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- Pickering Interfaces Inc.
product
EBIRST 50-pin D-type Test Tool
93-005-001
eBIRST is a range of USB controlled test tools capable of performing automated path resistance tests on Pickering Interfaces PXI, LXI or PCI controlled switching solutions. Each tool simply interfaces with the switching system's connector so a test can be run using the supplied Windows-based software.
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Capacitor Leakage Current Meter
DU2316/2317
Delta United Instrument Co., Ltd.
Leackage Current range display: 0.0001uA ~ 20.00mAAutomatic or Manual trigger with CHARGE/TEST/DISCHARGE100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceHi / Lo current limit setting & PASS/FAIL judgment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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Single Event Effects Test System
SEE-RAD
The SEE-RAD test system brings together the proven features of our ETS780 tester (such as true APG memory test and powerful FA tools) with the newest technology of the Griffin III. With all new high-accuracy DC Parametrics, superior precision pin drivers, and capture memory of 64M, the Griffin SEE-RAD combines the newest innovations in the test industry with our years of experience in Radiation Test.
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FPGA PXI Digital I/O Card
GX3500
The GX3500 is a user configurable 3U FPGA PXI card which offers 160 digital I/O signals for specific application needs. The card employs the Altera Cyclone III FPGA which can support clock rates up to 150 MHz and features over 55,000 logic elements and 2.34 Mb of memory. The 3U PXI FPGA card GX3500 can also accept an expansion card assembly which can be used to customize the interface to the UUT – eliminating the need for additional external boards which are cumbersome and physically difficult to integrate into a test system.
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Wire Harness Tester
NX Pro
The Dynalab NX Pro Wire Harness Tester is a low-cost, feature-packed, stand-alone continuity tester with a maximum capability of 512 test points. The flexibility of the NX System allows each program to perform multiple tests, display custom messages or sounds, and analyze the results of a test or an input to "decide" which operation to perform next. The NX Pro Tester has 1.3Mb memory capacity for program storage and is compatible with Printers, Scanners, and all other Dynalab NX System accessories.
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Cloud Semiconductor Testing Service
CloudTesting™
All-in-one platform for semiconductor test and measurement Extensive test and measurement library Microcontroller, Memory, Analog and more. CloudTesting™ Service is the test and measurement system that you can build your own environment by selecting and combining Testing IPs. Fees for Testing IPs are paid monthly.
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T3DSO4000L-HD Series Oscilloscopes
T3DSO4000L-HD Series
The Teledyne Test Tools T3DSO4000L-HD Oscilloscopes feature four and eight channel low profile models all with 12 bits of vertical resolution. With analog bandwidth options of 500 MHz, 1 GHz and 2 GHz. Each model offers a maximum sample rate of 10 GSa/s with ESR per channel, and a maximum memory depth of 500 Mpts in single channel mode. The T3DSO4000L-HD series is ideal for ATE systems as well as other automated applications.
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C Meter
DU-6210
Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 10 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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Digital Test Hammers
James Instruments? digital test hammers are an advanced, completely automated system for estimating concrete compressive strength. Its calculation, memory and recording functions allow for quick, easy and accurate test results.
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Compute Express Link (CXL)
Compute Express Link (CXL) is a new high-speed CPU-to-Device and CPU-to-Memory interconnect designed to accelerate next-generation data center performance. CXL technology maintains memory coherency between the CPU memory space and memory on attached devices, which allows resource sharing for higher performance, reduced software stack complexity, and lower overall system cost. This permits users to simply focus on target workloads as opposed to the redundant memory management hardware in their accelerators. CXL is based on a PCI Express 5.0 Physical layer with speeds up to 32GT/s. Teledyne LeCroy provides protocol analysis test equipment to support development and debug of CXL based devices.
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Memory Test System
T5221
The T5521 is a memory test system that supports wafer test and wafer burn-in test of non-volatile memory devices such as NAND flash, housed within a multi-wafer prober to reduce test floor footprint.
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Probes And Cables
The iProbe is an intelligent temperature sensor that can be calibrated independently of SBIR’s blackbody systems or 104i precision thermometers. These ultra-stable, highly responsive iProbes are used to provide long term accuracy and repeatability of under 0.010°C. Each iProbe incorporates onboard flash memory that allows all calibration constants and calibration date information to be stored independently of the blackbody or thermometer system. This allows iProbes to be exchanged for use on a blackbody or thermometer without any loss in stability or accuracy. To re-calibrate a system you need only exchange the current iProbe with a recently calibrated one. No special equipment is required and there is no down time in the test area.
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Stack Analysis
VerOStack
VerOStack examines the binary executable to statically determine the actual worst-case stack size. This is a precise measurement technique not influenced by particular dynamic test runs and their variance based on a particular execution path. Furthermore, it can take into account not only the current program but also other programs that will run on the target at the same time, such as other applications running on a real-time operating system (RTOS) or in combination with the RTOS itself. It can thus provide truly meaningful data on target memory requirements.
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Evaluation Kit
ROM-3310 Development Kit
*Evaluation kit for ROM-3310*Lower power TI sitara AM3352 1GHz processor*On board DDR3 512MB memory / 4GB Flash*HW WDT for system protection*Supports 1 GbE, 1 USB 2.0, 1 USB 2.0 OTG, 2 CANbus, 10 GPIO, 4 UART,1 I2C, 1 I2S, 1 SPI, 1 SDIO*Cable pack & Panel included*Evaluative image & test utilities built-in
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Data Acquisition Equipment
Get the data you want, where, how and when you want it. Fluke gives you a broad choice in data acquisition for process monitoring and laboratory test systems. You can choose a stationary or portable data logger. Transfer data to internal memory, to a removable memory card, or to your PC. Choose a standalone or distributed networked units. And you can expand your system from 20 to 1,000+ channels, depending on the series.
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Portable JTAG Boundary-Scan Controller with USB (1.1 and 2.0 High Speed), Ethernet & Firewire Interfaces
JT 37x7/TSI
High speed and performance portable JTAG Boundary-scan controller, containing three interfaces to the test system: USB (1.1 and 2.0 high speed), Ethernet and FirewireThe controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.
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Training Board
JT 2156
The JT 2156 training board has been devised to demonstrate all the latest features and test techniques available to users of JTAG Technologies’ ProVision & JTAG Live application development systems. As well as a modern ARM Core processor, the design also includes an Altera Cyclone FPGA, DDR Memory, Ethernet PHY, and several SPI and I2C peripheral parts. The JT2156 is shipped with a comprehensive self-study manual for getting to know the in-depth features of ProVision and/or JTAGLive Studio. For Altium users the design also serves as an example of how to adapt the Nano board into a realistic custom design.
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Non-Multiplexed High Speed Transient Function Card
Identified by its ADC per channel and on-board memory, it typically operates at per channel sampling rates which in aggregate would overwhelm any communication system. Data is stored on board during a test and transmitted to a host computer following completion.
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FPGA PXIe High-Performance Digital I/O Card
GX3700e
The GX3700e is a user configurable, FPGA–based, 3U PXI Express card offering 160 digital I/O signals which can be configured for single-ended or differential interfaces. The card employs the Altera Stratix III FPGA, which can support SerDes data rates up to 1.2 Gb/s, digital I/O clock rates of 700 MHz, and features over 45,000 logic elements and 1.836 Kb of memory. The GX3700e is supplied with an integral expansion board providing access to the FPGA’s 160 I/Os. Alternatively, users can design their own custom expansion cards for specific applications - eliminating the need for additional external boards which are cumbersome and physically difficult to integrate into a test system. The design of the FPGA is done by using Altera’s free Quartus II Web Edition tool set. Once the user has compiled the FPGA design, the configuration file can be loaded directly into the FPGA or via an on-board EEPROM.
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High-Speed Memory Test Solution
UltraFLEX-M
The UltraFLEX-M builds on the advanced test technology and architecture of the proven UltraFLEX test system to ensure high test quality at the lowest cost of test for high-speed memory devices.
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Audio Test Software
1. Distortion free stimulus even the equalized stimulus.2. Unlimited channels acquisition and processing. (Hardware limited)3. Human correlated listening test(Bark Scale intensity chart). (Requires large memory)4. Hi Res intensity chart for buzz/pop detection. (Requires large memory)5. Auto equalization method with target dBSPL accuracy.6. TCP client for test framework integration.7. Easy limits and logs development.8. Easy logs visualization module.9. Auto waveform alignment and triggering.(Upto single point alignment accuracy)10. Easy regression testing via TCP client.11. Standard Magnitude, Phase, THD, THD+N, Rubb&Buzz, Pink Noise, Noise Tests.12. Unlimited calibrations and equalization for scaling to different products and stations.13. Lowest test system and test sequence development times.14. Requires minimal training and debugging.15. Automatically avoid Reference speaker play and stop pops.16. WMD/ASIO driver compatible sound cards supported.(B&K 3670 recommended)
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Programmable LCR Meter
DU-6211
Delta United Instrument Co., Ltd.
Wide Measuring Range & High accuracy 0.1%Zeroing Offset FunctionProvided HI/LOW limit and BIN Sorting comparator function, to meet your needed.100 sets of memory, can be saved test parameter and comparator setting, easy to use.Cover up free, system firmware upgrade can be update via RS-232, easy to maintenanceEasy Test Condition Setting with Auto Parameter Selection & Auto Ranging Function High speed FADC, max. test speed up to 75 meas./sec, faster your automation equipment240*64 Graphic LCD display, can be read the reading clearly and easier.User friendly programmable interface, easy to useProvided RS-232C and Handler combinatorial interface option, to meet your needed
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Leeb Hardness Tester
THL500
It is the highest brightness display in China showing all functions and parameters, easy read Largest screen Oled screen and operate,also can save lots of energy .the largest screen of Leeb hardness tester in China. Two hardness scale dual-display in the screen. Measuring direction in 360 and add the auto measure direction to make test easy and precision. Add four new hardness scales, HRA, HB for D impact device of alloy tool steel; HV for cast aluminum alloy. Add New user material function, to meet the need of user can test the special material. Test at any angle, even upside down. Wide measuring range. It can measure the hardness of all metallic materials. Direct display of hardness scales HRB, HRC, HV, HB, HS, HL and three types of strength values immediately. Seven impact devices are available for special application. Automatically identify the type of impact devices. Large capacity memory could store 600 groups (Relative to average times321 ) information including single measured value, mean value, testing data, impact direction, impact times, material and hardness scale etc. Upper and lower limit can be preset. It will alarm automatically when the result value exceeding the limit. Battery information indicates the rest capacity of the battery and the charge status. User calibration function. USB port with the PC humanity multi-functions data proceeding software. Original imported high speed thermal printer support the immediate printing function. It can save data permanently. Li rechargeable battery as the power source. Charge circuit integrated inside the instrument. Continuous working period of no less than 200 hours (EL off and no printing). Auto power off to save energy. Excellent after-sale service system for high quality products---3 years guarantee and all life maintenance. Easy to buy and comfortable to use.
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Memory Test Systems
T5503HS2
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
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System Control Modules for 34980A
The 34980A System and Control modules provide additional measurement and control capabilities that are typically used in test applications. Choose from modules that include digital I/O with programmable polarity, D/A converter with onboard memory to create waveforms, and frequency counter/totalizers.
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Circuit Breaker Analyzers & Timers
CAT Standard Series
Circuit breakers are being tested during manufacturing, commissioning or maintenance stages. The most basic test requires timing measurement using circuit breaker timer. Their primary role is timing and motion measurement of medium and high voltage circuit breakers. Devices from CAT Standard series have suitable application in:electric power generation,distribution system,part of the electric power transmission system,contractors testing,and industrial environments.CAT Standard series meets the requirements of an easy to use circuit breaker timer and analyzer with an attractive price. Furthermore, they are portable and lightweight (weighs only up to 7 kg). Finally, the plastic case is unbreakable and has IP67 protective rating when the lid is closed.CAT Standard series includes five models:Three circuit breaker timers – CAT03, CAT31, and CAT61Two circuit breaker analyzers – CAT34 and CAT64CAT03 is a basic model intended only for timing measurement of main contact operations on the circuit breaker with one break per phase. Unlike CAT03, CAT31 has the possibility of circuit breaker operation initiation, coil current measurement, and auxiliary contact timing measurement. CAT61 differs in comparison to CAT31 by its ability to measure up to two breaks per phase.CAT34 and CAT64 are more advanced compared to CAT31 and CAT61, respectively, since they have additional analog channels. Also, they have the possibility of a travel curve recording.A user can download the test results to a USB memory stick or save it to internal memory. The CAT Standard series internal memory can store up to 500 test results (numerical and graphical data). Optional thermal printer prints test results in tabular and graphical form on 80 mm (3.15 inch) paper rolls. CAT Standard series instruments are compatible with DV-Win software. It provides full control of all CAT functions from a PC, as well as acquisition and analysis of test results.
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Memory Test System
T5801
Capable of Testing Ultra-High-Speed DRAM Devices, Supporting Next-Generation GDDR7, LPDDR6, and DDR6 Technologies
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Memory Test System
T5830/T5830ES
Highly flexible tester which has all of the capabilities needed to perform wafer sorting and final testing of price-sensitive flash memories
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FPGA PXI High-Performance Digital I/O Card
GX3702
The GX3702 is a user configurable, FPGA-based, 3U PXI card which offers 160 digital I/O signals which can be configured for single-ended or differential interfaces. The card employs the Altera Stratix III FPGA, which can support SerDes data rates up to 1.2 Gb/s, digital I/O clock rates of 700 MHz, and features over 45,000 logic elements and 1.836 Kb of memory. The GX3702 is supplied with an integral expansion board providing access to the FPGA's 160 I/Os and is pin for pin compatible with the NI PXI 7813R and 7811R FPGA cards . Alternatively, users can design their own custom expansion cards for specific applications - eliminating the need for additional external boards which are cumbersome and physically difficult to integrate into a test system. The design of the FPGA is done by using Altera's free Quartus II Web Edition tool set. Once the user has compiled the FPGA design, the configuration file can be loaded into the FPGA directly or via an on-board EEPROM.
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Logic Analyzer Probes
FS2354 & FS2355
The FS2354 and FS2355 are logic analyzer probes used to test DDR3 SO-DIMM memory modules. When used with the triggering and analysis capabilities of Keysight’s Logic Analyzer modules, it gives the user an extremely effective tool for debugging, testing and verifying DDR3 SO-DIMM systems.
