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- Scientific Test, Inc.
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Automated Discrete Semiconductor Tester (ATE)
5300HX
The Model 5300HX Automated Discrete Semiconductor Tester (ATE) is designed for fast, reliable testing of a wide range of discrete devices. Using an on-board Intel SBC, can provide stand alone testing capability or connected to a PC for intuitive test development and data capture.
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CASS Instrument Real Time Controller
External control of the Navy CASS ATE via Ethernet. Standardized graphical user interface (GUI) for individual control of each instrument independent of CASS software. Allows TPS developer or ATE maintainer to change/control instrument settings for TPS debug and instrument troubleshooting.
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NI TestStand Development Services
Simplicity AI have a high degree of ATE software development expertise using NI TestStand, in industry areas such as aerospace, defense and telecoms. With Certified TestStand Architects and Certified TestStand Developers on the engineering team, and holding National Instruments Alliance Partner status, Simplicity AI have the knowledge and experience to deliver advanced test software solutions.
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Biosensor Developers' Kits
Zimmer and Peacock are all about getting our collaborators, partners and customers to the market with their biosensors and medical diagnostics ASAP.This is embedded within our philosophy, products and services.As part of this we provide the Biosensor Developers Kit, which is everything you need in one box for starting on your biosensor development including
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Sensor Device for Developers
Waspmote
Libelium Comunicaciones Distribuidas S.L
Ultra low power (7µA)120+ sensors integrated on 10 Sensor Boards15 radio technologies:Long range: 4G / 3G / GPRS / LoRaWAN / LoRa / Sigfox / 868 MHz / 900 MHzMedium range: ZigBee / 802.15.4 / DigiMesh / WiFiShort range: RFID/NFC / Bluetooth 2.1 / BLEOver the Air Programming (OTA)Encryption libraries (AES, RSA, MD5, SHA, Hash)Certified encapsulated line (Plug & Sense!)Industrial Protocolos: RS-232, RS-485, Modbus, CAN Bus, 4-20mA
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ATE
QT 200 NXG
Qmax Test Technologies Pvt. Ltd.
QT 200 Nxg a Highly sophisticated ATE, is now available as a desktop unit with the cost, flexibility, and performance demanded by a large number of users in research, design, manufacturing, and repair & maintenance industry. It is a combinational-mixed signal board tester for PCBAs designed to cater the needs of PCB test and repair depots, keeping in mind the changing PCB technology and challenges in testing them offline with the combination of all such complex test methodologies in a single test hardware platform with simple to use graphical user interface software.
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ATE Integration
Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).
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ATE Solutions
Our custom, application-specific ATE Test Solutions offer a full test suite with Test Systems hardware, software, and support services.
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Mini ATE
MINI 80
MINI 80 represents the maximum miniaturization available to date with an ATE tester.All potentials of an automatic test equipment is available within 19″/2U rack as a support for those seeking parametric tests with few test points, or for those requiring a standard test-bench platform.
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RFIC ATE System
RI 7100A
The RI 7100A, which RI has shipped for over 10 years, has proven itself as the most advanced, reliable (> 4500 hours MTBF) and cost effective RFIC ATE System available. "Our recipe for high performance microwave test has always been dependent on an extremely elegant RF signal path while maintaining the most advanced microwave calibration software," said RI President, Mark Roos.
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Semiconductor ATE Systems
Our testers allow for the high-volume production of electronics that touch people’s lives in communication, safety, entertainment, and much more.
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Developers' Toolkits
If you are a hardware developer, using RapidDriver Explorer with just a couple of clicks, you can easily start testing and debugging your USB, ISA, PCI or Parallel Port device. You do not have to perform any additional steps - everything is already done!If you are a software developer, you can write your own application with the help of RapidDriver Developer, TVicHW32 or TVicPort without writing a device driver and being a DDK expert - we have already built-in generic device drivers for you! Our toolkits include many test examples on direct port i/o access, interrupt handling, physical memory access, reading specific hardware registers and USB pipes to help you getting started. We also allow redistribution of drivers and DLL's as part of your software without having to pay royalties.For the software developers, we also offer an option to purchase the drivers and DLL source code. The source code can be directly edited and compiled with MS Visual C/C++ or with the DDK "build" utility.Not sure what product to choose? Compare them by features or contact us.
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ATE Development Services
Automated Testing Engineering and Automated Test Equipment (ATE) provide a faster, more efficient way to test your product. With the help of LabVIEW and Modular Instruments, our engineers create test and measurement systems for all areas of product design and manufacturing.Whether you are in early stage R&D prototype testing, and design validation, or providing a solution for quality control and life testing our engineers can work with you to design fully customized automated Test Systems using entirely off-the-shelf products to ensure you deliver quality product on time.
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Satellite ATE
MS 1123
Configurable Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out card level testing for satellite systems (12 different types of boards). The purpose of ATE is to provide a user-friendly environment to test the boards for their functionality, perform specific tests of each card. The card level testing facilitates troubleshooting down to a faulty signal flow path. Both hardware and software designed such a way that each Input / Output is configurable and user can dynamically script the test procedure using standard ‘C’ Language.
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Generic RF ATE Test
The Generic RF ATE is developed to test the Radar and Radar Subsystems. The ATE is primarily built using an instrumentation control, precision RF routing systems and rack mounted test instruments. Generic RF ATE system enables measurement of parameters of Radar equipment such as Local Oscillators, Waveform Generators, Up and Down Converters, Analog Receivers, Array Group Receiver Units, TR Modules. The ATE is configured to test the Radars upto 18GHz frequency range.
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ATE Support
For the last 30 years, Terotest has offered a range of support services, from standard maintenance and calibration to ATE updates and legacy ATE replacement solutions.We provide, repair and exchange ATE modules, fixtures, adaptors and other hardware, as well as offering full maintenance contracts to our customers.
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ATE Computer
MS 1201
This system used for multi-purpose applications such as data acquisition and Automatic Test Equipment. ATE Computer has ISA Bus based eleven slots with inbuilt power supply. Micro Processor board or USB Controller is used to drive the back plane.
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Custom ATE Solutions
ATEC Matrix Corporation can be your one-stop provider of complete turn-key ATE Systems. With over 15 years in ATE Design, Development and implementation we have the expertise and experience to work with you efficiently to provide whatever level of solution your program requires.
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ATE Design & Build
PXI has become the de-facto standard for housing the high performance modular instrumentation required to meet the demands of testing today's high performance products. Based on the PCI bus, PXI (PCI Extensions for Instrumentation), this platform is used in most of our new ATE designs.
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ATE Socket
Design ATE socket according to customer's requirementsUse on auto-test eqiupments and handler.Pitch range from 0.30 to 1.0mm.Pin amount: 2 and above.Key material: Peek,Torlon.etcContact with top pogo pin
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RWR ATE MKII
MS 1111
Automatic Test Equipment (ATE) MKII is a customized tester, built to carry out LRU and card level testing for TARANG systems of all platforms. The purpose of ATE is to provide a user-friendly environment to test the LRUs and sub-systems (individually) for their functionality, perform specific tests of each LRU / sub-system and Card Level Testing. The card level testing facilitates troubleshooting down to a faulty signal flow path. The UUT tests are carried out by injection of the stimuli generated by the computer or the programmable test equipments and the responses from UUT / test equipments are feedback to the computer for evaluation and generation of reports.
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ATE System
Digital Communication Technologies Ltd
We design and build automated test systems according to customer requirements. Hardware, writing drivers, test plans. We have multiple automated test systems installed in the Military, Aerospace, Power, Automotive and other industries throughout Israel. LanWindows, Labview, LabWindowsCvi, Teststand, ATEasy, C ++, C #, VB
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ATE System Power Supplies
N8700 Series
The Keysight N8700 Series ATE system power supply delivers high current with low noise in a compact two unit package. Airflow moves front to back, so no additional space is required above or below the power supply in your automated test equipment (ATE) rack. This series of programmable power supplies sources up to 3300 or 5200 W. Get output voltages from 8 to 600 V and 5.5 to 400 A.
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Automated Laser Test System (ATE)
Lix is a class of instruments for automated laser beam profiling, power measurement and analysis with integrated machine vision.
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Automated Calorimeter Test System (ATE)
This unique solution is a calorimeter test system. It monitors and tests aircraft chillers automatically.
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Link simulation to ATE conversion
VCD2ATE
VCD2ATECost effective link simulation to ATE conversionDirect conversion from event driven design simulation dump (VCD/EVCD) to specific tester program files. VCD/eVCD to tester conversion Simple and cost effective conversion solution Simple cycle definition in excel High Performance Fast run time Handles very large files >6Gb
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Compact Semiconductor ATE
QST286
Qmax Test Technologies Pvt. Ltd.
The Qmax Model QST286 is a compact small foot print, sophisticated automatic semiconductor tester. Its state-of-the-art hardware design which is freely configurable to user's application requirements and software features makes it ideal for high throughput production testing of wide range of low pin count medium power ICs as listed below but not limited to Optocouplers, Isolators, LEDs, Photo diodes, Photo transistors, Photo sensors, Photo detectors , Analog Mux , Relays and more.
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Automatic Test Equipment (ATE) Module Products
Automatic Test Equipment (ATE) Module Products by ADSYS
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Pattern Converter for WGL/STIL to ATE
VectorPort
VectorPort is a versatile, low-cost test development tool for converting WGL or STIL vectors to targeted ATE tester formats, including pattern, timing, and pinmap data. VectorPort can read and write all major formats in both parallel (Flat) vectors and serial (SCAN) vectors.
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Cost-Effective ATE System
PRO RACK ATE
Qmax Test Technologies Pvt. Ltd.
Pro-Rack is a cost effective ATE System, which comes with Modular Structure provision option to improvise and enhance much instrumentation based on the user’s requirements. Basically it is designed to cater to the needs of PCB test and repair depots, keeping in mind the changing PCB technology and the challenges in testing them off-line. It can provide complete PCB test and diagnostic functions for any kind of PCB including the latest very high density complex PCBs with high pin count PQFP, FPGA VLSI chips. AC /DC parametric tests enables testing of the DC parametric of device pins on the edge connector for input bias current, Fan out capacity ,Tri-state leakage currents, AC parametric measurements such as Input / Output Propagation delay Rise time / Fall time to further enhance fault coverage. Pro-Rack is designed with VPC Mass Interconnect adapter with 16 bit fixture ID interface to the UUT through simple clips and probes or through card edge or through a bed of nail test fixture.
