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- Pickering Interfaces Inc.
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Mass Interconnect
Mass Interconnect is a mechanical interface that simplifies connection between the power supplies, instruments and switching to the Device Under Test (DUT) in a test environment. In the illustration here, a test receiver is connected to the front of the modular instrumentation, in this case, a PXI chassis.
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Hand-In Type Electromagnetic Anechoic Box (Shield Box)
MY3720
Suitable for weak electric field resistance test, out-of-service test or digital forensics for smart phone, tablet terminal or mobile PC ! !DUT can be operated directly with bare hands while placing it in the box and looking at the inside from the shield window.
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Single connector for a HG cable, and two HM connectors
MVNA-8-350-2
The lower part of the Central Unit model MP-8-350-2 has a single connector for a HG cable, and two HM connectors (Fig. 9). Two Harmonic Mixers can work simultaneously, for instance HM2 detecting transmission through the DUT, and HM1, at port 3 of a directional coupler, detecting reflection from the DUT.
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Custom Pogo Pin Rings & Blocks
Reduce your cost-of-test with our pogo pin blocks and interfaces that transform complex DUT boards or breakout boards into universal motherboard-style interfaces. Eliminate the need to purchase or build a new board for every unique device, unit, or package.
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4 x 8 Two-Wire Matrix Module for 34970A/34972A
34904A
The Keysight 34904A module for the 34970A/34972A Data Acquisition/Switch Unit gives you the most flexible connection path between your device under test and your test equipment, allowing different instruments to be connected to multiple points on your DUT at the same time. Rows or columns may be connected between multiple modules to build 8 x 8, 4 x 16 or larger matrices, with up to 96 crosspoints in a single frame.
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Scalar Network Analyzer Extenders
A Scalar Network Analyzer is a type of RF network analyzer that is used to measure only the amplitude properties of a DUT (Device Under Test). Unlike a Vector network Analyzer, it does not measure both amplitude and phase of the DUT.
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Signal Analyzer
bsw TestSystems & Consulting AG
The simplest way to measure the phase noise is to compare the Device-Under-Test (DUT) to the source of a spectrum analyzer. With the SA set at the same frequency as the OUT, you see the sum of the SA's and DUT's sideband-power spectrum on the SA display. It is a simple and straight forward method well suited for free running VCO's where the SA is easily an order better.You can improve on this method by establishing a Phase Lock (PLL) between the DUT and the Local Oscillator and create a zero-IF or base-band spectrum analyzer system.
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Exchangeable Cassette Kit for 6TL36 Faraday Chamber
AN134
Exchangeable plates for RF applications. (Use with RF Kit, P/N AN133)).DUT maximum dimensions: 340 x 350mm
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iSocketTM - High Power DUT - HTOL System
8000 Series
iSocketTM Technology Open Rack-Room Temperature (RTBI) non chamber design High Power DUT Capability – 0-65W Individual DUT Temperature Measurement & Control DUT Monitoring with Auto shut down 28 BIB capacity – 14 trays 2 BIB’s per tray Multi DUT type HTOL Testing Remote System & HTOL Monitoring – Customer access via VPN
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Wireless Measurement System for ETSI & FCC Devices for ISM Bands
TS8997
The R&S®OSP-B157W8 PLUS 7.5 GHz module with up to eight channels is the core of the system and uses a printed RF switch board in solid-state relay (SSR) architecture. It allows flexible operation of the connected DUT (up to eight ports) for power measurements, signal conditioning via the integrated attenuators, couplers and combiners, RF switching to the measuring instruments in combination with the R&S®OSP-B157WX up to 40 GHz and is controlled by R&S®WMS32 software.
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HV Test System for Patient Monitors
HV test enclosure for testing medical products (patient monitors). Insulated test booth with large space for DUT.3 different test nests for adapting different devices.Displays from patient monitors are checked. For this, insulation tests and leakage current measurements must be carried out. Ensuring the standard-compliant test. For the safety of the operating personnel, the test cell is electrically locked while the high voltage measurement is active.
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High Temperature Operating Life
7000 Series
With ever decreasing geometries, the way we perform HTOL requires careful consideration. In lower geometry device leakage currents are not only higher but vary greatly. Temperature control at DUT level – required to achieve correct junction temperature at every DUT. For higher geometries, HTOL can be performed in a more traditional way but with devices consuming more power, the ambient temperatures required varies greatly. Multiple temperature zones are required – multi zones system or multiple smaller HTOL systems.
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High Performance Autoranging DC Power Module, 50V, 5A, 50W
N6751A
The Keysight N6751A is a 50 W high-performance, autoranging DC power module that provides low noise, high accuracy and programming speeds that are up to 10 to 50 times faster than other programmable power supplies. Optional high-speed test extension offers an oscilloscope-like digitizer that increases measurement accuracy when viewing high-speed transient or pulse events within the device-under-test (DUT).
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High Current SMU Family 250 A
AXC757x
Generate extremely short, fully regulated current pulses from 300 µs up to 250 A. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.
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Automatic Calibration Module
ACM4509
ACM4509 is an automatic calibration module that can be used with all CMT Vector Network Analyzers operating in frequency range up to 9 GHz. It is a fully automatic USB-controlled and powered electronic calibration module. Minimizing the number of steps required by technicians reduces the risk of human error and expedites the calibration process. Automating the calibration routine also reduces wear and tear on the analyzer and RF cables. To perform full four-port calibration, each end of the ACM need only be connected to the analyzer once, as opposed to 18 connections with a traditional calibration. The ACM also contains a factory characterized 20dB in-line attenuator which acts as a simulated device under test (DUT). The confidence check feature loads the factory stored DUT into memory so proper calibration can be verified.
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Functional Test
UTS
The UTS functional test system is perfect for electronics manufacturing operations that have a mix of products where operators load and unload devices under test (DUT) and routinely change out fixtures for each type of DUT.
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Scienlab Measurement And Control Module
SL1066B
The Measurement and Control Module SL1066B is a rack-mount measuring and control module that provides adjustable voltage outputs for BMS and DUT power supply and floating relay contacts to simulate e.g. vehicle specific terminals 15, 30 and 31.
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Ground Continuity Test Instrument
MODEL M25
Performs ground continuity tests in full compliance with BSI, VDE and IEC. Measures AC resistance from Chassis of Device Under Test (DUT) to power-cord ground lead - 0 to 0.15 ohm
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Vibration Shakers
Vibration Shakers and Modal ExcitersFull range of modal and inertial shakers with integrated and easy-to-use amplifiers. Our permanent magnet shakers are compact, lightweight, and powerful general-purpose shakers that can be used for modal and vibration testing. They have a high DUT capacity despite their small sizes.
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DC Power Module, 35V, 3A, 105W
N6744B
The Keysight N6744B is a 105 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
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Flexible Cable, 3.5 Mm (Test Port) To 3.5 Mm
85131E
Achieve phase stability with this 96.5-cm cable when a DUT is connected, with adapter, directly to the test set port
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PXIe-4112, 2-Channel, 60 V, 1 A PXI Programmable Power Supply
782857-01
The PXIe‑4112 is a programmable DC power supply with isolated outputs. It helps simplify the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and component test—by eliminating the need to mix multiple instrumentation form factors in a given test rack. It also has standard output disconnect functionality that allows isolation from the device under test (DUT) when not in use, and remote sense to correct for losses in system wiring.
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DC Power Module, 8 V, 6.25 A, 50 W
N6732B
The Keysight N6732B 50 W basic DC power module provides programmable voltage and current, as well as measurement and protection features at a very economical price. Use this module to power your DUT or ATE system resources, such as fixture control.
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Optical Spectrum Analyzer Module
OSAPXIe
OSAPXIe enables new measurement capabilities in PXI for truly effective mixed-signal testing. Conduct all your DUT characterization from one platform and spend less time switching cables and patchcords between instruments.
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Power Module, 100V, 3A, 300W
N6776A
The Keysight N6776A is a 300 W basic DC power module that provides programmable voltage and current, measurement and protection features at a very economical price, making these modules suitable to power the DUT or to provide power for ATE system resources such as fixture control.
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Vibration Unit Tester
BK2020B
We developed the BK2020B as an upgrade to our BK2020 to test the electrical specifications (RPM, current, drop pulse, start up voltage) of your cylindrical or coin type vibration units. You can also test vibration level, noise, isolation resistance, and the DC resistance. The DUT power supply and all measurement components are self contained, so external devices aren't needed and the tester uses DSP, making it capable of fast, highly accurate and reliable measurements. The BK2020B is very versatile. It can be set up as a stand alone machine, or used with a PC and software for access to more information, and to save the data for analysis. Either version is great on the product line but you may also use it for QA, QC and development.
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High Current SMU Family 500 A
AXC755x
Generate extremely short, fully regulated current pulses from 300 µs up to 500 A. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.
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Bidirectional DC Power Supply + Regenerative Load
62000D
Chroma Systems Solutions, Inc.
Chroma 62000D programmable bidirectional DC power supplies have both power source and load characteristics, two quadrant operation, and allows feedback of the power from the DUT. They can be used for testing renewable energy power systems including PV/storage hybrid inverters, power conversion system (PCS) on charging/discharging, and as a battery simulator. The 62000D also is a fit for testing power components used in electric vehicles, such as bidirectional on-board chargers (BOBC), bidirectional DC convertors, and DC-AC motor drivers, and power conversion simulation tests of batteries in both directions.
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Memory Test Software
Teradyne’s customers count on us for our Near Device Under Test (DUT) technology that gives memory device manufacturers a guaranteed performance advantage. A brief description of dynamic memory and storage memory devices will highlight why device manufacturers depend on Teradyne’s memory test solutions.
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Arbitrary Load Control For Modulation Distortion
S94570B
Extend the modulation distortion application by computing figure of merits such as EVM and ACPR for any desired load with arbitrary load control (ALC). Modulation distortion with ALC integrates the powerful capabilities of the PNA-X with an electromechanical tuner so a non-50 Ω load can be presented to the DUT and changes in device performance or sensitivity to varying load conditions can be accurately measured.
