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- Taylor Dynamometer, Inc.
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500 HP Complete Bench Hydraulic Test Center With High Flow Supply
HTC-500-HFS
The Hydraulic Test Center (HTC) is a versatile machine designed to test heavy-duty, off-highway hydraulic components. The 500 hp (373 kW) HTC Complete Bench is for the dealer that services components from a predominately larger machine size mix such as large mining machines and large excavators. The Complete Bench offers full functionality to test all types of pumps and motors including: transmissions, hydraulic motors, hydraulic cylinders, valve blocks, torque converters, open and closed loop pumps.
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PXIe-1092, 10-Slot (7 Hybrid Slots, 1 PXI Express System Timing Slot, 1 Peripheral Expansion Slot), Up to 24 GB/s PXI Chassis
786991-01
PXIe, 10-Slot (7 Hybrid Slots, 1 PXI Express System Timing Slot, 1 Peripheral Expansion Slot), Up to 24 GB/s PXI Chassis - The PXIe-1092 features a high-bandwidth backplane and up to 82 W of power and cooling in every slot to meet a wide range of high-performance test and measurement application requirements. The all-hybrid backplane enables excellent flexibility for instrumentation module placement by accepting PXI Express modules in every slot and PXI hybrid-compatible modules in up to seven slots. It also offers a Timing and Synchronization option that includes a built-in oven-controlled crystal oscillator (OCXO) for increased clock accuracy and external clock and trigger routing. The chassis includes a peripheral expansion slot in Slot 10 to provide power only for multiple-slot wide modules.
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Pulse Pattern Generator, 3.35 GHz, dual-channel
81134A
When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. On top of that, it allows to generate application-specific signal levels like pre- and de-emphasis (PCI Express) or squelch (Serial ATA). The Keysight 81134A lets you test your DUT instead of the pulse or data source!
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Backplane & Cable Test
Backplane and cable test systems from Terotest include LINX, a fixtureless test system. Each LINX test card plugs directly into the unit under test, which removes the necessity for long test cables and fixtures. This is called distributed testing and results in dramatically lowered costs. LINX is extremely easy to use, with a self-learn function or input from CAD.
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Backplane Test System
402HV
Our model 402HV is the result of 25 years of high voltage / high pin count test systems experience. We produced our first high voltage system back in 1985. It was programmable up to 600 volts / 600 Mohms and had over 49,000 test points. It could test a 5k point board in less that 15 seconds. Since then we have built hundreds of high voltage test systems, with our highest voltage system capable of testing up to 2000 Volts DC / 1500 Volts AC. (One of our 600 volt systems, built in 1986 is still in operation testing boards for a defense contractor.)
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PXIe-1095, 18-Slot, Up to 24 GB/s PXI Chassis
783882-01
PXIe, 18-Slot, Up to 24 GB/s PXI Chassis—The PXIe-1095 features a high-bandwidth backplane and 58 W of power and cooling in every slot to meet a wide range of high-performance test and measurement application needs. The chassis incorporates two hot-swappable power supplies to improve the mean time to repair (MTTR) of the PXI system; it also offers an optional timing and synchronization upgrade that includes a built-in oven-controlled crystal oscillator (OCXO) for increased clock accuracy and external clock and trigger routing. It accepts PXI Express modules in every slot and supports standard PXI hybrid-compatible modules in up to five slots.
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PCI To Star Fabric Module
51-921A-001
The use of the StarFabric interface operating at 2.5Gb/s minimizes the impact on system speed. The PCI interface of the 51-921A supports both 32 bit and 64 bit operation and backplane speeds of 33MHz and 66MHz, ensuring the highest speed operation under all conditions. The StarFabric interface ensures the modules perform seamlessly with no impact on the test system software.
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PXIe-1088, 9-Slot (8 Hybrid Slots), Up to 8 GB/s PXI Chassis
784782-01
PXIe, 9-Slot (8 Hybrid Slots), Up to 8 GB/s PXI Chassis - The PXIe-1088 features an all-hybrid backplane to meet a wide range of high-performance test and measurement application needs. The hybrid connector type in every peripheral slot enables the most flexibility in terms of instrumentation module placement.
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PXIe-1084, 18-Slot (17 Hybrid Slots), Up to 4 GB/s PXI Chassis
786397-01
PXIe, 18-Slot (17 Hybrid Slots), Up to 4 GB/s PXI Chassis - The PXIe-1084 features an all-hybrid backplane to meet a wide range of high-performance test and measurement application needs. It also offers a Timing and Synchronization option that includes external clock and trigger routing. The hybrid connector type in every peripheral slot enables the most flexibility in terms of instrumentation module placement.
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6U cPCI / PXI / PXIe 6021 Full Size Chassis
The WIENER 6021 crate series can be outfitted with cPCI, PXI or PXIe backplanes to provide high performance chassis with highly reliable low-noise power supplies for these bus standards. Typical applications are data acquisition, beam line control and test instrumentation.
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PCI Express 4.0 Test Platform
The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.
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PXIe-1062Q, 8-Slot, Quiet, Up to 3 GB/s PXI Chassis
779633-01
8-Slot, Quiet, Up to 3 GB/s PXI Chassis—The PXIe‑1062Q is designed for a wide range of test and measurement applications and provides a high-bandwidth backplane. The NI PXIe‑1062Q has four PXI peripheral slots, one PXI Express slot with system timing capabilities, and two PXI Express hybrid slots that accept both PXI and PXI Express peripheral modules.
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3U VPX Development Kit
This development kit enables efficient 3U VPX backplane design and software verification.- 3U VPX architecture- One CPU blade, one GPU blade (optional), SOSA-aligned- 1TB NVMe pre-installed in CPU blade- Rear transition module(s) included- Test Frame with backplane pre-installed
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PXIe-1065, 18-Slot (9 PXI Slots, 3 PXIe Slots), Up to 3 GB/s PXI Chassis
779730-01
PXIe, 18-Slot (9 PXI Slots, 3 PXIe Slots), Up to 3 GB/s PXI Chassis—The PXIe‑1065 is designed for a wide range of test and measurement applications and provides a high-bandwidth backplane. The NI PXIe‑1065 has nine PXI peripheral slots, one PXI Express slot with system timing capabilities, three PXI Express slots, and four hybrid slots that accept both PXI and PXI Express peripheral modules.
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PCI Express, PCI, Multi-Interface Test Backplanes
Amfeltec PCI Express, PCI, Multi-Interface Test Backplanes
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Backplane Profiling & Inspection System
603d
A major problem in the backplane industry is detecting bent connector pin defects. The most difficult being when the pin bends underneath the shroud rather than going into the hole. Many times this defect cannot be detected electrically as the connector pin is touching the conductive annular ring of the hole, allowing electrical test to pass. Unfortunately, it is an intermittent connection and will fail later on as there is not an actual mechanical connection.
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PXIe-1071, 4-Slot, Up to 3 GB/s PXI Chassis
781368-01
PXIe, 4-Slot, Up to 3 GB/s PXI Chassis—The PXIe‑1071 is designed for a wide range of test and measurement applications and provides a high-bandwidth backplane. Its compact and lightweight form factor is ideal for minimizing the footprint of your installation, making it ideal for desktop or portable use cases. The PXIe‑1071 accepts PXI Express modules or standard PXI hybrid-compatible modules in every peripheral slot.
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PCI Express 3.0 Test Platform with SMBus Support
The Summit Z3-16 Test Platform with SMBus Support allows the Summit Z3-16 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen3, Gen2 or Gen1 hosts and devices. In addition, it supports the Summit Z3-16 with SMBus Support by providing SMBus tapping connectivity.
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3U / 6U PXIe Chassis
The GX7100e Series are 14-slot combination PXIe chassis that accommodate a 3U PXIe embedded controller or a MXI express controller as well as 3U & 6U PXI / PXIe insruments in 4U of rack space. The GX7100e’s unique format includes seven 6U slots and seven 3U slots arranged horizontally to reduce the overall size of the chassis, providing the versatility and high-density necessary to address many PXI / PXIe applications and requirements. The backplane architecture supports Gen 2, 4x4 PCI Express bus signaling and the use of both x1 or x4 system controllers. By offering a combination of PXI-1, Hybrid, and Express slots, the GX7100e offers users the ultimate in flexibility for general purpose as well as high bandwidth test needs.
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PCI Express 5.0 Test Platform
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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PCIe 2.0 Test Platform
PXP-100B
The Teledyne LeCroy PXP-100B Test Platform provides a convenient means for testing PCIe 2.0 add-in cards with a self-contained portable and powered passive backplane. The PXP-100B provides power required for both cards under test, and an interposer can be used for connection to a protocol analyzer. As an alternative to an interposer, the PXP-100B includes two mid-bus probe footprints to allow connection to an analyzer via a mid-bus probe.
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Backplane Test System
402LV
Very High Pin Count Level IV Backplane Test System. To ensure that Testronics maintains its leadership position as the premier supplier of backplane testers, we will be introducing our solution to testing high pin count / very large backplanes, the Model 402.
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Tx/Rx SignalBlade
This ATCA compatible test card offers the flexibility to verify the performance of Advanced TCA fabric and base channels. The set of four Transmit pairs and four Receive pairs allows access to a full channel's eight pairs for backplane path characterization. The card includes a HM-ZD connector segment for access to the backplane and edge-launch SMA connectors for ease of test cable attachment. DC blocking capacitors are included on the receive pairs as required by Advanced TCA.
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VME Load Card
WIENER VME load boards are designed to test VME crate power supplies and fan trays by drawing power from the VME backplane and dissipating it as heat. A series of switches on the module front panel allows for easy adjustment of the current draw for each voltage channel.
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PXIe-1092, 10-Slot (7 Hybrid Slots, 1 PXI Express System Timing Slot, 1 Peripheral Expansion Slot), Up to 24 GB/s PXI Chassis
784781-01
PXIe, 10-Slot (7 Hybrid Slots, 1 PXI Express System Timing Slot, 1 Peripheral Expansion Slot), Up to 24 GB/s PXI Chassis - The PXIe-1092 features a high-bandwidth backplane and up to 82 W of power and cooling in every slot to meet a wide range of high-performance test and … measurement application requirements. The all-hybrid backplane enables excellent flexibility for instrumentation module placement by accepting PXI Express modules in every slot and PXI hybrid-compatible modules in up to seven slots. It also offers a Timing and Synchronization option that includes a built-in oven-controlled crystal oscillator (OCXO) for increased clock accuracy and external clock and trigger routing. The chassis includes a peripheral expansion slot in Slot 10 to provide power only for multiple-slot wide modules.
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Multi-Interface Test Backplane
SKU-047-01
The Multi-Interface Test Backplane was designed to support hardware and software designers who need to be able to plug in boards with different interfaces (into the host computer).
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PXIe-1084, 18-Slot (17 Hybrid Slots), Up to 4 GB/s PXI Chassis
784058-01
PXIe, 18-Slot (17 Hybrid Slots), Up to 4 GB/s PXI Chassis—The PXIe-1084 features an all-hybrid backplane to meet a wide range of high-performance test and measurement application needs. The hybrid connector type in every peripheral slot enables the most flexibility in terms of instrumentation module placement.
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Open Test Platform for High Performance Automotive Applications
TSVP
The R&S®TSVP family of products is an open test platform from Rohde & Schwarz ideal for high performance automated test equipment (ATE) applications. The chassis contains a mechanical frame, digital backplane, analog backplane, mains switching and filtering, power supply and diagnostic extensions. A highlight is the analog bus for routing measurement signals between different slots without additional external wiring.
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Time Domain Reflectometers and S-Parameter Analyzers
The Teledyne LeCroy WavePulser 40iX and the Teledyne Test Tools T3SP15D are a perfect combination of complimentary products to serve the requirements on testing, validating and troubleshooting cables, backplanes, connectors, transmission lines on boards and interconnect.
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PLTS Measurement And Calibration
N19303B
The new Physical Layer Test System (PLTS) 2024 is the industry standard for signal integrity measurements and data post‑processing high-speed interconnects, such as cables, backplanes, PCBs, and connectors. Signal integrity laboratories worldwide have benefited from the power of PLTS in the R&D prototype test phase.
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Analog Bus Extension for PXI
ABex
The ABex (Analog Bus Extension for PXI) is an exceptional test platform that extends to accelerate productivity, development throughput and time to market. Applicable in various industries and technological fields, this platform covers complex test challenges anywhere on the production line.Due to its flexible system architecture with an analog bus backplane and terminal modules, the platform allows the integration of technology specific extensions and extremely short system set up times which result in a reduction of total system costs.
