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- Virginia Panel Corporation
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ITA, I2 Micro ICon, 120/12 Position Hybrid
410130104
The i2 Micro iCon ITA is capable of holding up to 120 QuadraPaddle contacts and up to 12 Micro Power or Micro Coax contacts. Its sleek, 0.8” footprint increases the horizontal stackability. The 30 degree U-shaped cable clamp allows ITA modules to be pre-wired before assembly and can hold cable bundles with an oblong bushing effective diameter of 0.77 in. The removable cover allows easy access to wiring for maintenance and probing. Integrated spring locking tabs ensure even and secure engagement.
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RF/High Frequency Probes
Everbeing is proud to distribute GGB Industries line of PicoProbes for customers everyday RF probing needs. The popular model 40A has been serving the needs of many high frequency researchers in the sub-40 GHz range. For more information on their products, visit www.ggb.com. If a product they sell is not shown here, we are still able to acquire for you. Please contact us for more details.
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Probing Machines
Probing machine is a wafer transfer and positioning device used for testing the electrical characteristics of chips formed on wafers. This wafer test is used to sort out good and defective chips.
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Probe Pins
Cobra-Series
Cobra-series probe pins offer long lifetime and low particle contamination for high-density probing applications. We can produce them using different materials and fine pitch geometries.
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Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
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CAMGATE Test Kits
Series 453
LThe GR Series 453 CAMGATE mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 453 provides interface compatibility using the GR2270 Style, 12 block interface. This interface accepts the industry standard I/O, power, and coax blocks. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components.
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Passive Probes
Passive voltage probes ship standard with most oscilloscopes and provide a low cost, general purpose probing solution. Generally, these probes lack the performance of an active voltage probe but provide the ruggedness and wide dynamic range suitable for visualizing signals over a broad range of applications. Tektronix has released a new class of passive probes that redefine performance in the passive probe product category.
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Cryogenic Applications
Over the last 20 years the Celadon Engineering team has developed an expertise in cryogenic materials which has resulted in a solid reputation in the industry for producing extremely stable cryogenic on-wafer probe card as well as DUT probing solutions. These custom cryogenic probe card solutions are widely used to test Space, Military, Medical and Quantum Computing products. Celadon’s cryogenic solutions vary from standard VersaTile™ footprints which interface to positioners to innovative custom PCB based designs to allow for flexibility when testing at these very cold temperatures. Lakeshore cryogenic wire is used in standard DC solutions for high density cableout designs to support high pin count applications. During the development process, Celadon works closely with the cryogenic prober vendor to ensure the integrated solution is optimized for current and future testing needs.
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Cryogenic Probe Station
FWPX
Lake Shore’s FWPX probe station is designed for researchers who require large-size wafer probing. The FWPX accommodates wafers up to 102 mm (4 in) in diameter and can be modified to accept up to 152 mm (6 in) wafers. This general-purpose probe station is designed for researchers or engineers conducting material characterization tests over large samples. It is also an effective unit for measuring organic materials.
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Probing Adaptors
Accessories primarily enable the connection between an industry standard logic analyzer footprint (D-Max, Mictor, P6860, etc) and an instrument probe. For example, a connection between a D-Max footprint and the digital channels of an MSO (Mixes Signal Oscilloscope). They can also enable the interconnect of a probe to a different industry standard footprint. Adding flying leads to a probe designed for a mictor footprint and a probe tester are also some of the accessories that are available.
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Microwave Testing
75
The MODEL 75 PICOPROBE® sets new standards in microwave probing performance. Benefiting from coaxial techniques, which have inherent low loss and low dispersion characteristics, the Model 75 Picoprobe, with or without the bias T option, achieves an insertion loss of less than 1.0 db (typical) and a return loss of greater than 15 db (max.) over its frequency range.
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Nano Technology Products
We are instrumental in offering quality range of nano technology products that find application in defense research and development organization. Our range encompasses probe station, microscope, extension cable, adopter and RF probing, and vibration isolation products. We have the ability and resources to design products in line with the exact specifications provided by the clients.
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Passive Probe, 10:1, 350 MHz, 1.3 M
N2872A
Compact 2.5-mm probe head diameter, low input capacitance, and various fine-pitch probe tip accessories make the Keysight N2870A Series passive probes ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
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Probe Card
VersaTile™
Celadon has reduced the size of a probe card to 28mm with the VersaTile™ with Advanced Cantilever™ technology. The VersaTile™ with Advanced Cantilever™ technology can fit on a conventional 3-hole mount probe positioner for single site probing. The same VersaTile™ with Advanced Cantilever™ technology can be used in a 300mm VersaPlate™ for multi-site probing.
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Measuring Arms
Among the highly ergonomic and portable scanning and probing solutions that QFP offers are the KREON arms , a range of tools capable of operating on different working volumes (approximately from 2 meters with the ACE 6-20 model to 4.5 meters with the ACE 6-45 model) applicable in different sectors.
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InfiniiMax III+ Series Probe Amplifier, 4 GHz
N2830A
The N2830A Series InfiniiMax III+ probing system is the next generation of InfiniiMax probing, greatly expanding the measurement capability and usability of a probe capable of measuring all components of a differential signal. The built-in InfiniiMode technology allows customers to switch differential, single-ended, and common mode without adjusting probe tip connections.
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Digital Display Auto Circuit Tester
1676
Peaceful Thriving Enterprise Co Ltd
This is a DC voltage tester with smart over-voltage protection and warning for vehicle repair. As electrical system for vehicle becomes more complex, the tester is able to test voltage value, identify DC polarity from different background light color, positive / negative sign, and over-voltage level indication. Moreover, the special designed probe is able to help user to hook, piercing, and probing the wires.
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Semi-Automatic LCD Probe Station/Laser Repair System
LCD 2424
The Model 2424 Semi-Automatic LCD Probe Station is designed especially for probing LCDs and other large substrates. Built on a steady and reliable anti-vibration table, the Model 2424 has powerfully built features that perform a number of specific tests required by all LCD/flat panel display manufacturers.
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Flying Probe Tester
Pilot 4D V8
The Pilot 4D V8 represents the latest frontier in flying probe test technology; it is the complete solution for those who want maximum performance: the highest test speed, low to medium volume, test coverage and flexibility, for prototyping, manufacturing, or repairing any type of board. Its vertical architecture is the optimum solution for probing both sides of the UUT simultaneously.
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Surface Mount Package Emulation
SMT Adapters
Ironwood’s SMT package emulation adapters are often called “surface mount feet” or “emulator bases”. These adapters provide access and interconnections to surface mount lands. Typically, the adapters are soldered to the target board in place of the IC device and provide a pluggable array of pins interface for sockets, probing adapters, package converters, and even board-to-board connections. These adapters are often utilized as a base for many of our probing adapter products. We constantly innovate to provide the most reliable, cost effective interfaces available. For example, many of our PLCC, QFP and SOIC emulation bases use our proprietary shaped solder techniques, replacing expensive, and often fragile, J-lead and Gull Wing leads. Shaped solder parts are easily fluxed and reflowed onto the target system. Our emulator bases can present either a male or female interface at 1.27mm or 1mm or 0.8mm pitch gold plated array pins for pluggable connection.
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Functional Systems
PTE-100
The PTE-100 gives test personnel access to electrical signals for probing, voltage injection, isolation checks, voltage/current and time/frequency measurements, and it offers the ability to analyze hot and loaded circuits, verifying missing, corrupted or present valid signals. Furthermore, the PTE-100 offers the ability to make electrical verification activities more efficient, repeatable and safe, by introducing software controlled test sequences to reduce human errors and guide diagnostic resolution. Break Out Boxes are commonly made in-house and are often specific to a particular project. They are simply designed to multiplex connections between two units and use external instrumentation for signal injection or measurement. The end result is a multitude of tools, difficult to maintain, with limited transportability, providing costly and inefficient operations at the factory or in the field.
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DH Series QuickLink Adapter, 8 GHz BW
DH-QL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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High Impedance Active Probes
18C & 19C
High impedance probes, PICOPROBE® MODEL 18C and MODEL 19C, combine the most advanced MOS and bipolar technologies with special, low capacitance packaging techniques to achieve truly remarkable electronic measurement capabilities. While being manufactured each instrument is individually optimized for the best possible performance. The extremely low input capacitance, high input impedance, and almost negligible input leakage current permits the direct probing of even the most sensitive MOS dynamic nodes. At the same time, the full dc capability of this Picoprobe coupled with the high speed capability permits the full characterization of circuits.
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Automated Multi-Functional Tester
QTouch 1408 C
Qmax Test Technologies Pvt. Ltd.
QTouch 1408 C – Automated Multi-Functional Tester with in-built camera is designed to make automatic image capturing and probing of electrical signals with ease and speed especially in PCBs with high density/high pin count device that are mounted on the PCB. It is designed to move on X, Y, Z directions making it possible to probe every component as close as 20 mils. Easy tagging feature allows the user to get the real time XY coordinates using the library information with minimal intervention. CAD import feature is available for Auto Test Generation/to extract the XY coordinates from the CAD data. Qmax Automated Multi Functional Tester can perform Board level functional test of a PCB and guided probe / Back tracking diagnostics utility to reliably test Digital, Analog and Mixed Signal PCBs and fault isolation to the PCB level or component level.
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ITA, I1, With Protective Cover
410128101
The i1 ITA's small width and inboard handle increase the side to side stackability. The U-shaped cable clamp allows modules to be pre-wired before assembly and can hold cable bundles with an oblong bushing effective diameter of 1.07 in. The removable cover allows easy access to wiring for maintenance and probing. Protective Cover included.
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20 GHz Differential Probe with ProLink Interface
DH20-PL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
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Wafer Probing Machine
UF3000EX-e
Wafer Probe Station is used in connection with test system in Wafer Test process.It is a device to move wafer automatically to examine fair quality of individual chip on the wafer. Probe Station is seperated depending on purpose. For analysis, for mass production as well as manual, semi-automatic, full-automatic.
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Active Probe, 1 GHz
N2795A
The N2795A is a new generation of low-cost, single-ended active probe with the AutoProbe interface. The probe integrates many of the characteristics needed for today’s general-purpose, high-speed probing - especially in digital system design, component design/characterization, and educational research applications. Its 1MΩ input resistance and extremely low input capacitance (1 pF) provide ultra low loading of the DUT. This, accompanied with superior signal fidelity, makes this probe useful for most of today’s digital logic voltages. And with its wide dynamic range (±8 V) and offset range (±8 V), the probe can be used in a wide variety of applications.
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InfiniiMax Probe, 7 GHz
1134B
Use for high-speed differential or single-ended probing in embedded designs
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Machine Tool Probes and Software
Probing is an established best practice for maximising the efficiency, quality, capability and accuracy of machine tools. Standard routines built into modern CNC controls simplify the integration of probing cycles into machining operations and offline tools. These routines, combined with a CAD interface, make the simulation of measurement functions easy.
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8 GHz Differential Probe with ProLink Interface
DH08-PL
Teledyne LeCroy’s DH series 8 to 30 GHz differential probes offer the combination of bandwidth, input range and offset capability to address any high-speed probing requirement from debugging serial data interfaces to validating DDR memory systems. DH series probes provide superior loading characteristics and are calibrated with a custom “fine-tuned” frequency response. The ultra-low loading and flat frequency response ensure accurate measurements.
