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Near-field Scanning Optical Microscope
Near-field Scanning Optical Microscope
- Pickering Interfaces Inc.
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PXI/PXIe MEMS Optical MUX, Dual 2-Channel, Single-Mode, 9/125 Fiber
40-855A-122-HI
The 40/42-855A-122-HI is a PXI/PXIe dual 2-channel multiplexer with FC/PC, includes hardware interlock connectors and is part of Pickering's range of PXI Fiber Optic MEMS Switching modules. They are available in many high density formats with a choice of different connector styles to suit most applications: FC/APC (for optimal performance), FC/PC and SC/PC for general applications and LC and MU for high density applications.
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Ultrafast Nearfield Optical Microscope
Femtosecond NSOM
Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nano-manufacturing.
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Near-field Scanning Optical Microscope
NSOM
Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nanomanufacturing.Conventional microscopes have fundamentally limited resolution due to diffraction, but there is no such restriction for near-field interactions, that is why near-field microscopy is becoming one of the most important techniques for nano-science.
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Single Probe Scanning Probe Microscope
MultiView 2000
an advanced single probe scanning probe microscope enabling a variety of modes of AFM/SPM/NSOM imaging. Nanonics has designed The MultiView 2000TM for excellence in scanning probe microscopy while allowing for near-field and far-field optical NSOM/Raman/TERS imaging without perturbation. The Multiview 2000TM is the only commercially available instrument that offers both tip and sample scanning. This versatility is important for different operation modes where the user can now choose whether the sample or tip is static. The Multiview 2000TM further offers the most stable feedback mechanism available in the form of normal force feedback with tuning fork actuation.
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Automated Optical Switch - PXI
Add optical switching capability to your test system with Quantifi Photonics’ automated optical switches. The fast and reliable optical switch will enable automated sequential testing, saving time and streamlining your test procedures.
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Broadband Optical Source - PXI
SLED 1000 Series
The SLED 1000 Series is a super-luminescent LED light source with high output power, large bandwidth and low spectral ripple. It comes in various wavelength models to address applications in the telecom and datacom markets.The SLED is a single-slot PXIe module and is ideal for building a customized optical testing platform that delivers reliable and repeatable results in manufacturing or R&D environments.
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Optical-Electrical Converter - MATRIQ
The O2E is a high bandwidth, broadband optical to electrical converter.Available in a range of configurations; choose from 1 or 2 channels, AC or DC coupling and various conversion gain and operating wavelength ranges.
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Optical to Electrical Converters
High bandwidth, broadband optical to electrical converters available in a range of configurations. Choose from 1 or 2 channels, AC or DC coupling and various conversion gain and operating wavelength ranges.
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Optical Switches
Fast and reliable optical switches to streamline your test procedures. Can be customized with a wide range of switch configurations, fiber types and connectors.
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Automated Optical Switch - MATRIQ
Add optical switching capability to your test system with Quantifi Photonics’ automated optical switches. The fast and reliable optical switch will enable automated sequential testing, saving time and streamlining your test procedures.
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Scanning Near Field Optical Microscope
SNOM
SNOM microscopes employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at rather better than the usual wavelength-limited resolution. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM or NSOM).
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Scanning Kelvin Probe Microscope
VS-SKP
The Kelvin Probe experiment uses a nondestructive method to determine the relative work function difference between the probe and the sample. Work function describes the energy required to liberate an electron from the surface of a conductor; electrochemists often interpret this as the difference from an electrode’s Fermi Level, average energy of electrons, and that of vacuum.
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Near-field Chambers
Most antenna measurements need to be carried out in the far field; that is, the test antenna should be illuminated by a plane wave. Typically this is carried out by providing sufficient separation between the source and the AUT so the spherical wave approaches a plane-wave character.Near-Field chambers are an excellent alternative to traditional far-field ranges; testing that can be accomplished on a far-field range can be accomplished on a Near-Field test range. This method of testing allows an operator to employ an indoor anechoic test chamber at a reasonable cost and avoid the problems associated with weather and security concerns often encountered when using an outdoor test range.
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Multiphoton Laser Scanning Microscope
FVMPE-RS
The Olympus FVMPE-RS multiphoton imaging system is purpose-built for deep imaging in biological tissue, aimed at revealing both detail and dynamics. Innovative features for efficient delivery and detection of photons in scattering media enable high signal-to-noise ratio acquisition. This translates to bright images with precise details — even from deep within the specimen. High sensitivity is matched with high-speed imaging to capture rapid in vivo responses. For advanced applications, dual-wavelength excitation extending to 1300 nm is available. Independent control of visible or multiphoton laser light stimulation and the ability to synchronize with patch clamp data are also possible.
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Custom Microscopes and Optical Systems
OpenStand
Whether developing new automation techniques and software or developing new imaging methods, you can quickly find that you need a microscope system tailored to your application and business needs. Prior Scientific has developed OpenStand® to offer a working platform to build OEM solutions and one-off customizations with excellent value for money and reduced development time.
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Ultraschallmikroskop And Scanning Acoustic Microscopes
Microtronic Microelectronic Vertriebs GmbH
mage quality. Speed. Uptime. They’re all crucial. Getting all three at the same time in a nondestructive testing (NDT) solution for package inspection is the challenge. It takes continuous innovation, advancing the state of the art to keep pace with the semiconductor industry’s own exponential progress.Sonix has been the innovation leader since 1986. Today, the ECHO line of scanning acoustic microscopes sets the standard for package inspection speed and image quality, to help you keep pace with new packaging materials and difficult form factors. The ECHO platform will remain at the forefront as we continue to add features and enhance performance for years to come.
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Optical-Electrical Converter - PXI
O2E 1000 – 1400 Series
The O2E is a high bandwidth, broadband optical to electrical converter.Available in a range of configurations; choose from 1 or 2 channels, AC or DC coupling and various conversion gain and operating wavelength ranges.
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Scanning Electron Microscope
JSM-IT510
Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
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High-Resolution Scanning Probe Microscope
SPM-8100FM
The new HR-SPM scanning probe microscope uses frequency detection. his instrument is not only capable of ultra-high resolution observations in air or liquids, but for the first time enables observations of hydration/solvation layers at solid-liquid interfaces.
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Laser Scanning Microscopes
The Olympus FLUOVIEW confocal microscopes are designed for high-resolution, confocal observation of both fixed and living cells, enabling visualization deep within samples. From the New FV3000, optimized for the most robust interactive live cell and tissue experiments, to easy-to-use high content imaging, explore the wide range of options with Olympus exclusive optical technologies.
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Laser Scanning Microscope
OLS4100
The LEXT OLS4100 is a Laser Scanning Microscope to perform non-contact 3D observations and measurements of surface features at 10 nanometer resolutions. It also features a fast image acquisition and a high-resolution image over a wider area.
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Scanning Acoustic Microscope
Pulse2
This industry-leading scanning acoustic microscope provides a universal inspection tool for packaged semiconductor development, production and failure analysis. With the ability to detect air defects as thin 0.05 micron and spatially resolve defects down to 10 microns, the ECHO is perfect for bump detection, stacked die (3D packaging) inspection, complex flip chip inspection and more traditional plastic packages.
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Scanning Acoustic Microscope
Echo
The ECHO scanning acoustic microscope is a nondestructive ultrasonic flaw detector designed to simplify testing, increase yield and maximize productivity in the lab or on the production floor.
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Microscopes
Olympus is a leading manufacturer of microscopes for life science and industry. With over 100 years of experience developing microscopes, we offer innovative optical solutions for many applications. Explore our microscopes for education, training, laboratories, and leading-edge research in the life science fields, such as pathology and cytology.
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Near-Field Detection Module for Imaging
Reflection
Reflective AFM-tip illuminationDetection optimized for high-performance near-field imagingEnables optical amplitude and phase resolved near field measurementsNear-field spectroscopy possible via sequential imaging (Requires tunable illumination unit)Patented background-free detection technologySuited for visible & infrared wavelength range (0.5 20 m)Version for infrared & THz wavelength range (5 300 m) availableSupported AFM scan-speed: up to 20 m/s @ highest spatial resolution
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Laser Scanning Systems
QFP markets manually handled and optically tracked 3D laser scanners that set new standards in the metrology measurement industry. The products are characterized by exceptional performance, ease of use and cost-effectiveness and are the perfect solution for the metrology room as well as for the production line, stand-alone or automated.
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Acoustic Microscope
AMI P300
The FastLine P300 Acoustic Microscope is specifically designed for accelerated throughput, semiautomated screening of microelectronic devices on the manufacturing floor.
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3D Microscope
BVM-5006
BVM-5006 Electric 3D Microscope features the quality optical system, high resolution, large field of view, high zoom ratio, novel design and one-up technology, easy and automatic operations. Includes: Motorized zooming, motorized observation angle for changing and optional motorized focusing. The speed can be adjusted while changing observation angle. With the angle attachment, the microscope can realize 3D image effects for observing the components and deep holes. The LED lights can generate high brightness. Theoretically the service life of LED lights can reach 20,000 hours. The LED lights with area control function can illuminate from different angles for convenient multi-angle inspections. The M-N3D Microscope can be widely used in micro-electronics, automated monitoring and testing industries. By selecting the appropriate objectives and video couplers, different magnification, field of view and depth of field can be acquired. Digital and Analog video systems can meet the different users' demands.
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Fiber Microscope
WL-C400S
The WL-C series fiber microscopes use coaxial illumination to provide users with maximum detail. It easily can detect the finest scratches and contamination, making it ideal for critically inspecting polish quality.
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Near-Field Detection Module for Imaging
Transmission
Detection optimized for high performance near-field imaging in transmission-modeEnables optical amplitude and phase resolved near field measurementsPatented background-free detection technologyEnables bottom-side (transmission-mode) sample illumination with broadband mirrorSuited for visible and infrared wavelength range 0.5 20 mRequires transparent sample substrateMotorized parabolic mirror for easy beam-alignment in transmission-modeStationary focal point with respect to AFM-tipVariable illumination spot size (ca. 2m 100m)Suitable for plane-wave illuminationSupported AFM scan-speed: up to 20 m/s @ highest spatial resolution
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Scanning XPS Microprobe
PHI VersaProbe III
The PHI VersaProbe III is a highly versatile, multi-technique instrument with PHI’s patented, monochromatic, micro-focused, scanning X-ray source. The instrument offers a true SEM-like ease of operation with superior micro area spectroscopy and excellent large area capabilities. The fully integrated multi-technique platform of the PHI VersaProbe III offers an array of optional excitation sources, sputter ion sources, and sample treatment and transfer capabilities. These features are essential in studying today’s advanced materials and in supporting your material characterization and problem-solving needs.
