast, flexible, and delivers LaserGauge® accurate measurements. Utilizing the Cross-Vector scanning and Blue Laser Technology, the system provides more assembled-panel surface information than any other robotic laser profiler.
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Multi-Surface Profiler
Tropel® FlatMaster® MSP
The Tropel® FlatMaster® MSP (Multi-Surface Profiler) is a frequency stepping interferometer that provides fast and accurate metrology for semiconductor wafers up to 300mm in diameter. In seconds up to 3 million data points are collected with sub-micron accuracy enabling total thickness and flatness characterization over the entire surface.
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High Resolution Thickness & Surface Profiler for as-sawn Wafers
MX 70x
The MX 70x series measure Thickness, Warp, Waviness, Roughness and are usable for nanotopography.
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Non-contact Optical Surface Profiler
VS-OSP
The VersaSCAN OSP integrates the Base with a high-accuracy, high-speed laser displacement sensor. The OSP technique uses diffuse reflection mechanism to measure topography of a sample. OSP can be used to measure topography, as a very sensitive leveling mechanism, or charting topography to be implemented with other scanning probe techniques for constant-distance mode operation.
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Thermal Profiler
V-M.O.L.E.®
The V-M.O.L.E. is a full-featured compact thermal profiler that belies its sophistication in an easy-to-use 3-channel Mini-thermocouple configuration. Ideal for VERIFICATION of PCB profile performance, 3 channels give you Hot, Cold and Sensitive component data for verifying the correct oven settings.
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Profiler
fastCTD Profiler
An evolution of the miniCTD, it has a conductivity cell designed for optimum flow-through, a fast response thermistor temperature sensor and a 0.01% pressure sensor synchronously sampling at 32Hz deliver the highest quality profiles in a lightweight and robust package. The package is completed with an integral fluorometer based on Valeport’s new Hyperion range and optional Bluetooth communications module.
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Humidity And Temperature PROfilers
RPG's profiling radiometers are mainly used to derive vertical profiles of atmospheric temperature and humidity (RPG-HATPRO). The infrared radiometer extension allows to cloud base height and ice cloud detection.The radiometer series covers high-resolution temperature profiling of the boundary layer and low-humidity applications. All models of the series provide accurate total amounts of atmospheric water vapor and cloud liquid cloud. RPG radiometers are stand-alone systems for automated weather-station use under nearly all environmental conditions. A variety of retrieval algorithms (custom designed and global standard algorithms) can be selected.
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Wind Profilers
Bristol Industrial & Research Associates Ltd
Biral provides Sodar systems for the 3-dimensional measurement of wind speed and direction in a vertical column extending hundreds of metres above the sensor. Sodar systems are used in applications such as wind energy site assessment, wind shear detection at airports, plume modelling and basic research.
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Surface Cleanliness
Surface cleanliness: Soluble salts & ion specific contamination (sulphates, chlorides, nitrates etc.) which are often invisible to the eye, together with amine blush (for amine cured epoxy coatings) can result in premature coating failure, resulting in high re-coating and maintenance costs. Elcometer has a range of test equipment for assessing surface cleanliness prior to applying a coating.
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Beam Profiler
WinCamD series
CW & Pulsed laser profiling. Wavelength Range: 190 nm- 15 m*. Resolution: 5.0 m*. Smallest Beam: 42 m*.
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Specialized Beam Profiler Systems
DataRay offers specialized beam profiler systems. These systems offer solutions for complex applications. The large beam profiling system is suitable for beams up to 200 mm image area, and the line laser profiling system provides for direct measurement of line lasers up to 200 mm in length.
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MiniCTD Profiler
The miniCTD has been developed to provide a cost-effective tool for the collection of CTD Profiles, without compromising the quality of the data.
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Surface Thermography
Advanced Thermal Solutions, Inc.
Liquid Crystal & Surface Thermography Systems for Temperature Mapping Studies.
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Multi-Parameter Profiler
fastCTDplus Chlorophyll a
An evolution of the miniCTD, the fastCTDplus multi-parameter profiler is designed to deliver the highest quality CTD and Chlorophyll a observations at fast drop rates.
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Surface Measurement Instrument
SMI
Redefining speed and accuracy in non-contact metrology, the Optikos SMI is a high-speed surface topography instrument that characterizes spherical, toric, and aspheric surfaces. The SMI measures surface shape deviations of precision surfaces using wavefront analysis technology. Configured to measure such items as: micro-optics, ball lenses, and contact lens molds, the instrument allows users to easily measure aspheric and toric parts without the need for reference surfaces.
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Non-Contact Beam Profiler
BeamWatch
The patented BeamWatch non-contact profiling system accurately captures and analyzes industrial multi-kilowatt lasers wavelengths from 980nm - 1080nm by measuring Rayleigh Scattering. It features a complete passthrough beam measurement technique, no moving parts, and a lightweight compact design which makes it ideal for comprehensive analysis of industrial multi-kilowatt lasers
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Camera BasedBeam Profilers
Our Camera beam diagnostic Line-up offers measuring capabilities starting from sub-micron laser beams to sensors of 1/1.2" with built-in automatic filters wheels. The camera based beam diagnostic offers the intensity measuring profile and the detailed beam power distribution within the profile.
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Hand-Held Surface Probe
HP 1000-SP
Advanced Thermal Solutions, Inc.
The HP 1000-SP is a stainless steel, single-sensor hand-held probe designed for measuring the surface temperature of solids. Its pointed tip allows for exact positioning of the sensor on the desired spot. This enhances measurement accuracy by eliminating any conduction heat transfer that may occur through the stem.
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Non-contact 3D Optical Profilers
LuphoScan platforms are interferometric, scanning metrology systems. They are designed to perform ultra precision non-contact 3D form measurements mainly of rotationally symmetric surfaces such as aspheric lenses.
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Surface Resistance Meter
Wolfgang Warmbier GmbH & Co. KG
Starterkit for testing conductive an dissipative surfaces and electrostatic fields/surface potentials
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Surface Analysis
Dimension FastScan Bio
The Dimension FastScan Bio Atomic Force Microscope (AFM) breaks longstanding barriers to provide routine high-resolution research of biological dynamics, with temporal resolution up to 3 frames per second for live sample observations. Furthermore, it does this while making the AFM easier to use than ever before.
