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- TEAM SOLUTIONS, INC.
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PCI Bus Analog Output Board, 4 Isolated Outputs, 14 Bit
APCI-3501-4
4 analog output channels Optical isolation 500 V Settling time 30 µs typ. 14-bit resolution (13 bit for 0-10 V) Output voltage: ±10 V, 0-10 V (switchable through software) Output voltage after reset: 0 V Each output channel has its own ground line (without optical isolation from the others) Driver capacity: 5 mA/500 pF Short-circuit protection, EMI filters Noise neutralization of the PC supply Creeping distance: 3.2 mm acc. to DIN VDE 0411-100 Watchdog for resetting the analog output channels (4 different time units: µs, ms, s, min) or as 12-bit timer (with interrupt possibility), when the watchdog function is not necessary2 digital input channels, 24 V, isolated 2 digital output channels, 24 V, isolated Noise immunity Test level: ESD: 4 kV Fields: 10 V/m Burst: 4 kV Cond. radio interferences: 10 V
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Semiconductor & Electronic Systems Test and Diagnostics Services
Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
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ESD Generators
The ESD Simulators ESD suitable for performing EMC tests of systems and equipment according to the standards IEC / EN 61000-4-2 and ISO / TR 10605. It can far beyond the standard boundaries higher test levels are adjusted. Depending on the device under test and the test setup are two test method shall be: Air discharge (AIR) and contact discharge (CON).
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ESD Simulators
Suzhou 3ctest Electronic Co.,Ltd.
State of the art electrostatic discharge simulator available in 18KV. It is the most ergonomic ESD gun without an additional base control unit. It can be operated via battery or mains. The easy to use touch screen, ergonomic design, modular R/C units, remote control software, built-in LED light and temperature and humidity display allows a trouble-free use in all types of test sites.
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Ohm-Stat Guardian Pro Constant Monitor
Tests two people and two wriststrapsLED and buzzerNIST calibration includedWorks with all single wire capacitance wrist strapsAll cords suppliedCE markCan be calibratedProduct conforms to the ESD S.20.20 spec standards110v AC powerGround dock included
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ESD Test Simulator
ONYX16
The ONYX is a state of the art electrostatic discharge simulator available in 16kV or 30kV versions. It is the most ergonomic 30kV ESD gun without an additional base control unit that can be battery or mains operated. The easy to use touch screen, ergonomic design, modular RC units, multilingual interface, remote control software, built-in LED light and temperature & humidity display allows for trouble-free use of the ONYX in all types of test sites.
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Pulsed IV-Curve Solutions
Pulsed IV-Curve Test and Analysis System is our new development for 2015. It is an advanced and compact pulsed IV-curve characterization system designed to simulate pulsed ESD events such as TLP, vf-TLP, HMM, HBM, EFT, and LV-Surge. It will monitor the transient voltage and current waveform during the pulse in ps or ns segment, and test the pre- and post-pulse status (leakage current, breakdown voltage, biasing current, static IV curve, etc) of the device under test (DUT), such as protection devices, semiconductors, circuit modules, touch panel sensor, etc.
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1Gsps, 9 Channel, Logic Analyzer with Protocol Analyzer plugins and Hardware Compression
DigiView™ DV509
- Physical Channels: 9- Sample rate: 4ch@1 Gsps or 9ch@500Msps (4 ch. are sampled every 1ns or 9 ch. are sampled every 2ns)- Typical capture: 100M transitions (> 1B samples)- Hardware based triggers with 8 universal match circuits, and partitionable 16 stage sequencer- Adjustable Threshold (± 4V)- Real-time, Hardware-based, Adaptive Compression- Channels protected to ± 20V- Ground leads protected to ± 12V- High-quality test leads: 66 strand soft copper wires, flexible insulation, and gold plated connectors. Fit .025 square posts as well as the included clips.- Extra ESD protection- Streaming storage with auto fall-back to Store & Forward mode ensures large storage and reliability.- USB 3.0 (SS) or USB 2.0 (High Speed)- USB powered- Each DigiVIew includes all avialable Protocol Analyzer plugins (including: I2C, SPI, CAN, Async, Sync, 1-wire, I2S, TDM)- Free Plugin Developers' Kit- Requires Windows 7 or greater OS (32bit or 64bit)- Free Lifetime sofware updates.- 1 year warranty
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Test System
4003 TLP+™
The Model 4002 TLP+™ test system was the first turn-key commercial TLP developed for the ESD industry and has remained the leader in the ESD square pulse testing field since this method was first introduced in 1989. This tester is the ultimate design and analysis tool for ESD protection circuits. It provides Pulse Curve Traces of circuit characteristics which simulate ESD tests. This allows you to see into a chip’s operation taking out the guesswork which speeds your design and minimizes lost time.
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1Gsps, 18 Channel, Logic Analyzer with Protocol Analyzer plugins and Hardware Compression
DigiView™ DV518
- Physical Channels: 18- Sample rate: 4ch@1 Gsps or 9ch@500Msps or 18ch@1Gsps (4 ch. are sampled every 1ns or 9 ch. are sampled every 2ns or 18 ch. are sammpled every 4ns)- Typical capture: 100M transitions (> 1B samples)- Hardware based triggers with 8 universal match circuits, and partitionable 16 stage sequencer- Adjustable Threshold (± 4V)- Real-time, Hardware-based, Adaptive Compression- Channels protected to ± 20V- Ground leads protected to ± 12V- High-quality test leads: 66 strand soft copper wires, flexible insulation, and gold plated connectors. Fit .025 square posts as well as the included clips.- Extra ESD protection- Streaming storage with auto fall-back to Store & Forward mode ensures large storage and reliability.- USB 3.0 (SS) or USB 2.0 (High Speed)- USB powered- Each DigiVIew includes all avialable Protocol Analyzer plugins (including: I2C, SPI, CAN, Async, Sync, 1-wire, I2S, TDM)- Free Plugin Developers' Kit- Requires Windows 7 or greater OS (32bit or 64bit)- Free Lifetime sofware updates.- 1 year warranty
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ESD Latch Up Tester
1100-ESD
Tokyo Electronics Trading Co., Ltd.
The Model 1100-ESD can easily and accurately perform ESD tests (HBM, MM) on ICs up to 64 pins. Also, all common pin combinations required by the standard can be realized.
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Impulse Semiconductor High Current Integrated
Transmission Line Pulse Test System
The Impulse Semiconductor High Current Transmission Line Pulse (TLP) test system is the tool of choice for extracting ESD parameters for transient protection devices in a package, or at wafer level. With accuracy better than 100 milliohms at 40 amps peak current, the Impulse high current TLP is specially tailored to the needs of today's ESD device designers who must accurately measure low values dynamic resistance irrespective of breakdown voltage.
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ESD Wrist Strap & ESD Heel Strap (Footwear) combination Tester
ESD Wrist Strap and ESD Footwear being the front line defense against electrostatic build-up on the human body, must remain electrically perceptive for the user. Thus, it is very important to test every wrist strap and heel strap regularly. This combination Tester does the job efficiently without the hassle of juggling several gadgets.
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ESD Tester
PurePulse
Grund Technical Solutions, Inc.
PurePulse is a flexible and efficient ESD tester for HBM, TLP, MM and HMM. Its 2-pin style setup reduces tester parasitics, it captures waveform data and can be automated to test thousands of pins without the need for a test fixture. Our PurePulse system was designed from the ground up to be customized to meet your testing needs, take a look at the features below and schedule a demo with us to learn more.
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Microelectronics Test & Engineering Services
EAG's Microelectronics Test and Engineering lab network provides semiconductor and electronics design firms worldwide with test, debug, and early engineering support to help you with new product introduction. We actively service a broad range of semiconductor and electronics companies worldwide. Services include ATE testing, Reliability testing and qualification, ESD testing, Failure Analysis, FIB Circuit Edit and Debug. for both ICs and systems
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Transient Suppression for Corelis JTAG Controllers
TAP Protection Adapter
Transient events such as Electrostatic Discharge (ESD), inductive switching, and lightning can damage electrical equipment, leading to costly repairs and test equipment down-time, reducing production capacity and increasing time-to-market.The Corelis TAP Protection Adapter is designed to enhance protection to any Corelis JTAG controller, shielding against harmful events using a combination of electrical defenses.The compact adapter features series resistors and transient voltage suppressor (TVS) diodes to mitigate damage to the JTAG controller. Protect your investment and enjoy peace-of-mind with the TAP Protection Adapter.
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Resistance Meter - Portable, Precision Resistance Measurement from 0.10 to 1.00 x 10^12 Ohms
PRS-812B
- Wide Range Resistance: 0.10 Ω to 1.00x1012 Ω- Accuracy of ±2% from 1.00 Ω to 9.99x1010Ω- Constant Test voltages 10V and 100V for specification measurements to meet international and domestic ESD measurement standards- Auto Resistance Range Control- Auto Test Voltage Control- Uses a Rechargeable Li-ion Battery Pack- Takes Approximately 8,000 Measurements on a Single Charge (480 hours typical)- 120 Data Set Internal Memory- Uses Standard USB Cable for Charging- Charges in 2 Hours- 2-year Limited Warranty on Main Instrument
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Cleanroom Testing
MicroStat Laboratories -R.E.T.S.
We utilize the relevant test methods and standards set forth by the ESD Association, ANSI, ASTM, NFPA, IEST, IEC, ISO, or our clients’ in-house specifications. ESD testing is performed in-house; other testing can be arranged through sub-contractors with interpretation of results performed by experienced contamination control experts..
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ESD LCD SURFACE RESISTIVITY METER (WITH 1 PAIR OF 5 POUND ELECTRODES)
The ESD LCD SURFACE RESISTIVITY METER provides everything necessary to test work surfaces using the procedure outlined in the EOS/ESD-S4.1 standard. This test kit makes testing surface resistance easy – simply place the weights attach the cables, switch to the correct voltage and press the button to read resistance directly on the meter. The meter incorporates parallel probes on the bottom of the unit which allows the user to make surface resistivity measurements. The parallel probes allow for quick and easy testing of a variety of surfaces and materials, without the use of the five pound electrodes
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ESD Test System
58154 Series
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
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Wide Range Ohmmeter
PAS-853B
- Wide Resistance Measurement Range from 0.01 ohm to 9.99x1012 ohms- Nominal Full Range Tolerance Averages <±5%- Fully Automatic Resistance Range, Test Voltage and Electrification Period Control- Automatic or Continuous Electrification ControlRugged High Performance 80 inches (200cm) Test Leads Included- Powered by one long lasting 9V Alkaline Battery- Large, Easy to Read LCD Display- Meets requirements of ESD Association Standards for material and audit resistance measurement requirements- Certificate of Calibration Traceable to NIST included
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Immunity Development System
Used for EMI suppression in printed circuit boards during the development phase. The developer can use the E1 set to quickly identify the causes of burst and ESD interference. This allows the developer to design suitable measures to solve the causes of the interference. It can also be used to test the effectiveness of the measures taken.
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Digital Surface Resistance Test Kit
PAS-853BRM
- Surface Resistance Kit from 0.01 ohm to 9.99x1012 ohms- Nominal Full Range Tolerance Averages <±5%- Fully Automatic Resistance Range, Test Voltage and Electrification Period control- Determines if a surface is Dissipative, Conductive, or Insulative- Measures resistance point-to-point(Rtt) and point-to-ground (Rtg)- Measures resistance of Static Control Floors, ESD Work Surfaces and Packaging Material- Conforms to all ESD Association Standards for Resistive Characterization- Includes 2 each Conductive Rubber Electrodes- Packaged in a hard shell Carrying Case- Certificate of Calibration Traceable to NIST included
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ESD & Latch-Up Test Service
MASER Engineering has automatic test equipment for the most common ESD test pulse models. MIL - JEDEC - ESDA - IEC standards. IC level Human Body Model. IC level Machine Model. IC level Charged Device Model. System level IEC 61000 HBM. AEC-Q100 Field Induced Gate Leakage test. Static Latch-Up test. Dynamic Latch-Up test.
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ESD & Latch-Up Test System
Identify and help correct ESD and latch-up susceptibility issues on sensitive integrated circuit components prior to full-scale production with the Thermo Scientific™ MK.2-SE ESD and Latch-Up Test System. The MK.2-SE test system provides advanced capabilities to test high pin count IC devices to Human Body Model (HBM) and Machine Model (MM) ESD standards. The system’s pulse delivery design addresses wave form hazards such as trailing pulse and pre-discharge voltage rise, and performs Latch-Up testing per the JEDEC EIA/JESD 78 Method.
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Decay Accessory Set
PGB-745
- Designed for measuring charge movement and decay time of ESD controlled materials- The set consists of two stainless steel electrodes and two very high resistance test leads selected for this application- The high resistance leads minimize leakage during the test cycle and are equipped with male banana plugs
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Surface Resistance System Kit
PRS-801RM
- Perform Point-to-Point and Resistance to Ground Measurements from 0.01 Ω to 200 Teraohms- Accuracy of ±2% from 1.00 Ω to 9.99x1010Ω- Measures in accordance with ESD TR53, ANSI/ESD S4.1, ANSI/ESD S7.1, ANSI/ESD STM97.1 and others- Constant Test voltages 10V and 100V meeting ANSI/ESD S20.20- Operates using a Rechargeable Li-ion Battery Pack- Takes Approximately 8,000 Measurements on a Single Charge (480 hours typical)- Stores up to 999 Test Values Into Memory- Compatible with Prostat Connect 2.0 for Downloading into Excel®- Charging and Download via Standard Micro USB Cable- Includes 5lb Conductive Probes and Carrying Case- Certificate of Calibration Traceable to NIST included- 2-year Limited Warranty on Main Instrument
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Transmission Line Pulse Testing
Transmission Line Pulse testing, or TLP testing, is a method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures. In the Transmission Line Pulse test, high current pulses are applied to the pin under test (PUT) at successively higher levels through a coaxial cable of specified length. The applied pulses are of a current amplitude and duration representative of the Human Body Model (HBM) event (or a Charged Device Model – CDM – event in the case of Very Fast TLP, or VF-TLP).
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PRODUCTS TESTING
ESD
MicroStat Laboratories -R.E.T.S.
Our ESD test capabilities include resistance, resistivity, electrostatic shielding, charge generation, and charge dissipation. We routinely test flooring materials, packaging, footwear, garments, ionizers and many other ESD control products and materials. We utilize the relevant test methods and standards of the ESD Association, ANSI, ASTM, NFPA, IEST, IEC, AATCC, or our clients’ in-house specifications.
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Digital/Analog Audit Kit
Botron's Digital/Analog Audit Kit insulation and continuity tester is designed for electrical testing. The wide range of test voltages makes the Audit Kit ideal for users involved with ESD testing. The kit gives greater functionality with simplified operation and an ergonomically designed case.
