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Discrete Component Testers
check connected individual semiconductor components.
- CAMI Research Inc.
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Guided Assembly | Cable Harness Testers
Autobuild™ Software
Our optional, add-on AutoBuild™ software (Item 728) offers Guided Assembly for cables and wire harnesses. Use a supplied probe, or a finger with wrist strap, to touch an unterminated wire and the software shows (and says) exactly where the wire should be connected. As the operator attaches each new wire, AutoBuild checks the entire assembly and provides a clear checklist showing all completed good connections. When using our resistance-capable testers, you may connect diodes and resistors by name and value, check resistance values over the tester's specified range, and test conduction and isolation resistance against specified thresholds. Programmable tones accompany the graphic screen to give clear signals to the operator when good connections are completed or when incorrect connections, resistance violations, or diode insertions are detected. Combine with our Light Director™ option for light-guided assembly.
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Benchtop Discrete Component Tester
Imapact 7BT
The 7BT Benchtop Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The 7BT automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability.
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The Lorlin© Impact Series
Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The automatic test system can be used in all test applications including incoming inspection, wafer probe, QC, engineering, production, final test, and high reliability. The system tests most all discrete semiconductors with reliable, accurate, and repeatable results.
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Analogue IC Tester
SYSTEM 8 (AICT)
The SYSTEM 8 Analogue IC Tester is the answer to testing analogue devices. The key feature of the AICT is its ability to functionally test all common analogue ICs and discrete devices in circuit. It is also capable of testing all types of analogue and digital components by means of the well-known, power off V-I test technique. For users requiring only the latter function, please select the Analogue Test Station section.
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Impact Series Power Discrete Semiconductor Tester
The Impact Series Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.
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Bit Error Rate Tester - MATRIQ
The BERT is 2 or 4-channel PPG and Error Detector for the design, characterization and production of optical transceivers and opto-electrical components at data rates up to 30 Gb/s.With scalability and exceptional signal fidelity, it is a cost effective test solution for 400 Gb/s communication eco-systems.
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Bit Error Rate Tester - PXI
BERT 1001/1005 Series
The BERT is 2 or 4-channel PPG and Error Detector for the design, characterization and production of optical transceivers and opto-electrical components at data rates up to 30 Gb/s.With scalability and exceptional signal fidelity, it is a cost effective test solution for 400 Gb/s communication eco-systems.
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Passive Component Integration
Integrate passive optical components of your choice such as WDM couplers, splitters, band-pass filters, PM beamsplitters and circulators. PXIe and benchtop models support SMF, MMF and PMF.
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MTM-Bus Tester
PXIe-1149.5
The Corelis PXIe-1149.5 is a versatile, multi-mode instrument for interfacing with MTM-Bus modules. The PXIe-1149.5 adds MTM-Bus master, slave, and monitoring with full IEEE-1149.5 electrical and protocol compatibility with a standard PXIe interface for convenient integration into any Test Program Set (TPS).
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PXI Vector Component Analyzer, 100 kHz to 44 GHz
M9817AS
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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Passive Component Integration - MATRIQ
The Passive is a highly customizable benchtop accessory that can integrate the passive components of your choice for convenient storage and integration into your test set up.We can customize the Passive module with a wide range of passive components: WDM couplers, splitters, circulators, band-pass filters, PM beamsplitters, MUX, DeMUX and more.Our spec sheet contains a selection of popular configurations.Please contact us to discuss your specific requirements at sales@quantifiphotonics.com.
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PXI Vector Component Analyzer, 100 kHz to 53 GHz
M9818AS
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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PAM4 Bit Error Rate Tester.
BERT-1102
The BERT-1102 is a 4 or 8-channel PPG and Error Detector for the design, characterization and manufacturing test of optical transceivers and opto-electrical components with symbol rates up to 29 GBaud/s in both NRZ and PAM4 formats. With scalability and exceptional signal fidelity, it is a cost-effective test solution for up to 400 Gb/s communication eco-systems.
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Passive Component Integration - PXIe
Passive Series
The Passive PXIe module is a highly customizable PXIe module that can integrate the passive components of your choice.We can customize the Passive module with a wide range of passive components: WDM couplers, splitters, circulators, band-pass filters, PM beamsplitters, MUX, DeMUX and more.Our spec sheet contains a selection of popular configurations.Please contact us to discuss your specific requirements at sales@quantifiphotonics.com.
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ABex PXI to Analog Bus Bridge with Digital IOs
ABex AM-300 Controller
The ABex system controller ABex AM-300 is required to control the analog bus of a ABex chassis. It is used as an interconnection bridge between PXI and ABex backplane.In addition it features a whole bunch of additional functionality. Despite the 96 open drain outputs it has galvanically isolated IOs, and communication interfaces.
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KVS Rugged Igniter Tester With Current Monitor
4314
The Valhalla Scientific Model 4314 KVS Digital Igniter Tester is designed to provide extremely safe and reliable resistance testing of explosive or volatile devices. Proven uses include fuses, squibs, igniters, explosive bolts, automobile airbag initiators and many others.
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PXI Vector Component Analyzer, 100 kHz to 26.5 GHz
M9815AS
The PXI vector component analyzer (VCA) enables complex multiport device characterization with continuous wave (CW) and modulated signal measurements.
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Component Testers
After a wafer is tested through front-end test and back-end test, the component tester tests this final component or package assuring its quality for the semiconductor makers. DDR, DDR2, DDR3 memory component testers.
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Lightening Protection Components Tester
FC-2GB / 465
Wuhan Huatian Electric Power Automation Co., Ltd.
Suitable for testing zinc oxide arresters (varistor), cermet two, three-electrode discharge tubes and other overvoltage protection components.
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Single Head Component Testers
34XX
Performs DC, AC, and pulsed tests. Excels at evaluating difficult to measure parameters on zeners, current limiters, varactor tuning diodes, darlingtons and matched dual transistors. 24 bin opto-isolated handler/prober interface. Parallel first-in first out computer to tester interface for maximum throughput. Parallel testing with a 3402E or 3403E allows shared test execution for extremely high throughput applications when interfaced to high speed handlers with multiple test sites.
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Component Testers
Unlike other handheld instruments such as LCR meters that make measurements using an AC signal with a specific test frequency, the 830C measures capacitance by applying a constant current that briefly charges, then discharges the connected capacitor.
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Automotive Power Discretes
ST offers a wide portfolio of automotive grade power discrete devices for reliable, robust and power-efficient automotive applications.
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Control Components
From power supplies to counters to temperature controllers, we have all needed components for a successful and complete automation solution.
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Passive Components
VDI offers a wide variety of waveguide sections, tapers, antennae, and bends for your application. Please note that external dimensions are subject to change.
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Active Components
MUD frequency doublers featuring Millitech technology are balanced resistive-mode multipliers covering full waveguide bands. Power flatness for a given input power level for these units is typically ± 2.0 dB across the band.
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Discrete Devices Test
FTI 1000
The FTI 1000 tester consists of independent test channels that allow all DC and AC MOSFET parameters to be tested either separately, or in one handler insertion or prober touch-down.
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Electrical Components
Electrical components contain the accessories you need to work with your Omega sensors and devices. These include things like terminal blocks, connectors, switches, transformers, and others.
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Automated Coherent Receiver Tester
CoRx Tester.
Quantifi Photonics’ CoRx Tester provides automated measurement of key coherent receiver performance parameters. The CoRx Tester is comprised of a pre-configured PXI chassis, a two-channel tunable laser, a polarization controller, and a two-channel Variable Optical Attenuator (VOA) with built-in power meter. Just connect the two optical outputs to your Integrated Coherent Receiver (ICR), connect your ICR to the oscilloscope and let the CoRx Tester software do all the rest.
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Electronic Component Counter
ZE 300
REINHARDT System- und Messelectronic GmbH
Instead of the widely used photoelectric barrier technology a new measuring technology is used in the new electronic component counter ZE 300: The laser technology offers a measuring beam with higher energy density and therefore more precise counting and faster counting speed. The ZE 300 component counter is microprocessor-controlled.
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Passive Component ATS
Test and packing speeds from 80ppm to1,800ppmStandard functions - Inductance/quality factor test - Winding resistance test - Polarity testOptional functions - Layer short test - Insulation resistance test - Bias current testCircular vibrating plate design feeds inductors steadily and rapidlyIndex disc design eliminates dropped inductorsFour-wire measurement test socket designAutomatic discharge mechanism when feeding errors occurEach test station has an independent NG (No Good) product collection boxTest without packaging function provided, good products gathered in bulk collection boxExclusive data collection software designed for monitoring product quality in real timeReserved stations for number spraying and automatic optical inspectionSwitchable Chinese/English/Japanese operating interfaceEquipment is fast, stable and safe
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System Components
For demanding computational tasks, Rohde & Schwarz offers the versatile, flexible equipment you need for everyday use – from the system controller and switch unit to the test chamber. All feature excellent EMC shielding, reliable test results and modular solutions.
