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- Pickering Interfaces Inc.
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PXI 16 Bank 5 Channel 1 Pole Multiplexer
40-616-021-16/5/1
The 40-616 16-Bank, 5-Channel, 1-Pole Multiplexer Module forms part of the System 40 PXI Programmable Switching system. The Module consists of 16 electrically isolated banks of multiplexers controlled by a PXI/ PCI interface. Each bank is a 1 to 5 multiplexer and operates with break-before-make action when a new channel is selected. Any Individual multiplexer bank can have a channel set by itself, alternatively, multiple banks can have channels selected simultaneously. The module is suitable for cascading in applications that require large multiplexer systems, it is also suitable for test systems that require the switching of a large number of signals in parallel.
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Ball Pressure Test Apparatus
CX-Q03
Shenzhen Chuangxin Instruments Co., Ltd.
The Ball Pressure Apparatus is used to check the integrity of dielectric materials by exerting 20N force. The BPA10 is called out in IEC 60335, 60950, 61010, UL, CSA and European Norms. It is used to check the integrity of dielectric materials by exerting 20N force. The Ball Pressure Apparatus is made of stainless steel for long life. Since accelerated life procedures are used for this oven test, more than one apparatus may be useful for parallel testing.
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96-CH High-Driving DIO Card
PCI-7396
The PCI-7396 is 96-bit parallel digital input/output (DIO) cards designed for industrial applications. The PCI-7396 emulates four 8255 Programmable Peripheral Interface (PPI) chips. Each PPI offers three 8-bit DIO ports which can be accessed simultaneously. The total 12/6 ports can be configured as input or output independently.
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902s Six Phase 30A
Weshine Electric Manufacturing Co., Ltd
Single-phase current output (RMS)0--30A/phase, accuracy: 0.2% ±5mASix-phase parallel output (RMS)0--180A/six-phase parallel outputPhase current allowable working value for a long time (effective value)10AMaximum output power per phase320VASix-phase parallel current maximum output power
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Parallel Testing of Multiple DUTs with High RF Channel Count
Test Rack UTP 7033 RF for validation
Our basic test rack UTP 7033 (33 rack units) is intended for equipping with various products and therefore for various application areas.The rack shown here as an example is prepared with products and measurement instruments to test automotive devices with high channel count.
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Integrated Test Facility
ITF
The ITF, located in El Segundo, California, has multiple test stations to enable parallel testing and significantly streamline program test schedules. More than 25,000 square feet are available for integration and test activities, including a 10,000-square-foot Class 10K clean room. Our facilities feature thermal vacuum chambers and test stations to support optical alignment, warm optical bench testing, and hardware integration.
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Transformer Regulation
Transformer Parallel Control System is designed to monitor & control the tap changers of up to four (4) transformers connected on a common bus & operating in a MASTER FOLLOWER control configuration.
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Massively Parallel Parametric Test System
P9001A
The highest throughput parallel parametric test solution. 100-pin parallel measurement capability and faster single parameter measurement than Keysight 4080. Good data correlation with Keysight 4080. New per-pin parametric test unit module with all basic measurement function (voltage, current, capacitance, pulse, frequency). Easy development of parallel test plan. Easy migration from 4080 environment. Proven in 1st-tier logic foundries and memory companies.
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Autocompute LCR-Q Meter Sorter
Model 4912 / 4912PR
- Microprocessor based Fully Automatic L, C, R, Q and D measurement- Autoranging with Direct Digital Readout- 4 Terminal Measurement Technique- No Tuning or Balancing- Series or Parallel Equivalent Measurement- Absolute Value and Nominal Value with Percentage Tolerance- Single / Multiple Parameters Check During Component Sorting- Feather Touch Keys with Audio Feedback- Thermal Shut Down for Overheat Protection- Special Mechanism for Fast and Easy Insertion and Removal of Test Component- Low Cost and Portable- Component Sorting on Absolute or Nominal Value Basis with a Percentage Tolerance- Aplab Model 4912PR is Remote Programmable Auto Compute LCR-Q Meter Sorter, Which can be Programmed through GPIB, RS232 or SPIB Interface
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Trinocular Stereo Zoom Microscope Systems
Our SSZ-II Series is one of our most sought after trinocular microscopes. This stereo zoom microscope is true trinocular, durable, cost effective, and low maintenance, as well as an optical zoom range of 2x – 180x with options and a video zoom range of 7x – 628x with options. The NZ Series is also true trinocular, precision optics, medical device standard, and a sealed body, along with an optical zoom range of 4x – 200x with options and video zoom range of 11x – 279x with options.Our parallel zoom trinocular systems, or our E-Series, are also a true trinocular, as well as being ergonomic, low maintenance, having the most accessories available, and being completely customizable. In addition, this trinocular microscope has high performance optics, with an optical zoom range of 4x – 480x with options and a video zoom range from 14x – 558x with options.
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Regenerative Battery Pack Test System
17040
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
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In-System Programmer for AVR32
MPQ-AVR32
Supports Atmel AVR32 devices Field Upgradeable - always supporting the latest devices Secure image management - protects your IP In-circuit gang programming of up to four devices at once Can be deployed in arrays to program up to 64 devices in parallel Stand-alone, PC-controlled or ATE-controlled operation Automatic device serialization
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Dual Surge Current Generator
MIG0624T-K12
Designed for testing telecom surge protection devices according to ITU-T K12. The generator has two indepedent impulse outputs which allow testing of two and three terminal protection devices such as gas discharge tubes (GDT). The generator can be configured for two terminal devices or with the outputs in parallel to increase the current impulse for two terminal devices.
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Magnet Testing
Helmholtz Coils
A coil arrangement consisting of two coils with the same radius or edge length is called a Helmholtz coil. At the correct distance, these coils are arranged in parallel on the same axis and current flows through them in the same direction. Their magnetic field is then characterized by a large homogeneous area in the center of the coil, which is freely accessible for experiments and measurement tasks. Helmholtz coils can have a circular or square geometric shape.
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Memory Burn-in Tester
B6700 Series
B6700 can test as many as 48 burn-in boards in parallel at speeds up to 10 MHz, which helps memory suppliers get their newest products to market faster while also reducing testing costs. An original high performance chamber improves yield by assuring high temperature accuracy while generating high temperature. It also shortens the temperature rise and fall time which leads to shortening the test time.
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Voltage Output D/A Converters
Analog Devices offers a large family of resistor string and R-2R voltage output (VOUT) D/A converters (DACs). From 8 bits up to 20 bits of resolution, single to 40 channels, integrated or external reference, parallel, LVDS, serial SPI or I2C interface, with high temperature operation, we have a D/A converter to suit your application. We provide precision, buffered, and unbuffered rail-to-rail VOUT D/A converters with up to ±1 LSB INL and DNL specifications and excellent offset and gain error. Our D/A converters work well in a wide variety of open-loop or closed-loop systems—adjusting gain, offset, and many other signals.
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GPGPU Processor
VPX6-4955
Curtiss-Wright Defense Solutions
The VPX6-4955 delivers incredible processing power from not one, but two NVIDIA Quadro Turing TU104 GPUs, providing a remarkable 6144 CUDA cores for parallel processing and a 50% improvement in performance per CUDA core compared to the previous Pascal generation.
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Test System for Detecting Exact PCB Short Circuit Locations
QT25
Qmax Test Technologies Pvt. Ltd.
QT25 employs a unique method to detect exact PCB shorts circuit locations and pin down the shorted components and tracks. It is designed in such a manner that it precisely detects exact short circuit locations across VCC - GND or a shorted component connected across a Bus or hair-line shorts between PCB tracks, Which is highly impossible to detect using conventional tools especially when they are connected parallel in circuit. It can also be used in measuring the contact resistance of switches and relays in its milli-ohm mode as a value add.
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42.0Hz~5.00MHz, Programmable Impedance / LCR Meter
3550
The Model 3550 Programmable Impedance/LCR Meter tests within the extensive frequency range of 42.0 Hz to 5.00 MHz. It measures L, C, R, |Z|, Y, D, Q, R, Phase, G, X, B, V, I, F, in series or parallel modes. With a basic accuracy of 0.10%, the 3550 is designed for a wide variety of automated or manual test applications. RS-232C & I/O interfaces are standard; GPIB or BCD interfaces are optional.
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Haze Meter
HAM-02
Jinan Leading Instruments Co., Ltd.
HAM-02 Haze Meter is a kind of small hazer meter designed according to ASTMD1003—61(1997). It is applying to test the light transmittance,transmission haze, and reflection haze, reflectivity of transparent and semitransparent parallel level material and plasticfilms. Also it is suitable for liquid samples (water, beverage, pharmacy,colored liquid, grease) turbidity measurement. It is the basic instrument for plastic, glass products, all kinds oftransparent packaging films, colored and colorless of organic glass andaerospace, automotive glass and photographic film.
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1000W, 1500W HSM Watt Power Supply Models
Series HSM
The Kepco HSM series comprises a group of ten models, seven 1000 watt power supplies with outputs from 3.3 volts to 125 volts and three 1500 watt power supplies with outputs from 24 to 125 volts. All models feature current sharing for parallel operation and redundancy applications. Kepco¹s 1000W HSM have a wide-range input (90-277V a-c). The 1500W models operate 180-277V a-c. Both incorporate power factor correction to meet EN 60555-2 and EN 61000-3-2. These modern power supplies operate at 100KHz using current mode control to provide rapid response to source and load changes and tight stabilization.
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Serial Parallel Interface
Model 2303
* 2303 Board provides 40 high-power TTL I/O lines that can sink 23 mA or source 24 mA. * Easily interfaces to TTL or CMOS signals and contact closures. * User can configure the data bytes as inputs or outputs.* Transfer data as bits, bytes as data strings or transparently.* Dual Serial headers support conections with baud rate switch inputs or to a Serial Flat Ribon Cable Assembly. * Optional Relay Driver board drives 24-40 relays. * 114732 Board has the DIN connector on circuit side for use with the X3DVR Relay Driver Board or for piggyback mounting.* All other specifications are the same as listed above for the 2303.
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High Power Programmable AC Source with Transients
61510
Chroma Systems Solutions, Inc.
Power Rating:61511: 12KVA61512: 18KVAVoltage Range: 0-150V/0-300V / AutoConfigurations with input voltage of 220V or 480VFrequency: DC, 15Hz-1500HzSingle-phase or three-phase output selectableProgrammable slew rate setting for changing voltage and frequencyProgrammable voltage and current limitHigh output current crest factor, ideal for inrush current testingTurn on, turn off phase angle controlTTL signal which indicates output transientLIST, PULSE, STEP mode functions for testing Power Line Disturbance (PLD) simulationVoltage dips, short interruption and voltage variation simulationHarmonics, inter-harmonics waveform synthesizerComprehensive measurement capability, including current harmonicsAnalog programmable interfacesRemote interface: GPIB, RS-232, USB and EthernetCapable of delivering power output up to 90KVA by implementing Master-slave parallel operation
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Addon Cards
Fit the IM6/Zennium electrochemical workstation to your application. Control external potentiostats, capture additional physical properties or enhance your system to a true parallel impedance analyzer.
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LCR Meter
*Rs, Rp, Cs, Cp, Ls, Lp, phase angle, Dissipation factor, Quality factor *Auto select series or parallel test mode *Auto select 100Hz/1kHz/10kHz test frequency, 0.5V rms approx. *Calibration
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Non-Isolated Digital I/O DAQ Cards
PCI/PCIe-bus non-isolated digital I/O cards for parallel data transfer, TTL DIO, and logic signal sensing.
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Programmable Gain Amplifiers
Analog Devices programmable gain amplifiers (PGAs) provide excellent gain accuracy, channel-to-channel matching specifications, and low 1 ppm/°C drift. Set your gain with a simple serial or parallel interface from 1 V/V to over 4000 V/V.
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Single Head Component Testers
34XX
Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes, darlingtons and matched dual transistors. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3402E or 3403E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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Multi-Channel UT
Pilot
Pilot is a next generation multi-channel UT device. Its one-of-a-kind specifications make the Pilot capable to perform advanced ultrasound inspections. Pilot is unique in its capacity to meet the most demanding needs of various industries, from aeronautics (employing composite and honeycomb structures) to in-line, as well as TOFD and many other applications with stringent requirements. Compact and powerful, this 8-channel full parallel, or up to 64 multiplexed, unit pushes the boundaries of the UT benchmark as it is more efficient than any other conventional UT system in the NDT market.
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Hardware Platforms
Backed by decades of expertise in the development of innovative hardware solutions, OPAL-RT’s unique approach integrates parallel, distributed computing with commercial-off-the-shelf technologies, offering an unmatched combination of performance, openness and affordability.
