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Test Programming
Consulting companies that provide/develop complete testing solutions or specific software capabilities or tools, and even end-product operation and maintenance training. Using a combination of original and generic capabilities, they save time, resources, and costs of the production company. (teradyne.com)
- Pickering Interfaces Inc.
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eBIRST™ – Switching System Test Tools
The eBIRST toolset consists of four different tools that support 200-pin LFH, 104-pin, 78-pin and 50-pin D-type connectors and a set of adaptors that allow connection to other connector types. A supplied application program controls the eBIRST tools via a USB2 port that also provides the tool power and controls the switching system using a Test Definition File to define the test sequence.
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Cable Test Instruments
Do you have systems that include a large number of coaxial devices? Our best-selling ATE product line includes a cable test instrument that automates the task of precision testing of coaxial devices. These series of cable test instruments include both a scalar and a vector model. They offer fast precision measurements in a rugged and small portable package. Programming options allow instant test set-up and measurement recall from a potential database of thousands of test devices. Using a user interface that includes clear instructions with picture prompts, anyone can successfully make precision microwave measurements with a simple click of a button.
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Functional Test Fixtures
Test Head Engineering's Custom Functional Test Fixtures range from simple to extremely complex. Typically, our customers do their own wiring and programming, but we will complete the job right up to the customer's requirements, including offering turn-key control and test programming through our partners.
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JTAG/Background Debug Mode Test System PXI Card
NX5300
The NX5300 is a single slot 3U PXI device and interfaces to the unit under test via an On-Chip Debug (OCD) or JTAG port. The NX5300 is a high performance JTAG based background debug mode (BDM) diagnostic system designed for functional test, development, programming and troubleshooting of microprocessor and microcontroller based embedded processor systems.
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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PXIe Arbitrary Waveform Generator, 500 MSa/s, 16 bit, 200 MHz
M3201A
The M3201A PXIe arbitrary waveform generator is ideal for general purpose AWG automated test requirements. It offers high channel density with high-quality output with low phase noise. The optional real-time sequencing, intermodulation synchronization, and graphical FPGA programming software tools expand its capability to enable a number of solutions including envelope tracking (ET) and DPD (part of PA/FEM reference solution), MIMO, baseband electronics design, wireless device manufacturing, ATE, beamforming and other multi-channel coherent signal generation and multi-channel signal generation.
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Microelectronic Services
Services for ASIC houses and Integrated Device Manufacturers are IC Wafer / Final Test, IC assembly, Test Program development, product engineering, Flash / EEPROM programming, characterisation / capability studies, yield enhancement, design verification and failure / yield analysis. Das Test Haus are specialists for wafer test, low power, mixed signal and eeprom test.
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Engineering Services
In addition to the highest quality test programming, maximizing board coverage, and efficient board testing, TTCI offers a full array of other engineering services, including CCA (Circuit Card Assembly) Testing, Design for Test, ASTER TestWay electrical design for test analyzer, Feasa LED analyzer, SMH Technologies FlashRunner in-system programmer, finite element analysus, installation, reverse engineering of Gerber to CAD, Training, Test System PC, Hardware, and Software Upgrades, and more.
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In-Circuit Test Programming Services
Acculogic offers in-circuit / ATE test programming services for the most widely used Automated Test Equipment / platforms, in our state of the art test development laboratories. Staffed by a highly skilled team of engineers with an impressive track record in providing test solutions to customers in a variety of industries.
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Prototyping
Is an early sample, model, or release of a product built to test a concept or process or to act as a thing to be replicated or learned from.[1] It is a term used in a variety of contexts, including semantics, design, electronics, and software programming. A prototype is generally used to evaluate a new design to enhance precision by system analysts and users.
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Cable/Harness Tester
LX-650
Shenzhen Lian Xin Technology Co., Ltd.
The system provides Chinese/English free switch operation interface;．·Up to 1000Vdc/700Vac Test Voltage．·256 Max. Test Points．·Auto Scan and Auto Pin Search．·The system provides advanced instant open-circuit, short-circuit, continuity test．·Intermittent Conductance Test．·Intermittent Open/Short Test．·Providing Double-End/Single-End Testing．·Large 320×240 LCD display．·Full Programming Sequence Test．·Versatile I/O Ports for application．·Statistics and Print Function
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Software Test Framework for LabVIEW
VI Tester
VI Tester is a software test framework for LabVIEW that allows software developers to test their LabVIEW code (VIs). Software testing is a critical component of agile development and test driven development processes and is also critical for validating software functionality. VI Tester is based on the industry standard xUnit software test architecture that is used in many other programming languages. This architecture is very flexible and powerful, but also very easy for beginners to learn.
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XJLink2-3070
The XJLink2-3070, approved by Keysight Technologies, provides convenient, integrated access to XJTAG’s powerful boundary scan test and programming tools from Keysight (Agilent) i3070 ICT machines.
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RF Downconverters
SignalCore offers traditional multi-stage and single-stage RF downconverters, and Direct IQ demodulators that feature low phase noise, high dynamic range, wide bandwidth, and continuous tuning. SignalCore RF downconverters are compact and built for mechanical robustness and ruggedness. Applications include various test and measurement applications such as those in spectral monitoring, signal intelligence, ATE, and software-defined radio. All products are provided with a Graphical User Interface (GUI), driver, and API for easy programming control.
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Digital Test Instrumentation
Di-Series™
The Di-Series tests all levels of integration from board level (SRA/SRU) to box level (WRA/LRU) units under test (UUTs), while maintaining full compatibility with previous generations of Teradyne instrumentation and systems. Excellent usability and reliability reduce programming and support effort, as well as straightforward upgrades of existing test program sets (TPS).
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Semiconductor Testing
The integrated PXI platform and the open interfacing provides extension capabilities for additional testing requirements like DUT specific resistors-networks or temperature sensors. The Test System comes with the ready-to-run GTSoftware package and allows easy programming of test sequences (GTbuilder) and fast execution in production/test mode (GTengine).
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Digital multimeter, 6 digit
34461A
Color, graphical display with built-in bar chart, histogram, trend, math, and statisticsI/O: USB, LAN/LXI, GPIB (optional)BenchVue software enabled: Do more with your PC and instrument together, no programming required. Easily control your DMM, quickly build automated tests, log measurements and save precious time.
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Automation Platform
AccelQ
*Automates test design and execution with a focus on business process*Enables manual testers and business analysts to automate without the need for programming*Ensures design-first approach with inbuilt modularity; No need for custom frameworks.*Enables early automation with industry first virtualized abstraction for functional testing
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Mobile Comm DC Source w/ Battery Emulation
66321B
The Keysight Mobile Communications DC Source 663xx series offers several features ideal for testing wireless and battery powered devices. Excellent voltage transient response ensures maximum test-system throughput by minimizing device shutdowns due to significant voltage drops in the test wiring. Built-in advanced measurement system to accurately measure battery current drains when the device operates in different modes and a Keysight-developed feature that enables cellular telephone manufacturers to detect permanently and intermittently open-sense wire connections.The Keysight 66321B mobile communications dc source provides fast transient response, exceptional sourcing, output resistance programming, and precision measurement. This product is specially designed for testing next generation digital wireless communications products. The 66321B mobile communications dc source offers a new capability that simulates the internal resistance of a battery or battery pack. Additionally, these high performance models offer improved transient response and stable output operation with either short or long load leads.
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Programming Interface for CMC Test Sets
CMEngine
CMEngine is an open programming interface that enables you to integrate the CMC test sets into your own testing environment and control them within any type of application.
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Test Adapter
Development of a 12-way test and programming adapter from Toptest for ?? The Dash ?? from Bragi, a wireless, intelligent earphone with communication and sensor technology. With the first version of the test adapter, only a purely sequential testing was possible due to the interdependencies of the tests. In version 3.0, the now autonomous tests were brought into a parallel TestStand sequence. In addition, individual sockets were prioritized in order to optimally use the hardware resources. This resulted in a time advantage of 80% compared to the initial situation.
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Aeroflex AIDE
This programming environment for analog and digital in-circuit test and function test allows a high depth in the realization of inspection tasks. We have many years of extensive experience in dealing with AIDE.
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Electronic Load
* Fully programmable, self-contained, air-cooled solid state load.* Patented design is optimized to provide ultra-low impedance operation for fuel cell testing.* Load is compatible with AC impedance or frequency response analyzers.* Interchangeable shunts for precise operation over a wide dynamic range.* Ten built-in cell voltage monitoring inputs optional. Additional voltage monitoring inputs available.* Ethernet Interface for simple configuration and expansion!* Combine with additional Fideris™ Innovator Series™ modules to create a fully-integrated,fully-automated, customized test system.* System-wide control of all Fideris™ Test System Components using FCPower™ Software,LabviewTM, or other programming language.* Integrated hardwired Run/Standby signal.
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High-Performance Intelligent Pod for Corelis Boundary-Scan Controllers
ScanTAP 4 & 8
Boundary-scan has proven itself time and again to be a truly versatile interface for structural test, embedded functional test, built-in self-test (BIST), software debug, and in-system programming. Supporting such diverse applications requires equipment with high-performance specifications and extended features.Corelis ScanTAP pods are designed for use with PCI-1149.1/Turbo and PCIe-1149.1 high-speed JTAG controllers. Featuring 4 & 8 independent Test Access Ports (TAPs), up to 80 MHz clock rates, and advanced TAP capabilities such as analog voltage measurement, the ScanTAP family of intelligent pods is the ideal JTAG interface for high-performance environments.
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Test system software
CITE
CITE (Computer Integrated Test Environment) is the software platform for all Digitaltest test systems. It is a real-time system offering a vast number of tools to ensure high test quality and shortening testing time. The software also provides you with several different programming languages that you can choose from.
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USB Explorer (Two Port)
JT 3705
The JT 3705/USB Explorer is a low-cost two port USB powered boundary-scan controller interface specifically suited for low volume testing and in-system programming of (C)PLDs. Explorer supports two fully-compliant boundary-scan test access ports (TAPs) which can be synchronized for test purposes.
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T6990 ENTRY LEVEL ABSOLUTE PRESSURE DECAY LEAK TESTER
T6990, recalculating the success of its predecessor M6990, an obviously enhanced user interface, thanks to an innovative tempered glass panel with built-in capacitive keyboard, around a 3.5” colour display.The new, high resolution display makes it even easier to view the test cycle and the programming menus, and the capacitive keyboard allows fast parameter entry.
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COTS PXIe/CPCIe GPU Modules
Trifecta-GPU
The Trifecta-GPU™ Family of COTS PXIe/CPCIe GPU Modules are the first COTS products that bring the extreme compute acceleration and ease-of-programming of NVIDIA® RTX® A2000 Embedded GPUs to PXIe/CPCIe platforms for modular Test & Measurement (T&M) and Electronic Warfare (EW) applications.
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Circuit Breaker Simulation Device
PSS01
PSS01 is the circuit breaker simulator，which can conduct circuit breaker simulation to test the whole secondary relay scheme together with relay test set. It is very good accessory for protection relay test kit to avoid complicated software programming to finalize the same test.
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4X14 Gb/s QSFP/QSFP+ Evaluation Board
EV-QSFP-174
The EV‐QSFP‐174 QSFP/QSFP+ Host Test Board comes complete with Windows based software (Windows XP & above) to enable intuitive memory map programming and testing, controlled via a mini B USB port. It is designed to simulate an ideal environment for QSFP/QSFP+ transceiver module testing, characterization and manufacturing test. Its high speed properties make the host board as electrically transparent as possible, allowing for a more accurate assessment of the module’s performance.
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Seno-Con Test System
PANTHER 2K QST
Qmax Test Technologies Pvt. Ltd.
Panther 2K-QST is a versatile ultra fast Seno-Con test system designed to test high volume ,low to high pin count consumer semiconductor IC’s for its assembly line wire bonding faults. Its innovative test technology helps learn from known good device and test against target device drastically reduces time required to develop Test programs.The operating software is designed in such a way that it is fully user friendly with GUI programming.
