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- Grund Technical Solutions, Inc.
product
Manual Test Solution
Titan
Grund Technical Solutions, Inc.
Titan is an easy to use, low cost Human Body Model (HBM) or Machine Model (MM) manual test solution. It can be used for design, engineering, and characterization of your devices. Ranging from 50 V to 16,000 V the Titan will have the largest voltage range of any HBM tester.
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ENA Vector Network Analyzer
E5071C
9 kHz to 4.5/6.5/8.5/14/20 GHz2- or 4-port, 50 ohm, S-parameter test set Improve accuracy, yield and margins with wide dynamic range 130 dB, fast measurement speed 8 ms and excellent temperature stability 0.005 dB/CObtain design confidence through complete characterization of high-speed serial interconnects with enhanced time domain analysis option Protect your investment with upgradability across all of the options Every spec verified, adjustments included Lock in support & peak performance from the start
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Active Device Characterization Solution Up To 50 GHz For 5G
N5245BM
The N5245BM provides the N5245B 50 GHz PNA-X network analyzer, application software and accessories for active device characterization up to 50 GHz for 5G applications.
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PXIe-6548, 200 MHz, 32-Channel PXI Digital Waveform Instrument
781012-02
PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6548 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6548 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.
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ULTRA Test Cells
The ULTRA Series of high performance MEMS handling, stimulus and test cells provides unparalled flexibility and capability for engineering development, characterization or high volume production test of inertial MEMS (accelerometer, gyroscope) semiconductor devices.
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2-MGEM Optical Anisotropy Factor Measurement System
The 2-MGEM Optical Anisotropy Factor Measurement System is a normal-incidence polarization reflection microscope designed to measure the sample Mueller matrix and is a 2008 R&D 100 Award Winner. This system is designed specifically to evaluate the Optical Anisotropy Factor (OPTAF) of cross sections of TRISO nuclear fuel pyrocarbon layers. Other possible material characterizations include measuring Mueller matrix elements of other crystals, carbon compounds, and thin film coatings (e.g. surfacedeposition films) at normal incidence. The 2-MGEM can also measure retardation (d), circular diattenuation (CD) and the polarization factor (ß). These parameters are not measurable using older techniques, since those techniques do not incorporate a compensating optical element.
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Fast and Non-Contact Measurement Technology
VideometerSLS
Measure graininess, viscosity and mouth-feel in yoghurt and other viscous products – in only 2 seconds. VideometerSLS is a fast, and non-contact measurement technology packaged for ease-of-use in the laboratory or at-line in production. It measures a number of parameters for efficient characterization of viscous products. VideometerSLS has a combination of 2 measurement principles and on top Videometer's advanced imaging software:
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Gain-Compression Measurements
S96086B
The S96086B, gain compression measurements provides fast and accurate characterization of input power, output power, gain, and phase at the compression point of an amplifier, over a specified frequency and power range, with a simple setup
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Probes
D-COAX offers four analytical probe models: HyPac model for package characterization, and two models, Omni and OmniJet, for board level characterization, and DP1.4mm diffenrential, single-ended probe.
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Transceiver Driver
S-112
Transceiver Driver slot module of FOTS system is an efficient module for the characterization of SFP type transceiver and the test of optical line or components. This module is a kind of Small Form Factor Pluggable(SFP) host board that can be used to test SFP transceiver modules to define the modules’ performance. The transceiver driver slot has two SFP cage and 20-pin SFP connector sets to mount and control two SFP transceivers simultaneously.
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PXIe-4138, 60 V, 3 A System PXI Source Measure Unit
782856-01
±60 V, 3 A System PXI Source Measure Unit—The PXIe‑4138 system source measure unit (SMU) delivers high power, precision, and speed. It is ideal for a broad range of applications including manufacturing test; board-level test; lab characterization with devices such as integrated circuits (ICs), power management integrated circuits (PMICs), and radio frequency integrated circuits (RFICs); and discrete devices including LEDs and optical transceivers. The PXIe‑4138 features 4-quadrant operation. The PXIe‑4138 is a hardware-timed instrument with a high-speed sequencing engine for synchronizing acquisitions between multiple SMUs. The module supports direct DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument.
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Pattern Generator
S-113
The Pattern Generator slot module of FOTS system is an efficient module for the characterization and test of external optical components and systems to be performed in high bit rate. This module is a kind of pattern generator and bit error rate tester that can be used to modulate optical components or systems and to test the bit error rate characteristics of optical systems or optical lines. This pattern generator slot includes two differential Tx/Rx channels, which can be operated simultaneously.
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Chip Tester
TL2000
ficonTEC’s series of testing machines is focused on automated electro-optical characterization ofsemiconductor chips. The ficonTEC TL2000 is a fully automated test and inspection system for unmountedlaser diode bars, single chips and chips on submounts.
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Pulsed IV
AURIGA 4850
Auriga’s 4th generation pulsed IV/RF characterization system delivers unparalleled performance, capturing measurements with incredible speed and accuracy. Pulsed IV (current-voltage) measurements have emerged as the preferred method of capturing current-voltage characteristics of active devices such as field effect (FETs) and bipolar junction (BJTs) transistors. With the growing popularity of higher-power devices, like GaN HEMTs, LDMOS, SiC, and graphene, current and voltage requirements are constantly being pushed higher and higher.
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Laser Diffraction Systems
Since the release of the 7991 in 1974, the first commercially available particle size analyzer, Microtrac has been at the forefront of Laser Diffraction technology. By continuously improving the instrument technology, Microtrac offers customers a robust portfolio of Laser Diffraction instruments that’s ideal for particle sizing and characterization.
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PXIe Measurement Accelerator
M9451A
The M9451A PXIe Measurement Accelerator combined with Option DPD Digital Pre-Distortion & Envelope Tracking Gateware shows what is possible when you combine state of the art FPGA's with Keysight's trusted measurement expertise and PXIe's high speed data handling. As part of Keysight's RF PA/FEM Characterization & Test, Reference Solution, this combination provides unprecedented performance for demanding envelope tracking and digital pre-distortion measurements required for testing modern power amplifiers (PAs) and front-end modules (FEMs). Hardware acceleration provides better than 20x speed improvement over Keysight's previous host-based Reference Solution, with closed/open loop digital pre-distortion (DPD) and envelope tracking (ET) measurements taking just tens of milliseconds and overall measurement times less than 70 ms.
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Nanomechanical Test Instruments for Microscopes
Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
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PXI Vector Component Analyzer, 100 kHz to 53 GHz
M9818AS
The PXI vector component analyzer enables complex multiport device characterization with continuous wave and modulated signal measurements.
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Automotive Ethernet Test Fixture
AE6941A
The AE6941A automotive Ethernet electrical test fixture provides easy access to automotive Ethernet electrical signals so you can perform conformance testing and device characterization quickly and easily.
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Material Characterization Products
MeasureReady®
Unique real-time sampling architecture for synchronous sourcing and measuring.
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Oscilloscopes
Berkeley Nucleonics Corporation
Is a type of electronic test instrument that graphically displays varying voltages of one or more signals as a function of time. Their main purpose is capturing information on electrical signals for debugging, analysis, or characterization.
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WaveMaster 8000HD High Bandwidth Oscilloscopes
WaveMaster 8000HD Series
WaveMaster 8000HD is the only high speed oscilloscope designed for all stages of product development, whether first-silicon characterization, link validation over channels, or debugging across the entire the protocol stack. No other high speed oscilloscope supports more engineering tasks with more unique tools.
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kSA RateRat Pro
kSA RateRat Pro is a compact, convenient and easy-to-use optical metrology tool for thin-film characterization. Its unique capability is to measure, in situ and in real-time, optical constants (n and k), deposition rate and film thickness.
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ENA Vector Network Analyzer
E5072A
30 kHz to 4.5 GHz & 8.5 GHz2-portImprove accuracy, yield and margins with wide dynamic range 130 dB / 151 dB (direct receiver access), measurement speed 7 m sec and excellent temperature stability 0.005 dB/C Increase test flexibility with wide source power range -109 to +20 dBm for linear and nonlinear device characterization Protect your investment with upgradability across all of the options Every spec verified, adjustments included Lock in support & peak performance from the start
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Image Analyzers
Morphologi Range
Morphological imaging is fast becoming an essential technology in the laboratory toolkit for particle characterization. The Morphologi 4 is a fully automated static image analysis system which provides a complete detailed description of the morphological properties of particulate materials. The Morphologi 4-ID combines the same automated static image analysis with Raman spectroscopy in a single, integrated platform, providing component-specific morphological descriptions of chemical species within a blend.
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Instruments
Advanced Thermal Solutions, Inc.
ATS designs and fabricates the most extensive line of thermal test instruments specifically designed for the electronics industry. These research-quality, state-of-the-art instruments include Pressure, Temperature and Velocity Measurement Systems, Airflow and Heat Flux Controllers, Micron-level Thermography Systems and Cold-Plate Thermal Characterization Systems.
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Spectroscopic Ellipsometry
Spectroscopic ellipsometry is a surface-sensitive, non-destructive, non-intrusive optical technique widely used for thin layers and surface characterization. It is based simply on the change in the polarization state of light as it is reflected obliquely from a thin film sample. Depending on the type of material, spectroscopic ellipsometers can measure thickness from a few Å to tens of microns. It is also an excellent technique for multi-layers measurement.
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Physisorption & Chemisorption
ASAP 2020 Plus
The ASAP 2020 Plus permits one instrument to accommodate almost any surface characterization need in your lab.
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RCS Software
CEMExpert
CEMExpert is a software dedicated to the prediction of radar cross-section of aerial and naval targets. The software uses both the high-frequency asymptotic method (PO-PTD) as well as the full-wave equation solver (FVTD). A quick calculation is made possible by automated meshing, scripts for azimuthal scan and parallel processing. The software has been used for improving stealth performance of UAVs, for shape optimization of naval ships and RCS characterization of target missiles.
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Optical Modulation Analyzer and High-speed Digitizer Test Solution
M8290A
The M8290A is a flexible solution platform for 400G coherent component and transmitter test. It incorporates a 92 GSa/s modular optical modulation analyzer and a 92 GSa/s 4-channel electrical digitizer. Besides these modules an additional arbitrary waveform generator module up to 92 GSa/s, such as the M8196A, can be added to the same AXIe chassis. This setup results in a compact and flexible coherent test solution that can be used together with additional specialized solution software for Integrated Coherent Receiver (ICR) and Analog Coherent Optical (ACO) module characterization.
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FT-NIR Analyzer
ASP400 series
The TALYS ASP400 series analyzer is designed to achieve monitoring and control of continuous processes. Its seamless installation enables real-time process monitoring, determination of stream properties or physical qualities, process characterization and early troubleshooting. This analyzer is suitable for a wide range of refinery process monitoring applications including naphtha conversion units such as catalytic reforming, isomerization, naphtha hydro-treating and steam-cracking as well as applications in HF alkylation, gasoline blending and LPG.
