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- Pickering Interfaces Inc.
product
PXIe Embedded Controller Module
43-920-002
The 43-920-002 PXIe embedded controller is the most compact and powerful 3U one-slot embedded controller for the PXI Express and CPCIexp platforms. With its huge and future-ready interface capabilities, it runs perfectly with most test and measurement applications.
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JTAG Boundary-Scan Controller
NetUSB-1149.1/SE
8-TAP USB 2.0 and LAN Based JTAG Controller. The NetUSB-1149.1/SE is an advanced 8-TAP USB 2.0 and LAN-based JTAG/boundary-scan controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard.
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Transient Suppression for Corelis JTAG Controllers
TAP Protection Adapter
Transient events such as Electrostatic Discharge (ESD), inductive switching, and lightning can damage electrical equipment, leading to costly repairs and test equipment down-time, reducing production capacity and increasing time-to-market.The Corelis TAP Protection Adapter is designed to enhance protection to any Corelis JTAG controller, shielding against harmful events using a combination of electrical defenses.The compact adapter features series resistors and transient voltage suppressor (TVS) diodes to mitigate damage to the JTAG controller. Protect your investment and enjoy peace-of-mind with the TAP Protection Adapter.
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High-Speed USB 2.0 JTAG Controller
USB-1149.1/1E
The USB-1149.1/1E is a high-performance plug-and-play IEEE-1149.1 Boundary-Scan (JTAG) controller for the Universal Serial Bus (USB 2.0). The USB-1149.1/1E is a high-speed device compliant with Revision 2.0 of the USB Bus Specification.
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JTAG Boundary-Scan Hardware
JTAG Boundary-Scan Hardware by Corelis, including boundary-scan controllers, 12C serial bus protocol analyzers & exercisers, JTAG boundary Scan Modules, high-volume production JTAG systems, 7 support for 3rd party JTAG controllers
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Imbedded A5 Processor Test Interface
Advanced Microtechnology, Inc.
Advanced Microtechnology has extended the application of its Optimum product line with theintegration of ARC5 imbedded test functions. Up to 40 controllers may be independently powered and monitored for functionality using the process test interface of the Optimum WinAOS application. Each part may have 2 separate biases featuring both current and voltage monitoring. Independent test is implemented through a standard JTAG interface. A separate serial clock and command interface may be used if required to provide device initialization sequences. JTAG control is muxed to each part through the use of an independent clock for each part. All of the ARC processor registers and memory space may be tested through the JTAG I/O.
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I/O Modules
JTAG Technologies designers have been developing high-speed digital test equipment for well over 30 years. The current range of controllers ranges from the compact, stylish and reliable JT 3705/USB to the rugged, dependable DataBlaster family and variants that have been developed for industrial use. The latest addition, JT5705/USB adds analog measure and source capabilities to provide a true mixed-signal tester platform.
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JTAG Live Controller
The JTAG Live Controller is USB connected and powered and features a single test access port in JTAG Technologies standard 10-way IDC pin-out. The JTAG Live controller is a smart, low-cost and easy-to-use USB JTAG/Boundary-scan interface.
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Production Stand-Alone
PSA
Using PSA, test engineers can build sequences of applications in the built-in AEX (Application EXecutive) manager using if then else goto capabilities. Sequence builders can also include additional capabilities through DOS/Win command line calls, create serial number logged test reports, export tests results to a database etc.. PSA includes drivers for all JTAG Technologies controller hardware past or present.
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High-Performance Intelligent Pod for Corelis Boundary-Scan Controllers
ScanTAP 4 & 8
Boundary-scan has proven itself time and again to be a truly versatile interface for structural test, embedded functional test, built-in self-test (BIST), software debug, and in-system programming. Supporting such diverse applications requires equipment with high-performance specifications and extended features.Corelis ScanTAP pods are designed for use with PCI-1149.1/Turbo and PCIe-1149.1 high-speed JTAG controllers. Featuring 4 & 8 independent Test Access Ports (TAPs), up to 80 MHz clock rates, and advanced TAP capabilities such as analog voltage measurement, the ScanTAP family of intelligent pods is the ideal JTAG interface for high-performance environments.
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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Multiport JTAG Tester
XJQuad
XJQuad is a 4-port version of the XJLink2 USB-to-JTAG controller targeted at PCB manufacturers. It is supplied with XJRunner software for running XJDeveloper test systems. With a range of special features it is particularly suitable for concurrent/parallel testing on the production line. Each of the four ports has a high-speed interface which can be connected to up to four JTAG chains on each Unit Under Test (UUT).
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Controllers
onTAP’s THREE TAP CONNECT JTAG
Connect the TAP CONNECT JTAG Controller to your application with either the Xilinx ribbon cable, flying leads, or Altera style adaptors. The onTAP TAP CONNECT Controller automatically senses and adjusts to target I/O voltages and interfaces to devices operating at 1.8 to 5.0 VDC for the standard controller, or 0.99 to 3.6 VDC for the low voltage controller, using the VREF voltage from the target chain. If there is no VREF available, you can set the voltage for the target application from the TAP CONNECT Controller. This facilitates easy configuration to many different JTAG ports, which is helpful in design and manufacturing.
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JTAG Probe
MAJIC
MAJIC (Multi-Architecture JTAG Interface Controllers) JTAG Probes are small, stand-alone, processor-based systems that provide an intelligent connection between host-based development tools (the debugger) and an embedded processor via its standardized JTAG debug logic IP macrocell.
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JTAG Boundary-Scan Controllers for High-Volume Production Systems
Corelis has designed special hardware that autonomously performs concurrent (gang) testing and programming of multiple units without additional user intervention. The entire testing and programming, including on-the-fly verification of results, is done in modular and expandable hardware.
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ScanBridge
JT 2154
The JT 2154 is an experiment board based on National Semiconductor’s STA111 device, aimed at users looking to utilise addressable bridge/multiplexors within their designs, and thus set-up ‘system level’ JTAG access. The unit can also be used in semi-permanent installations to expand the TAP (Test Access Port) count on JTAG Technologies controllers in order to address highly segmented designs. Built-in support for ScanBridge-type devices within ProVision allows easy set-up of TAP assignments and device addressing.
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Boundary-Scan Controller for PXI-Express 'Hybrid' Slots or Plug-In Controller for PXI-Express Peripheral Slot
JT 37×7/PXIE
High speed and performance JTAG Boundary-scan controller for PXI-Express ‘hybrid’ slots or plug-in controller for PXI-Express peripheral slot.The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.
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High-Speed 4-TAP USB 2.0 JTAG Controller
USB-1149.1/4E
The USB-1149.1/4E is a high-performance plug-and-play IEEE-1149.1 Boundary-Scan (JTAG) controller for the Universal Serial Bus (USB 2.0). The USB-1149.1/4E is a high-speed device compliant with Revision 2.0 of the USB Bus Specification.
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Remote Intelligent Pod
ScanTAP
The test patterns generated by the PCI-1149.1/Turbo controller are distributed to the target system either directly through ScanTAP 4 and ScanTAP-8 pods. The ScanTAP-4 and ScanTAP-8 pods can apply test vectors and/or ISP patterns to target boards with a variety of JTAG chain topologies. In the simplest case, the ScanTAP-4 and ScanTAP-8 will provide the interface between the PCI-1149.1/Turbo controller and a target system consisting of a single JTAG Test Access Port (TAP). This would be the case where the target system consists of one JTAG chain and its single associated TAP.
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Boundary-Scan Test and In-System
PCIe-1149.1
The Corelis PCIe-1149.1 is a high-performance boundary-scan controller for multi-TAP (Test Access Port) and concurrent JTAG test and in-system programming. When combined with a ScanTAP™ intelligent pod, the PCIe-1149.1 offers up to 80 MHz clock rates on 4 or 8 TAPs with features such as external write strobe, direct programming, and analog voltage measurement.
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Boundary-Scan Controllers
Boundary-scan test and programming applications are only as dependable as the hardware they run on. JTAG Technologies has the industry’s most reliable IEEE 1149.x high speed and performance JTAG controllers, JTAG interfaces and more. To reliably execute your test and programming applications you can choose from a range of different controllers with different performance capabilities and form factors. For use in design, production and manufacturing and service.
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4 TAP JTAG Boundary-scan Controller for Teradyne Systems
QuadTAP/CFM
The Corelis QuadTAP/CFM high-speed multi-TAP boundary-scan system makes advanced, multi-TAP boundary-scan testing within ICT systems a reality. By combining ICT and boundary-scan, test engineers gain benefits from both technologies for the highest possible test coverage, speed, and capability.Specifically designed for integration into Teradyne TestStation and GR228x testers, the QuadTAP/CFM and QuadTAP/CFM Expander enable a clean, convenient multi-TAP boundary-scan solution.
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CoreCommander
While many ICs are equipped with a JTAG (IEEE Std. 1149.1) boundary-scan register (BSR), a significant number of microprocessors and DSPs can be found with deficient or even non-existent BSRs. CoreCommander Micro uses the on-chip debug mode of processors to access ports and embedded peripheral controllers to promote ''kernel-centric'' testing. Similarly, in the case of today's Field Programmable Gate Arrays (FPGAs) test engineers can ''bridge'' from the JTAG interface to the resources of the gate array itself. Our CoreCommander FPGA product implements a translatorinterface that allows our JTAG hardware to control embedded IP cores via a variety of bus interfaces (e.g. Wishbone Avalon etc.).
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Pod with Four Test Access Ports for 5v or 3.3V TTL Thresholds
JT 2137
The JT 2137 pod remains a popular choice for DataBlaster controller installations that require a compact signal conditioning pod embedded within a test fixture. The JT 2137 features four test access ports which together may be set for 5v or 3.3V TTL thresholds, although additional plug-in adapters are available that allow alternative thresholds to be set on a TAP by TAP basis (contact your local sales office for details). The 20-way 0.1″ IDC TAP headers comply with the standard JTAG Technologies 20-way pin-out and provide the additional flash programming controls Read/Busy and AutoWrite.
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Embed functional-test
ScanWorks Embedded Diagnostics
The ScanWorks platform for embedded instruments is supported by a wide variety of hardware controllers and accessories with which engineers can connect ScanWorks to their unit under test (UUT). Hardware is available for development, production and repair environments. The test platform required for ScanWorks is either a standard PC or a system with a built-in (embedded) JTAG controller.
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ABex Terminal Module for JTAG Technologies JT 37x7 BSCAN Cards
ABex TM-JT37x7
The ABex TM-JT37x7 is an ABex terminal module for the JTAG Technologies Boundary Scan Controller PXI/PXIe JT 37×7. In combination with the JT 2147/ABex from JTAG Technologies it integrates the POD functionality into the module.In combination with the PXI/PXIe JT 37×7 and the JT 2147/ABex it’s possible to connect up to four JTAG/Boundary Scan TAPs. All signal wires on the PCB are impedance controlled. In addition, all signals can be switched off via relays.
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Single-TAP CFM JTAG Controller for Teradyne ICTs
USB-1149.1/CFM
The USB-1149.1/CFM High-Speed single-TAP boundary-scan controller makes adding JTAG test to Teradyne ICTs a snap. Designed specifically for integration into Teradyne TestStation and GR228x testers, the USB-1149.1/CFM offers a clean, convenient boundary-scan solution.
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Portable JTAG Boundary-Scan Controller with USB (1.1 and 2.0 High Speed), Ethernet & Firewire Interfaces
JT 37x7/TSI
High speed and performance portable JTAG Boundary-scan controller, containing three interfaces to the test system: USB (1.1 and 2.0 high speed), Ethernet and FirewireThe controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.
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TAP Pods
JTAG Technologies designers have been developing high-speed digital test equipment for well over 30 years. The current range of controllers ranges from the compact, stylish and reliable JT 3705/USB to the rugged, dependable DataBlaster family and variants that have been developed for industrial use. The latest addition, JT5705/USB adds analog measure and source capabilities to provide a true mixed-signal tester platform.
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JTAG Boundary-Scan Toolkit Software & Hardware Bundle
JTAG Starter Kit
The Corelis JTAG Starter Kit includes the ScanExpress Debugger software application with a USB 2.0 JTAG controller. Engineers and technicians alike can use the system for a variety of tasks. The JTAG Starter Kit has an arsenal of features to control and observe system signals of a boundary scan compatible UUT.
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High-Performance LAN & USB JTAG Controller
NetUSB II™
Boundary-scan has proven itself time and again to be a truly versatile interface for structural test, embedded functional test, built-in self-test (BIST), software debug, and in-system programming. Supporting such diverse applications requires a controller with high performance specifications and diverse features.
