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- Pickering Interfaces Inc.
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PXIe Embedded Controller Module
43-920-001
The 43-920-001 Gen 4 PXIe embedded controller is the most compact and powerful 3U single-slot embedded controller for the PXI Express and CompactPCI Express platforms. With its huge and future-ready interface capabilities, it is designed to handle the most demanding test and measurement applications.
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Boundary-Scan Controller for PXI-Express 'Hybrid' Slots or Plug-In Controller for PXI-Express Peripheral Slot
JT 37×7/PXIE
High speed and performance JTAG Boundary-scan controller for PXI-Express ‘hybrid’ slots or plug-in controller for PXI-Express peripheral slot.The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.
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TAP Signal Isolation Module
JT 2139
The JT 2139 is a TAP signal isolation module designed for use in combinational test systems that utilise multiple instrument interfaces. To avoid parasitic capacitance effects and/or unwanted ground loops the JT 2139 can be used to completely galvanically isolate any JTAG Technologies boundary-scan controller from the remainder of the instrumentation system. JT 2139 isolators are a standard component of the JTAG Technologies ‘Symphony’ systems that integrate boundary-scan with In-Circuits Testers etc..
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JTAG Boundary-Scan Hardware
JTAG Boundary-Scan Hardware by Corelis, including boundary-scan controllers, 12C serial bus protocol analyzers & exercisers, JTAG boundary Scan Modules, high-volume production JTAG systems, 7 support for 3rd party JTAG controllers
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JTAG Boundary-Scan Controller
NetUSB-1149.1/SE
8-TAP USB 2.0 and LAN Based JTAG Controller. The NetUSB-1149.1/SE is an advanced 8-TAP USB 2.0 and LAN-based JTAG/boundary-scan controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard.
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Imbedded A5 Processor Test Interface
Advanced Microtechnology, Inc.
Advanced Microtechnology has extended the application of its Optimum product line with theintegration of ARC5 imbedded test functions. Up to 40 controllers may be independently powered and monitored for functionality using the process test interface of the Optimum WinAOS application. Each part may have 2 separate biases featuring both current and voltage monitoring. Independent test is implemented through a standard JTAG interface. A separate serial clock and command interface may be used if required to provide device initialization sequences. JTAG control is muxed to each part through the use of an independent clock for each part. All of the ARC processor registers and memory space may be tested through the JTAG I/O.
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JTAG Boundary-Scan Toolkit Software & Hardware Bundle
JTAG Starter Kit
The Corelis JTAG Starter Kit includes the ScanExpress Debugger software application with a USB 2.0 JTAG controller. Engineers and technicians alike can use the system for a variety of tasks. The JTAG Starter Kit has an arsenal of features to control and observe system signals of a boundary scan compatible UUT.
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Pod with Four Test Access Ports for 5v or 3.3V TTL Thresholds
JT 2137
The JT 2137 pod remains a popular choice for DataBlaster controller installations that require a compact signal conditioning pod embedded within a test fixture. The JT 2137 features four test access ports which together may be set for 5v or 3.3V TTL thresholds, although additional plug-in adapters are available that allow alternative thresholds to be set on a TAP by TAP basis (contact your local sales office for details). The 20-way 0.1″ IDC TAP headers comply with the standard JTAG Technologies 20-way pin-out and provide the additional flash programming controls Read/Busy and AutoWrite.
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High-Performance LAN & USB JTAG Controller
NetUSB II™
Boundary-scan has proven itself time and again to be a truly versatile interface for structural test, embedded functional test, built-in self-test (BIST), software debug, and in-system programming. Supporting such diverse applications requires a controller with high performance specifications and diverse features.
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ABex Terminal Module for JTAG Technologies JT 37x7 BSCAN Cards
ABex TM-JT37x7
The ABex TM-JT37x7 is an ABex terminal module for the JTAG Technologies Boundary Scan Controller PXI/PXIe JT 37×7. In combination with the JT 2147/ABex from JTAG Technologies it integrates the POD functionality into the module.In combination with the PXI/PXIe JT 37×7 and the JT 2147/ABex it’s possible to connect up to four JTAG/Boundary Scan TAPs. All signal wires on the PCB are impedance controlled. In addition, all signals can be switched off via relays.
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I/O Modules
JTAG Technologies designers have been developing high-speed digital test equipment for well over 30 years. The current range of controllers ranges from the compact, stylish and reliable JT 3705/USB to the rugged, dependable DataBlaster family and variants that have been developed for industrial use. The latest addition, JT5705/USB adds analog measure and source capabilities to provide a true mixed-signal tester platform.
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Boundary-Scan Test / In-System Programming Controller
CPXI-1149.1/Turbo
The CPXI-1149.1/Turbo is a high-performance boundary-scan controller for multi-TAP (Test Access Port) and concurrent JTAG test and in-system programming. When combined with a ScanTAP™ intelligent pod, the CPXI-1149.1/Turbo offers up to 80 MHz clock rates on 4, 8, or 32 TAPs with features such as external write strobe, direct programming, and analog voltage measurement.
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ScanBridge
JT 2154
The JT 2154 is an experiment board based on National Semiconductor’s STA111 device, aimed at users looking to utilise addressable bridge/multiplexors within their designs, and thus set-up ‘system level’ JTAG access. The unit can also be used in semi-permanent installations to expand the TAP (Test Access Port) count on JTAG Technologies controllers in order to address highly segmented designs. Built-in support for ScanBridge-type devices within ProVision allows easy set-up of TAP assignments and device addressing.
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4-TAP PXI Express JTAG Controller
PXIe-1149.1/4E
The PXIe-1149.1/4E is a highperformance, multi-feature boundaryscan controller for multi-TAP and concurrent JTAG test and in-system programming. Featuring a high-speed PXI Express (PXIe) interface with four independent and configurable Test Access Ports (TAPs) along with direct serial programming capability, the PXIe- 1149.1/4E enables of boundary-scan integration with PXIe systems.
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DataBlaster PCI / PCIE JTAG Boundary-Scan Controller
JT 37x7/PCI
High speed and performance JTAG Boundary-scan PCI PC plug-in controller for PCI bus slot or PCIe PC plug-in controller for PCI Express bus slot.The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘
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Remote Intelligent Pod
ScanTAP
The test patterns generated by the PCI-1149.1/Turbo controller are distributed to the target system either directly through ScanTAP 4 and ScanTAP-8 pods. The ScanTAP-4 and ScanTAP-8 pods can apply test vectors and/or ISP patterns to target boards with a variety of JTAG chain topologies. In the simplest case, the ScanTAP-4 and ScanTAP-8 will provide the interface between the PCI-1149.1/Turbo controller and a target system consisting of a single JTAG Test Access Port (TAP). This would be the case where the target system consists of one JTAG chain and its single associated TAP.
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TAP Pods
JTAG Technologies designers have been developing high-speed digital test equipment for well over 30 years. The current range of controllers ranges from the compact, stylish and reliable JT 3705/USB to the rugged, dependable DataBlaster family and variants that have been developed for industrial use. The latest addition, JT5705/USB adds analog measure and source capabilities to provide a true mixed-signal tester platform.
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High-Speed 4-TAP USB 2.0 JTAG Controller
USB-1149.1/4E
The USB-1149.1/4E is a high-performance plug-and-play IEEE-1149.1 Boundary-Scan (JTAG) controller for the Universal Serial Bus (USB 2.0). The USB-1149.1/4E is a high-speed device compliant with Revision 2.0 of the USB Bus Specification.
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19" Rack Mount Chassis, Industrial JTAG-Powered PCB Tester-Programmer 'CombiSystem'
JT 57××/RMIC
The new-concept, industrial JTAG-powered PCB tester-programmer the JT 57xx/RMIc ‘CombiSystem’ comprises a sleek base-level 19″ rack-mount chassis assembly that can house up to four customer-specified modules chosen from various JTAG (IEEE 1149.x) controllers, digital IO and analog IO and other measurement modules.
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Multiport JTAG Tester
XJQuad
XJQuad is a 4-port version of the XJLink2 USB-to-JTAG controller targeted at PCB manufacturers. It is supplied with XJRunner software for running XJDeveloper test systems. With a range of special features it is particularly suitable for concurrent/parallel testing on the production line. Each of the four ports has a high-speed interface which can be connected to up to four JTAG chains on each Unit Under Test (UUT).
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JTAG 3rd Party Controller Support
Corelis offers support for a variety of devices and instruments from third-parties in an effort to provide existing test platforms comprehensive JTAG test execution with Corelis ScanExpress software products. Supported instruments include National Instruments PXI-655x HSDIO and Teradyne Di-Series modules. Corelis also provides support for JTAG testing with FTDI FT2232 ICs embedded on a unit under test (UUT).
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JTAG Live Controller
The JTAG Live Controller is USB connected and powered and features a single test access port in JTAG Technologies standard 10-way IDC pin-out. The JTAG Live controller is a smart, low-cost and easy-to-use USB JTAG/Boundary-scan interface.
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JTAG Boundary-Scan Controller for PXI and PXI-Express 'Hybrid' Slots or Plug-In Controller for PXI-Express Peripheral Slot
JT 37x7/PXI
High speed and performance JTAG Boundary-scan controller for PXI and PXI-Express ‘hybrid’ slots or plug-in controller for PXI-Express peripheral slot.The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘
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PXI based Test Systems Module
PXI XJLink2
The PXI XJLink2 module allows the integration of XJTAG into PXI-based test systems. PXI XJLink2 has one JTAG controller that can be connected to up to 4 JTAG chains, which are configurable for pinout and voltage. It is easily integrated with LabVIEWTM with a full set of Virtual Instruments (VIs) included.
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Single-TAP CFM JTAG Controller for Teradyne ICTs
USB-1149.1/CFM
The USB-1149.1/CFM High-Speed single-TAP boundary-scan controller makes adding JTAG test to Teradyne ICTs a snap. Designed specifically for integration into Teradyne TestStation and GR228x testers, the USB-1149.1/CFM offers a clean, convenient boundary-scan solution.
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Boundary-Scan Test and In-System
PCIe-1149.1
The Corelis PCIe-1149.1 is a high-performance boundary-scan controller for multi-TAP (Test Access Port) and concurrent JTAG test and in-system programming. When combined with a ScanTAP™ intelligent pod, the PCIe-1149.1 offers up to 80 MHz clock rates on 4 or 8 TAPs with features such as external write strobe, direct programming, and analog voltage measurement.
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Complete TAP Signal Isolation for Corelis Boundary-Scan Controllers
ScanTAP IsoPod
The Corelis ScanTAP IsoPod™ is an add-on accessory that provides a galvanic isolation barrier between the target system and the boundary-scan (JTAG) controller hardware. While the Corelis boundary-scan controllers are highly robust and reliable, the complete electrical isolation helps prevent damage to the controller from harsh electrical environments where over-voltage and over-current can damage components.This Corelis ScanTAP IsoPod was designed to add an additional layer of protection with minimal cost and effort. Open the box and plug it in; everything just works.
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TAP Adapter for Corelis JTAG Controllers
Low Voltage Adapter
High technology, energy efficient, and small form factor products push JTAG interfaces to the limits; low power and high performance means low voltage, high speed, and high drive requirements. Building specialized interface circuits on product Printed Circuit Boards (PCBs) is inconvenient and costly—an out-of-the-box, external solution is needed.The Corelis Low Voltage adapter is an add-on accessory that provides existing scan controllers with an active, plug-in interface to access low voltage scan chains, without sacrificing performance.
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PCI Based JTAG Controller
PCI-1149.1/Turbo
The PCI-1149.1/Turbo is a powerful PCI-based JTAG/boundary-scan controller that is used for testing and in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard.
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Controllers
onTAP’s THREE TAP CONNECT JTAG
Connect the TAP CONNECT JTAG Controller to your application with either the Xilinx ribbon cable, flying leads, or Altera style adaptors. The onTAP TAP CONNECT Controller automatically senses and adjusts to target I/O voltages and interfaces to devices operating at 1.8 to 5.0 VDC for the standard controller, or 0.99 to 3.6 VDC for the low voltage controller, using the VREF voltage from the target chain. If there is no VREF available, you can set the voltage for the target application from the TAP CONNECT Controller. This facilitates easy configuration to many different JTAG ports, which is helpful in design and manufacturing.
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High-Speed USB 2.0 JTAG Controller
USB-1149.1/1E
The USB-1149.1/1E is a high-performance plug-and-play IEEE-1149.1 Boundary-Scan (JTAG) controller for the Universal Serial Bus (USB 2.0). The USB-1149.1/1E is a high-speed device compliant with Revision 2.0 of the USB Bus Specification.
