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JTAG
Boundary Scan is a topic that contains the various types of testers designed to control and observe the behaviour within boundary scan devices and the circuitry around them.
See Also: JTAG Controllers, JTAG Debuggers, JTAG Emulators, iJTAG, P1687, Boundary Scan
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JTAG Boundary-Scan Controller
NetUSB-1149.1/SE
8-TAP USB 2.0 and LAN Based JTAG Controller. The NetUSB-1149.1/SE is an advanced 8-TAP USB 2.0 and LAN-based JTAG/boundary-scan controller that can be used in the testing and/or in-system programming (ISP) of devices, boards, or systems compliant with the IEEE-1149.1 standard.
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JTAG/Background Debug Mode Test System PXI Card
NX5300
The NX5300 is a single slot 3U PXI device and interfaces to the unit under test via an On-Chip Debug (OCD) or JTAG port. The NX5300 is a high performance JTAG based background debug mode (BDM) diagnostic system designed for functional test, development, programming and troubleshooting of microprocessor and microcontroller based embedded processor systems.
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JTAG Emulators
XDS100v2 Series
The XDS100-class JTAG Emulator is an ultra-low-cost entry level JTAG debugger for TI devices. Blackhawk offers two models, each with two JTAG target connections. One model includes TI JTAG connections for 14-pin TI and 20-pin cTI JTAG headers. The other model provides ARM 10-pin and 20-pin JTAG connections. Both models are identical in software and device support except for the the target connections, so pick the one that matches your target board connection.
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Transient Suppression for Corelis JTAG Controllers
TAP Protection Adapter
Transient events such as Electrostatic Discharge (ESD), inductive switching, and lightning can damage electrical equipment, leading to costly repairs and test equipment down-time, reducing production capacity and increasing time-to-market.The Corelis TAP Protection Adapter is designed to enhance protection to any Corelis JTAG controller, shielding against harmful events using a combination of electrical defenses.The compact adapter features series resistors and transient voltage suppressor (TVS) diodes to mitigate damage to the JTAG controller. Protect your investment and enjoy peace-of-mind with the TAP Protection Adapter.
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ATE Integration
Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).
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JTAG Boundary-Scan Hardware
JTAG Boundary-Scan Hardware by Corelis, including boundary-scan controllers, 12C serial bus protocol analyzers & exercisers, JTAG boundary Scan Modules, high-volume production JTAG systems, 7 support for 3rd party JTAG controllers
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High-Speed USB 2.0 JTAG Controller
USB-1149.1/1E
The USB-1149.1/1E is a high-performance plug-and-play IEEE-1149.1 Boundary-Scan (JTAG) controller for the Universal Serial Bus (USB 2.0). The USB-1149.1/1E is a high-speed device compliant with Revision 2.0 of the USB Bus Specification.
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Embedded Development Kit
TySOM
The TySOM Embedded Development Kit is for the embedded designer who needs a high-performance RTL simulator/debugger for their embedded applications such as IoT, Factory Automation, UAV and Automotive. The kit includes Riviera-PRO Advanced Verification Platform and a Xilinx Zynq development board that contains single Zynq chip (FPGA + Dual ARM Cortex-A9), memories (DDR3, uSD), communication interfaces (miniPCIe, Ethernet, USB, Pmod, JTAG) and multimedia interfaces (HDMI, audio, CMOS camera).
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JTAG (and IJTAG) Environment Tool Suite
SAJE
SAJE is the SiliconAid Suite of JTAG related standards focused tools for chip development, verification, validation and patterns generation of ATE, Board, and System Test. Each tool can be used as a point tool by itself to compliment other tools in your flow. However, the SAJE Tool Suite used together in a flow can provide a total solution that also leveraging previous steps for debug and analysis.
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Imbedded A5 Processor Test Interface
Advanced Microtechnology, Inc.
Advanced Microtechnology has extended the application of its Optimum product line with theintegration of ARC5 imbedded test functions. Up to 40 controllers may be independently powered and monitored for functionality using the process test interface of the Optimum WinAOS application. Each part may have 2 separate biases featuring both current and voltage monitoring. Independent test is implemented through a standard JTAG interface. A separate serial clock and command interface may be used if required to provide device initialization sequences. JTAG control is muxed to each part through the use of an independent clock for each part. All of the ARC processor registers and memory space may be tested through the JTAG I/O.
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Graphical Circuit Interaction
XJAnalyser
XJAnalyser is a powerful tool for circuit visualisation and debugging. It provides a graphical view of JTAG chains, giving you complete control, on a pin-by-pin basis, of both pin state (either driven as an output or tristated as an input) and pin value (either high or low when driven), and it has the facility to run SVF and STAPL / JAM files.
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I/O Modules
JTAG Technologies designers have been developing high-speed digital test equipment for well over 30 years. The current range of controllers ranges from the compact, stylish and reliable JT 3705/USB to the rugged, dependable DataBlaster family and variants that have been developed for industrial use. The latest addition, JT5705/USB adds analog measure and source capabilities to provide a true mixed-signal tester platform.
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Boundary Scan Test (BST)
In the simplest case, the BST can be carried out via the connector of a module.Digital components require a JTAG port. In direct comparison to the ICT, the BST requires longer test times and the testing of analog components is not possible.
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Develop - Simulate - Validate JTAG / IJTAG based IP
NEBULA
You, your vendors and your customers being able to use one common interface to control and observe on-chip IP, resources and instruments. The figure below shows an example IC. The new IEEE 1149.1-2013 standard supports an init-data register for configuring the analog paramaters of I/O as well as controlling on-chip PLLs. The standard further extends this by defining in BSDL user test data registers or 'scan chains'. These registers enable the ability of generic software to control and observe mission mode IP and instruments simply by describing the register interface in BSDL.
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JTAG Live Controller
The JTAG Live Controller is USB connected and powered and features a single test access port in JTAG Technologies standard 10-way IDC pin-out. The JTAG Live controller is a smart, low-cost and easy-to-use USB JTAG/Boundary-scan interface.
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DDC (Dual DIMM Carrier) DIOS Adaptor
JT 2702/DDC
The JT2702 Digital 256 channel JTAG I/O module. JT2702/DDC (Dual DIMM Carrier) is a DIMM DIOS accessory product. It is typically used in custom test adapters or fixtures where a large number of digital I/O channels are required with a minimum space overhead.
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Production Stand-Alone
PSA
Using PSA, test engineers can build sequences of applications in the built-in AEX (Application EXecutive) manager using if then else goto capabilities. Sequence builders can also include additional capabilities through DOS/Win command line calls, create serial number logged test reports, export tests results to a database etc.. PSA includes drivers for all JTAG Technologies controller hardware past or present.
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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High-Performance Intelligent Pod for Corelis Boundary-Scan Controllers
ScanTAP 4 & 8
Boundary-scan has proven itself time and again to be a truly versatile interface for structural test, embedded functional test, built-in self-test (BIST), software debug, and in-system programming. Supporting such diverse applications requires equipment with high-performance specifications and extended features.Corelis ScanTAP pods are designed for use with PCI-1149.1/Turbo and PCIe-1149.1 high-speed JTAG controllers. Featuring 4 & 8 independent Test Access Ports (TAPs), up to 80 MHz clock rates, and advanced TAP capabilities such as analog voltage measurement, the ScanTAP family of intelligent pods is the ideal JTAG interface for high-performance environments.
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JTAG External Modules (JEM) DIMM/SODIMM Socket Cluster Test
The primary function of the JTAG External Modules (JEM) for the DIMM/SODIMM Socket Cluster Test is to provide test access to off-board signals that otherwise could not be accessed by a JTAG test system and to strengthen the memory-independent JTAG testing for the assembly correctness of the almost full spectrum of the modern socket types, particularly (according to JEDEC_Std.21-C):
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ARM LPC3250 Board
MS 1509
- 32 Bit ARM LPC3250 Processor (256KB SRAM)- 133MHz External Bus Speed and 266 MHz internal CPU Speed- 32 Bit, 33MHz CPCI Bus, 6U Form Factor- External memory ( Flash – 2 MB, RAM - 512 KB, DPRAM – 128KB)- 10/100 MBPS Ethernet Interface- USB 2.0 Host/Device Interface- 2 RS232 Serial Ports, 4 RS422 Serial Ports- M Module Interface- 6U board compatible with CPCI & PXI backplanes- High Speed Logic Device- Hot Swap Feature- Front Panel and Rear IO Interface- External Bus through Rear IO- Reception of 3Kbytes within 2ms through Ethernet- Board Dimension is 160mm x 233.35mm- Power Requirements: +3.3V, +5V and +/-12V- Board Dimension is 160mm x 233.35mm- Board has Rear IO interface- Ethernet, JTAG, RS232, USB connectors at front side- BSPs and Driver software for Windows and Linux OS
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Training Board
The JT 2156 training board has been devised to demonstrate all the latest features and test techniques available to users of JTAG Technologies’ ProVision & JTAG Live application development systems. As well as a modern ARM Core processor, the design also includes an Altera Cyclone FPGA, DDR Memory, Ethernet PHY, and several SPI and I2C peripheral parts. The JT2156 is shipped with a comprehensive self-study manual for getting to know the in-depth features of ProVision and/or JTAGLive Studio. For Altium users the design also serves as an example of how to adapt the Nano board into a realistic custom design.
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Pin Converters
Blackhawk provides several different emulation pin converters to fit Texas Instruments standard JTAG target headers. This includes 14-pin TI, 20-pin cTi & ARM, 10-pin ARM, 60-pin XDS560 Trace and System Trace. All pin converters are available from the our Online Store or an authorized Blackhawk reseller.
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eDAK For MAC Panel
JT 2147/eDAC for MAC Panel
The JT 2147/eDAK is a new variant of the JTAG Technologies QuadPOD signal conditioning interface specifically designed for use within a MAC Panel ‘Scout’ mass interconnect interface. The unit integrates both the JT 2148 transceiver circuitry plus four independent, programmable TAP modules (two of type JT 2149 and two of type JT2149/MPV) on a single board that matches the MAC Panel Direct Access Kit (DAK) form factor. Overall this configuration offers four Test Access Ports, 64 Digital IO Scan channels and reconfigurable (SCIL) capabilities
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Complete IP Module
Scan Ring Linker SRL
The Scan Ring Linker SRLTM - is a complete IP module that can be easily embedded into a CPLD, FPGA or ASIC on a PCB to reduce the complexities and costs of designing 1149.1 (JTAG) test infrastructure for designs that use multiple scan rings. The SRL IP module links any number of scan rings (secondary scan paths) into a single high-speed test bus, which permits devices on secondary scan chains to be independently tested and configured through a single 1149.1 external interface.
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Multiport JTAG Tester
XJQuad
XJQuad is a 4-port version of the XJLink2 USB-to-JTAG controller targeted at PCB manufacturers. It is supplied with XJRunner software for running XJDeveloper test systems. With a range of special features it is particularly suitable for concurrent/parallel testing on the production line. Each of the four ports has a high-speed interface which can be connected to up to four JTAG chains on each Unit Under Test (UUT).
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Digital/Analog/Frequency Measurement Module
JT 2149/DAF
The JT 2149/DAF is a compact, mixed-signal (Digital/Analog/Frequency) measurement module for use in JTAG Technologies’ widely-used JT 2147 (QuadPod) signal conditioning interface. The DAF module has been designed to replace a regular TAP Pod and provides 28 measurement channels plus a clock generator. When connected to a circuit board via edge connector or test fixture/jig test pins, the module enhances standard digital boundary-scan tests by enabling a series of analog and frequency measurements to be made.
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3U PXI Express Board Virtex-5 Medium Speed Quad DAC
SMT759
Sundance Multiprocessor Technology Ltd.
The SMT700 module uses a Xilinx Virtex 5 LXT or SXT to implement the interfaces the board provides. The FPGA can be configured either via the onboard flash, or through the Xilinx JTAG header.
