Filter Results By:
Products
Applications
Manufacturers
Crash Test
vehicle or app submission to momentous forces to assure their viability.
- Applied Instruments, Inc.
product
Forward Path NPRT 2200 Noise Power Ratio Test Set
NPRT 2200-F
The NPRT 2200 measures the NPR of a device across a range of power levels. This test quantifies intermodulation distortion and determines the dynamic range of optical transmitters, amplifiers and other active HFC network devices. The included PC software uses predefined test setups to run a "Power Sweep" series of NPR measurements and graph the results.
-
product
Laboratory Centrifuges
Centrifuge systems are designed for the development, test, evaluation and calibration of accelerometers and a variety of inertial devices. Centrifuges provide a cost-effective solution for simulating high-"G" environments in the laboratory. They support testing of devices such as MEMS-based Inertial Measurement Units (IMUs), low-cost quartz or silicon sensors, Ring Laser Gyros (RLGs), Fiber-Optic Gyros (FOGs), fuzes and crash sensors.
-
product
Acceleration Testing
The acceleration test is performed on a centrifuge to assure that material can structurally withstand the steady state inertia loads that are induced by platform acceleration, deceleration, and maneuver in the service environment, and can function without degradation during and following exposure to these forces. Acceleration tests are also used to assure that material does not become hazardous after exposure to crash loads. The acceleration test method is applicable to material that is installed in mobile platforms such as aircraft, helicopters, aerospace vehicles, air-carried stores, ground-launched missiles, trains, ships, automotive vehicles, etc.
-
product
Slow Motion Cameras
Whether it’s needed in the laboratory, at external sites or for crash tests, you can expect high performance every time, every place and everywhere from Optronis’ slow motion cameras of CamRecord-CR and CamRecord-Sprinter series. The systems are particularly easy to operate. The high level of light sensitivity of these cameras gives you a clear view of your subject, even in poor light conditions.
-
product
Probe Card
Tile-on-Card™
Celadon’s uniquely robust and repairable patented probe-in-ceramic crash resistant probe cards reduce maintenance headaches while increasing tester utilization. Celadon’s TOC™ probe cards are known for achieving 10 million+ touch downs before rebuild on test floors worldwide.
-
product
MPI SiPH Probe Systems
MPI Advanced Semiconductor Test
MPI designed dedicated SiPH upgrades for its well known 200 and 300 mm probe systems, which includes:*Various options of high-precision fiber alignment systems for ultra-fast scanning routines*Multiple measurement capabilities for O-O, O-E, E-O and E-E device configuration*Integrated Z-sensing for detecting the fiber to wafer contact point*Crash protection when using two optical fiber arms*Wide temperature range from -50°C to 200°C*Optional dark box for testing in light tight environment*Extensive software package for supporting easy integration to operator’s test executive*Probe system compatibility: TS2000-IFE, TS2000-SE, TS3000, TS3000-SE, TS3500 and TS3500-SE
-
product
CrashSim
The application software CrashSim is used for the preparation, execution, monitoring, analysis and documentation of crash tests carried out on the Instron sled system. The user application focused software has been continuously improved in cooperation with our worldwide user groups.
-
product
Electrodynamic Shock Test System
FS SERIES
The system can test the sensor and ECU for an airbag and also reproduce the shock by assuming an automotive collision and full-scale crash. The system can be incorporated into the production line for total inspection. It can maintain the operating quality of the airbag to make a contribution to lifesaving against a traffic accident.
-
product
Rate & Inertia Sensors
TE Connectivity (TE) provides electronic test and measurement systems, such as inertial sensors, rate sensors, and rate gyroscopes for demanding industrial, military, aerospace, automotive crash testing, robotics, biomechanics, and more.
-
product
High-Speed Cameras
Excelitas pco.dimax cs high-speed cameras are specifically designed for harsh and demanding applications in car safety. With very high frame rates at a resolution of up to 4 megapixels, the pco.dimax cs camera series provide magnificent light sensitivity, leading image quality and excellent color rendering. Designed with a compact, lightweight and rugged design, these high-speed cameras are able to withstand harsh and demanding conditions such as crash tests for both on-board and off-board use.
-
product
Pneumatic Bump Test Machine
KRD20 series
The KRD20 series pneumatic bump test machine replaces the traditional mechanical cam-type crash bench and is suitable for repeated impacts on electronic components, equipment and other electrical and electronic products during transportation or working.
-
product
Crash Simulation Systems
The crash simulators are capable of reproducing a wide range of standardized and user-defined crash tests including advanced applications such as side impact and vehicle pitch simulation. Instron’s acceleration sled systems are used for the development and approval of vehicle safety systems, vehicle parts and also for the investigation of solids and structures during crash events.
-
product
Active Alignment Assembly & Test Platform
Quickly deliver flawless camera & LiDAR modules, MEMS devices, die based sensors, LED and laser-based headlights and other high-end products with a supremely accurate standardized platform.
-
product
Regenerative Battery Pack Test System
17040
Conforms to international standards for battery testing: IEC, ISO, UL, and GB/T, etc.Regenerative battery energy discharge (Eff. >90%, PF >0.95, I_THD <5%)Multiple voltage and current ranges for auto ranging function to provide optimum resolutionHigh accuracy current/voltage measurement (0.05%FS/0.02%FS)2ms current slew rate (-90% ~ 90%)Dynamic (current/power) driving profile simulation tests for NEDC, FUDS, HPPCTest channel parallel functionTest data analysis functionData recovery protection (after power failure)Automatic protection for error conditionBattery simulator (option)High power testing equipment- Voltage range : 80~1000V - Current range : 0~750A - Power range : 0~300kWCustomized integration functions- Integrated temperature chamber - BMS data analysis - Multi-channel voltage/temperature recording
-
product
Electronics Functional Test
Functional test for productive manufacturing. Manufacturers of products enabled by electronics must assure proper operation prior to shipment. Bloomy’s line of universal test systems are ideal for functional test of your PCBAs and subassemblies, from the simplest to the most complex. The UTS family of products combines high-performance test instruments, switching, power control and mass-interconnect hardware with our robust UTS software suite into a low-risk, cost-effective and powerful test solution for your device under test (DUT).
-
product
ESD Test System
58154 Series
ESD (Electrostatic Discharge) Test Systems are PXI/PCI controlled module to simulate electrostatic discharge pulse during electronic device testing. The 58154 series offer both ESD STM5.1-2001-Human Body Model and ESD STM5.2-1999-Machine Model. The user friendly software offers programmable and flexible features, such as sampling test on a wafer, ESD model, ESD pulse polarity, ESD pulse interval in a sequence, and automatic testing function.
-
product
Photonics Wafer Probing Test System
58635
The advancement of the photonics device technology continues to enable broader and more demanding applications in the industry.
-
product
6TL24 Combinational Base Test Platform
H71002400
The 6TL24 is the Base platform ideal for Combinational test (ICT+FCT) in low to mid volume, high-mix electronics productions. A dual-stage pushing mechanism will allow performing both, the FCT and the ICT test, without the need of changing the test platform and with a low cost fixturing technology. To do so, the exchangeable cassette fixture must be designed with two-level probes. IN the 6TL24, the second level is reached thanks to a pneumatic actuator.
-
product
OLED Lifetime Test System
58131
The 58131 Lifetime Test System is designed specifically for the OLED industry. Model 58131 provides twoquadrant constant current (CC) and constant voltage (CV) stimulus to each OLED panel and acquires electrical and optical characteristics automatically. Two independent and isolated precision source-and-measure units (PMU) are incorporated in one modular card, which is capable of testing two OLED panels. Additional instrument cards are added to expand test capacity. Hot plug and play is a key feature of 58131. When a UUT fails or an instrument card needs to be replaced, 58131 does not have to be shutdown and testing continues for other UUTs. Hot plug and play obviates life test cycle restarts due to isolated faults and significantly improves life test efficiency. We firmly believe that hot plug and play capability should be mandatory for all lifetime test systems.
-
product
Prototyping & Test Consulting Services Solutions
Don’t cut corners on the path to quality. We are experts in Design for Test (DFT), Design for Manufacturing (DFM), agile development, prototyping and standards/best practices in many industries. Speak to our prototyping and consulting services experts to ensure you make the right decisions and investments at the start of your project.
-
product
VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
-
product
RF Testing Platform for ATx05
AT118
The functional test of modern devices with wireless connectivity always requires RF isolated cameras, as the only way to have the parameters controlled and to guarantee operation under the specified conditions.
-
product
Functional Test Fixtures
Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. Whether for high-volume production or specialised testing, our fixtures provide robust, adaptable support to maintain efficiency and accuracy throughout the testing process. We also create, and work with Ingun to create fixtures using the Ingun kit.
-
product
6TL19 Off-Line Base Test Platform
H71001900
The 6TL19 is a bare half-rack with castors for creating Off-Line, modular, flexible and reliable Base test platforms. The overall rack capacity is 11U (580mm depth).
-
product
Test System Replication/Build-to-Print
Need to manufacture test stations? For more than 15 years we have sourced, assembled, tested and shipped fleets of robust, cost-effective solutions. We produce them at our high-volume facilities and deploy them around the world.
-
product
Communications Test System for Frontline Diagnostics
ATS3000P
The ATS3000P is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000P also includes the sophisticated IF and baseband I/Q DigitalSignal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easyto-use graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets are available for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
-
product
Test Instruments
Test instrumentation from COTS to custom, including VXI, PXI and LXI-based platforms.
-
product
VXI Digital Test Instrument
T940 Series
The T940 Series for the VXIbus provides the basis for a complete state-of-the-art digital solution at the subsystem level. The T940 is the solution for both legacy digital replacement and new test stations to be built for digital test including aircraft/ avionics, weapons systems, spacecraft, semiconductors and medical devices.
-
product
VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
-
product
Advanced SoC/Analog Test System
3650
Chroma 3650 is an SoC tester with high throughput and high parallel test capabilities to provide the most cost-effective solution for fabless, IDM and testing houses.
-
product
EFT Module for Teststand
The Electronics Functional Test (EFT) Module for TestStand provides out-of-the-box tools to speed up development of automated tests for electronic assemblies including PCBAs, subassemblies and final assemblies. Test engineers can develop, deploy and execute test sequences quickly and efficiently with minimal custom code development for a shorter time-to-solution.
