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- PalmSens BV
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Integrated Potentiostat and Multiplexer
EmStatMUX8
Based upon the EmStat range, there are two types of multiplexers to suit most types of sensor array work. The MUX8 is the most flexible offering the ability to connect arrays made of up to eight working electrodes in two or three electrode cell types and chips sharing a reference electrode and/or counter electrode. The MUX16 is suitable for sensor arrays or chips with sixteen working electrodes all sharing a RE and/or a CE. Both instruments are suitable for laminated layer corrosion analysis.The potentiostat is controlled and powered by USB and is used with PSTrace allowing for simultaneous sampling of each channel at a rate of 25 ms/channel. Standard packaging includes a shielded cable with connections for a working, a counter and a reference electrode by means of 2 mm banana connectors and mini-crocodile clips, a stripped end, Dsub-37 terminated flat cable and a USB cable. To make connections to chips simpler the Connection Terminal is an optional extra providing clearly marked screw terminals to the electrodes and can be directly joined to the ESMUX via their D-Sub connectors.
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Fuel Display Unit Tester
MS 1125
Fuel Display Unit Test Bench is a compact table-top test bench with front panel controls, indications, built-in signal simulator and necessary power supply for testing the serviceability of Fuel Display Unit of Helicopter. FTB operates on 230 V AC and supplies 28 V DC power to FDU. FTB is housed in a metallic cabinet FTB interfaces with both 61 Pin connector and 6-pin socket mounted on the rear panel of FDU by means of the cable connected to the unit. FTB is fabricated utilizing off-the-shelf standard industrial/commercial components like rotary switches, toggle switches, press switches, test sockets, fuse holders, potentiometer etc. The Frequency generation circuit is integrated into FTB for the simulation of Fuel probe and flow rate signals. The frequency of the signal can be selected by means of a rotary switch Low amplitude sine wave signal is simulated for testing flow rates. Variable voltage DC power supply with a voltage range of 24 to 29 Volts is provided within FTB to power-up FDU. 5 V DC is provided for the operation of signal generating circuit (PIC Frequency Controller Board). An off-the-shelf Hand held battery operated Digital Multimeter (DMM) procured from the prominent manufacturer (FLUKE) is supplied with FTB for setting up and measurement of various parameters like Resistance, Voltage, Frequency etc.
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USB-8451, 250 kHz I2C, 12 MHz SPI I2C/SPI Interface Device
779553-50
The NI USB‑8451 is a master interface for connecting to and communicating with inter-integrated circuit (I2C), System Management Bus (SMBus), and serial peripheral interface (SPI) devices. With plug‑and‑play USB connectivity, the USB‑8451 is a portable solution to communicate with consumer electronics and integrated circuits. It also includes eight general-purpose digital I/O lines for a variety of applications, such as configuring the address of I2C devices or toggling LEDs. The USB‑8451 can be physically located more closely to I2C/SPI devices than PCI interfaces, reducing I2C bus length and minimizing noise problems. Additionally, the interface provides +5 V and GND to power circuits with no external power supply.
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Electrical & Electronic Simulation
Maya Heat Transfer Technologies Ltd.
Improve the design of electrical and wire harnesses, electronic systems, and integrated circuits (IC). Find software solutions to facilitate the development of electrical systems for large, complex platforms.
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PXIe-4138, 60 V, 3 A System PXI Source Measure Unit
782856-01
±60 V, 3 A System PXI Source Measure Unit—The PXIe‑4138 system source measure unit (SMU) delivers high power, precision, and speed. It is ideal for a broad range of applications including manufacturing test; board-level test; lab characterization with devices such as integrated circuits (ICs), power management integrated circuits (PMICs), and radio frequency integrated circuits (RFICs); and discrete devices including LEDs and optical transceivers. The PXIe‑4138 features 4-quadrant operation. The PXIe‑4138 is a hardware-timed instrument with a high-speed sequencing engine for synchronizing acquisitions between multiple SMUs. The module supports direct DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument.
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Adjustable Isolating Transformers
PeakTech Prüf- und Messtechnik GmbH
The PeakTech 2235 is a 2 in 1 laboratory isolating transformer with integrated DC power supply, which was designed with the aspect of high safety requirements for use in research, science and repair. The device has a dual adjustable DC, AC output, which can also be used for constant voltage or current and offers high stability and performance. The output voltage or the output current can be read exactly on two separate 3-digit LED displays and the fixed output supplies a voltage of 5 V. The device is protected against damage by overload and short circuit by reliable overvoltage protection and can be placed in a 19 ”rack installed or used as a table device (“stand-alone”).
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Voltage Breakdown Testing Machine
DRK218
Shandong Drick Instruments Co., Ltd.
DRK218 breakdown voltage tester is controlled by the computer, through a new smart digital integrated circuits developed by my company and software control system to make the step-up rate is truly uniform, accurate, and be able to accurately measure the leakage current data. Real-time rendering test curve accurate judgment and it can save, analyze and print test data.
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Drive-Thru Feature, GTE 10.00p
K8218A
The DriveThru feature enables the test development software to test integrated circuits or connectors when there are no test points assigned between the resistor and the device.
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Controllable, Programmable Linear DC Source With Load
LAB / SL
*Linear laboratory power supply*Integrated electronic load*Linear regulated DC laboratory power supply*No thyristor pre-regulation, very little ripple*Various interfaces · Built-in electronic load*Protection against short circuit, overload and overtemperature*Constant current and constant voltage*Fast control times approx. 250 µS
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Configurable OSAT Friendly Pick-and-Place Handler
Delta Eclipse
Eclipse delivers scalable performance for testing a wide range of semiconductors, from analog ICs to high-performance CPUs and mobile processors. The Eclipse is a high-speed pick-and-place handler designed to test up to 16 Integrated Circuits (ICs) in parallel, at temperatures from -45°C to +155°C*, with throughput up to 13,000 UPH.
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Copper Pillar Bump
Like in conventional fabrication, integrated circuits are created on the wafer but near the end of the manufacturing process, the attachment pads are metalized on the surface of the chips to make them more receptive to solder. Then solder dots are deposited on each of the pads, and chips are cut, flipped, and positioned so that the solder balls are facing the connectors on the external circuitry.
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PXIe-4136, 200 V, 1 A System PXIe Source Measure Unit
783760-01
±200 V, 1 A System PXI Source Measure Unit—The PXIe‑4136 system source measure unit (SMU) delivers high power, precision, and speed. It is ideal for a broad range of applications including manufacturing test; board-level test; lab characterization with devices such as integrated circuits (ICs), power management integrated circuits (PMICs), and radio frequency integrated circuits (RFICs); and discrete devices including LEDs and optical transceivers. The PXIe‑4136 features 4-quadrant operation. The PXIe‑4136 is a hardware-timed instrument with a high-speed sequencing engine for synchronizing acquisitions between multiple SMUs. The module supports direct DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument.
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Switches-Limiter
Macom Technology Solutions Holdings Inc.
At MACOM we offer an extensive collection of switches covering multiple commercial and aerospace and defense markets. Our product portfolio has a broad frequency spectrum from DC to 70 GHz. Our silicon Heterolithic Microwave Integrated Circuit (HMIC) PIN diode process is ideal for high power and broadband switches operating from 50 MHz to 26 GHz. Our AlGaAs PIN diode process can extend the upper frequency range of our switch die beyond 70 GHz and is ideal for instrumentation and radar applications. Our GaAs pHEMT and MESFET technology is ideal for fast switching and low control voltage switches optimized for both narrow band and broadband applications. Our 75 Ohm absorptive switches are designed specifically for demanding CATV, FTTx and DBS Infrastructure and CPE applications.
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Microcontrollers
A compact integrated circuit designed to govern a specific operation in an embedded system.
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Electric Brake Force Meter With Dynamic Load Simulation And Circuit Testing
9107A
Innovative Products of America
The #9107 Electric Brake Force Meter with Dynamic Load Simulation and Circuit Testing (patents pending) is designed for use on 7-spade equipped vehicles. This new technology automatically recognizes the electronic signature of both Integrated (ITBC) and aftermarket Trailer Brake Controllers, simulates trailer load and displays real-time, brake-controller output gain and application time. It can quickly troubleshoot truck-side tow circuits, e.g., tail lights, turn signals, 12V+, reverse and ground condition and the 25 ft. cable allows for one-man, in-cab testing.
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High Voltage 50 Ω Pulse Generator
TLP-12010A
High Power Pulse Instruments GmbH
- High pulse output current up to ±120 A (short circuit)- Ultra-fast 50 Ω high voltage pulse output with typical 300 ps rise time- Wafer, package and system level TLP and HMM testing- 180 kW peak output power into 50 Ω load- Built-in HMM pulse up to ±32 kV in 50 Ω-configuration- High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)- 6 digital programmable pulse rise times out of: 300 ps to 50 ns (optional)- 1 built-in pulse width: 100 ns- Optional external pulse width extensions from 5 ns to 500 ns using the external pulse width extender TLP-12012A6- Built-in pulse reflection suppression- Fast measurement time, typically less than 0.2 s per pulse including one-point DC measurement between pulses- Efficient software for system control and waveform data management- The software can control automatic probers for fast measurements of complete wafers- Integrated interlock safety shut-down- Industrial isolated and EMI/ESD protected USB control interface
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TopSpice 10
TopSpice is an affordable integrated computer-aided circuit design software package offering advanced native mixed-mode mixed-signal analog/digital/behavioral simulation based on the industry standard SPICE simulator program.
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Integrated Couplers/ Harmonic Mixers
These waveguide bandwidth integrated coupler/mixers are designed to allow phase locking or signal monitoring of compact millimeter wave systems. RF inputs and outputs are on opposite sides of a thin wafer to obtain minimum insertion length. These devices use silicon Schottky barrier beam-lead diodes on a rugged stripline circuit. Nominal coupling value is 10 dB. For coupling values greater than 10 dB, non-directional coupler models are available (consult factory).
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Laser Interferometer Position Measurement Systems
When built into manufacturing and inspection equipment, a laser interferometer system reports the position or controls the motion of a product platform with more accuracy than any other method. It allows manufacturers to produce precision products from integrated circuits to medical devices to aerospace components that meet the most stringent specifications.
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USB-8452, 3.3 MHz I2C, 50 MHz SPI I2C/SPI Interface Device
781964-02
The NI USB‑8452 is a master interface for connecting to and communicating with inter-integrated circuit (I2C) and serial peripheral interface (SPI) devices. With plug‑and‑play USB connectivity, the USB‑8452 is a bus-powered, portable solution to communicate with consumer electronics and integrated circuits. It also includes eight general-purpose digital I/O lines for a variety of applications, such as configuring the address of I2C devices, toggling LEDs, or strobing convert and data ready lines common to analog converter chips. You can physically place the USB‑8452 more closely than PCI interfaces to I2C/SPI devices, which reduces I2C bus length and minimizes noise problems. Additionally, the interface provides +5 V and GND to power circuits with no external power supply.
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Thermal Imaging System for Electronics Testing
ETS320
Whether the goal is product testing or scientific research, heat can be an important indicator of how a system is functioning. The FLIR ETS320 is a non-contact thermal measurement system that pairs a high-sensitivity infrared camera with an integrated stand, for hands-free measurement of printed circuit boards and other small electronics.
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PXIe-4162, 12-Channel, ±24 V, Precision PXI Source Measure Unit
785680-01
PXIe, 12-Channel, ±24 V, Precision PXI Source Measure Unit - The PXIe-4162 is a high-precision, high-density source measure unit (SMU) with 12 identical SMU channels. This module features 4-quadrant operation, integrated remote (4 wire) sensing in each channel for accurate measurements, as well as analog-to-digital converter technology to help you perform high-precision measurements. It also features guard terminals to remove the effects of leakage currents and parasitic capacitances. Additionally, the PXIe-4162 can maximize stability and measurement accuracy with SourceAdapt technology, which you can use to tune the transient response to match the characteristics of any load. The PXIe-4162 is ideal for a broad range of mixed-signal integrated circuits (ICs) in semiconductor production test.
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PXIe-4163, 24-Channel, ±24 V, 50 mA PXI Source Measure Unit
784483-01
PXIe, 24-Channel, ±24 V, 50 mA PXI Source Measure Unit—The PXIe-4163 is a high-density source measure unit (SMU). It features 4-quadrant operation with a current resolution of 100 pA and the ability to sample up to 100 kS/s. The module also offers the ability to maximize stability and measurement accuracy with SourceAdapt, which allows you to custom-tune the transient response to match the characteristics of any load. The PXI-4163 is ideal for a broad range of mixed-signal integrated circuits (ICs) in semiconductor production test.
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Hall Effect Sensor
The hall effect sensor products are manufactured according to international standards. Being an ISO 9001:2008, ISO 14001 and OHSAS 18001 certified company, DER EE is capable of designing and producing superior products to the highest standards of customers' requirements. Hall effect sensors we provided are a device containing both the sensor which produces a very low signal level and contains the vacuum tube amplifier and a high gain integrated circuit (IC) amplifier in a single package. hall effect sensor offer many applications to sense position and motion, to control electric motor control, to sense wheel rotation and so on.
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Switches
Whether you are performing high-accuracy, low-speed measurements on a dozen test points or high-channel, high-frequency characterizations of integrated circuits, National Instruments delivers a flexible, modular switching solution based on PXI or SCXI to help you maximize equipment reuse, test throughput, and system scalability.
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.13u ESD diode
Impulse TSMC
The Impulse TSMC .13u ESD diode was made to provide ESD discharge paths when integrating third party IP in an integrated circuit design for total ESD protection. The Impulse ESD diode has been successfully used with Dolphin Technologies, Artisan/ARM, TriCN/Synopsis I/O libraries, as well as popular IP blocks from RAMBUS, Chip Idea and other quality IP vendors. A 5.5 volt reverse bias anode to cathode operational specification enables the Impulse TSMC .13u ESD diode to be the device of choice for 5 volt tolerant designs.
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Burn-In System
The COBIS-II Series Burn-in System is designed to test the latest high frequency integrated circuits (ICs) and combines a large capacity oven with well proven Accutron FlexBID™ dynamic driver technology. This system is engineered for productive dynamic device testing and reliable monitoring.
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High-Density Precision SMU (100 PA, 30 V)
PZ2130A
The Keysight PZ2130A is a high-channel density precision source / measure unit (SMU) with 5 channels per module that saves space at a low cost per channel for a wide range of applications requiring numerous precision power supplies. Its seamless current measurement ranging function eliminates the time it takes to change the range and expands the dynamic range to cover multiple measurement ranges, which reduces test duration. These capabilities make the PZ2130A suitable for applications that require numerous precision power supplies, such as semiconductor reliability tests and integrated circuit (IC) tests. The Keysight PX0107A low noise filter adapter lowers its voltage source noise level, which makes the PZ2130A suitable for noise sensitive applications such as quantum computing as well.
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SMD Test Probes
The Parrot Clip, model PCM W1 or PCS-MB W1 invention can be connected to resistance’s, diodes, integrated circuits (SOIC, SO) etcThe advantage of the Parrot Clip is given by the double metal connection made between the new metal tip and the steel hooked rod, spring loaded. This connection, being made by metal parts is electrical and mechanical reliable, even if the contact point are small. Connections are resistant even at high temperatures.
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ASICs
ams has been creating unique ASIC (Application Specific Integrated Circuit) solutions in partnership with customers for over 30 years. We enable our partners to create highly differentiated products that are smarter, safer, easier to use and more eco-friendly. Our various industry experts in automotive, industry, medical and smart building are looking forward to talk to you and to define the solution which will exactly fit your needs.
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Automated Wafer Prober for Magnetic Devices and Sensors
Hprobe design and fabricate turnkey automated testing equipment (ATE) for electrical characterization and testing of integrated circuits under magnetic field such as MRAM (Magnetic Random Access Memory) and sensors. In each phase of the technology and product development as well as during mass manufacturing, a dedicated magnetic tester is available.
