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Line Replaceable Unit
unit of a complex engineered system, designed for quick replacement.
See Also: LRU
- TEAM SOLUTIONS, INC.
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625 KHz Data Acquisition Multifunction (Analog Output X2 Lines) PCMCIA
DAQi616MF(MF236/i)
The DAQi616MF is a type II PCMCIA I/O card for notebooks and other computers containing a PCMCIA slot.
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S500 Test Solution
The S500 Bench Test Equipment (BTE) is customized to test the Line Replaceable Unit (LRU) to determine the faulty Lowest Level Replaceable Unit (LLRU). Once a faulty LLRU is discovered, a separate application program specifically designed for the LLRU is executed to further isolate the fault.
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Instrumentation Amplifiers
HIGH-POWER RADIO FREQUENCY (RF) AND MICROWAVE AMPLIFIERS, TWTA AND SOLID STATE
Communications & Power Industries
electromagnetic compatibility (EMC) high-intensity radiated field (HIRF) testing, military testing, electronic warfare simulation and scientific applications are based on the same switched-mode power supply technology as its rugged amplifiers. As a result, these instrumentation amplifiers have all the same performance and reliability advantages as the rugged product line, but have been neatly re-packaged into compact, lightweight and affordable rack-mountable units more suitable for less demanding physical environments. CPI TMD's new modular design (the PTCM range) has many user benefits, including advanced self-diagnostics, ethernet interfaces, remote management, VSWR protection and plug and play field replaceable power supplies.
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Computing Systems
Curtiss-Wright Defense Solutions
Mission computers are the heart of every platform. To ensure your mission success, our embedded computing systems are backed by decades of experience developing C5ISR, vetronics, and program-specific system solutions. Whether you're looking for a modular, small form-factor (SFF) line replaceable unit (LRU) or a scalable VPX system designed to meet your specific requirements, our computing systems are built rugged to perform optimally in the harshest deployed environments on land, in the air, or at sea. Our industry-leading system architects partner with you to meet your system integration and program management requirements. They leverage our comprehensive range of open architecture commercial off-the-shelf (COTS) building blocks or design a unique custom solution when required.
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Air Data Calibration Test System (ADCTS)
ADCTS-1000 Series
TestVonics Air Data Calibration Test System (ADCTS) is high precision advanced Secondary Air Data Controller-Monitor system. The ADCTS-1000 Series is a self-contained maneuverable rack mounted air data management system. The ADCTS is used in calibration labs, avionics engineering and avionics/instrument shops. The system is designed to perform both manual or automated test and calibration routines for a variety of air data test equipment (ie. test sets, air data computers, altimeters, airspeed indicators and line replaceable units). The ADCTS can be configured for use in both commercial and military environments.
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Pulse AC Method Area Ionizers
ER-X Series
Panasonic Industrial Devices Sales Company of America
The ER-X Series Area Ionizers utilize the pulse AC ionization design to achieve high-speed charge removal of wide surface areas for high-volume production lines. In addition to supporting compressed air ionization, the ER-X also features both airless and low-pressure ionization modes for applications where tiny workpieces can be easily blown away. Additional features include automatic ion balance and discharge frequency control (manual control is also possible), flat discharge surface for easy cleaning, discharge needle air barrier design to reduce contamination of the needles, replaceable discharge needle unit for easy maintenance, and a dual head configuration for enhanced charge area and layout (2 different ionizer heads can be connected to a single controller).
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Air Data Computer (ADC) Tester
MS 1122
The ADC tester is used in 2nd line maintenance is to check the functionality of ADC. This unit is a rugged customized hardware based on full functionality test of ADC. The Air Data Computer (ADC) Tester is a fully automated GO/NOGO tester with full functional testing in 2nd line maintenance. This tester is to test ADC at unit level and identify faulty Shop Replaceable Unit (SRU). This tester is also used to carry out PI checks on ADC before clear them for installation on aircraft. ADC Interface board designed to test full functionality of ADC. The Air Data Computer (ADC) test equipment shall be used for testing ADC of Tejas Aircraft. ADC test equipment shall verify the functionality against specifications during second line maintenance and pre-installation on the aircraft.
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CAPture Avionics Test Suite
Safran Data Systems India Pvt. Ltd
The aerospace & defence scientists and engineers working on the design, development and validation of avionics systems or sub systems (Line Replaceable Unit – LRUs) face a challenge of testing them as all physical components may not be available for testing purpose. Also, such testing is costly and time consuming. Avionics Test Suite is a platform empowering them to perform the tests in simulated environment, testing various commonly used Avionics bus interfaces.
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AIS Air Data Test System
F-16
The primary function of the Air Data Test System (ADTS) is to perform testing and fault isolation of pneumatic-type Units Under Test (UUTs). To test a UUT, the operator connects the associated Line Replaceable Unit (LRU) Integrated Test Adapter (ITA) to the rackmount Avionics Intermediate Shop (AIS) test station. The operator connects the ADTS to the IAIS via an RS-232 Interface and then finally, connects the UUT to the ADTS using the supplied cables and hoses.
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Processor and NVIDIA Quadro GPU
MAGIC1A
The MAGIC1A is a rugged line replaceable unit (LRU) suitable for high-performance computing in the harshest of environments. The combination of Intel and NVIDIA processors in a low SWaP-C3 package ensure it can be used across a wide range of commercial and military applications, including displays, situational awareness, data/radar processing, video processing, classification, and artificial intelligence (AI).
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Avionics Suite Tester
Based on order from the Navy, Data Patterns developed the complete Automated Test Equipment required for validating all the Line Replaceable Units (LRUs) utilized in the Seaking Helicopter. The upgrade was carried out at multiple Naval bases in India.
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GPU
The MAGIC1A is a rugged line replaceable unit (LRU) suitable for high-performance computing in the harshest of environments. The combination of Intel and NVIDIA processors in a low SWaP-C3 package ensure it can be used across a wide range of commercial and military applications, including displays, situational awareness, data/radar processing, video processing, classification, and artificial intelligence (AI).
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Depot Repair & Redesign
ARC has worked with the DoD/military agencies and the FAA to help service and repair critical products in the national air system and various line replaceable units (LRUs) that may contain multiple circuit cards. With a skilled team of engineers and service technicians that can troubleshoot, reverse engineer, and help in finding components for damaged and obsolete parts, ARC is the right depot partner.
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500 Watt AC/DC Power Line Conditioner, 3U VPX, Holdup Time
VPX56-3HU
NAI's VPX56-3HU is a rugged, high-performance 500-Watt Output +28 VDC Input 3U VPX AC/DC Power Line Conditioner designed for aerospace, defense, and industrial markets. This off-the-shelf power supply plugs directly into a standard VPX conduction cooled chassis and protects downstream DC-DC converters from MIL-STD-704 transients, low-voltage conditions and power interruptions, providing up to 50 milliseconds of holdup time at up to 500-Watts. Continuous Background Built-In-Test (BIT) and I2C communication are included.
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PXI-4132, 100 V, 2 W Precision PXI Source Measure Unit
780558-01
±100 V, 10 pA Precision PXI Source Measure Unit—The PXI-4132 is a programmable, high-precision source measure unit (SMU). It has a single isolated SMU channel that offers a four-quadrant output that incorporates remote (4-wire) sense as well as external guarding. With its high measurement resolution integrated guarding, the PXI-4132 is ideal for high-accuracy leakage measurements on integrated circuits, discrete components, PCBs, and cables. You can also perform high-speed I-V measurements on a variety of components including diodes and organic LEDs using the onboard hardware sequencing engine. In addition, you can synchronize multiple PXI-4132 modules using the PXI backplane to provide high-speed I-V measurements on transistors and more complex devices.
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PXI Single Bus 74-Ch 2A Fault Insertion Switch, N/O Through Relays
40-190B-301
The Single Bus, 74 Channel PXI Fault Insertion switch is part of our family of 2 Amp fault insertion solutions, The range includes modules with 74, 64 or 32 channels and single or dual fault buses. This version has normally open through relays, so in the default state, there are no paths between inputs and outputs for any signal channel. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers.
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PXI Single Bus 74-Ch 2A Fault Insertion Switch
40-190B-001
The Single Bus, 74 Channel PXI Fault Insertion switch is part of our family of 2 Amp fault insertion solutions, The range includes modules with 74, 64 or 32 channels and single or dual fault buses. This version has normally closed through relays, so in the default state, there is a path between input and output for all signal channels. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers.
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Ethernet/AFDX/BroadR-Reach PCI Fault Insertion Switch - 8 Channel
50-201-008
This high bandwidth differential PCI fault insertion card is designed to simulate common faults on high speed two wire communication interfaces such as Ethernet. This card supports 4 or 8-channels of two wire serial connections and can be used for simulating faults on Ethernet, AFDX, BroadR-Reach, 100BaseT and 1000BaseT interfaces. Any wire can be set to an open circuit, shorts can be applied across the wire pair, or to the adjacent pair. Fault connections can be made to one of four external signals via two fault buses, typically simulating connections to a supply voltage or ground.
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PXIe High-Speed Source/Measure Unit, 13 V, ± 1 A or 6 V, ± 3 A, 18 W
M9111A
The M9111A is a 1-slot, 2-quadrant PXIe module that provides stable, glitch-free sourcing and sinking, and high accuracy measurements. It offers high-throughput and measurement quality for design validation and production test of RF power amplifiers. With industry-leading output stability under extreme, dynamic load conditions and unmatched transient performance to dramatically reduce voltage droop due to pulse loading, the M9111A SMU speeds test time. The high-speed M9111A can change its output voltage, stabilize that voltage, and accurately measure current from Amps down to micro-Amps all in less than 1 ms so that you can move on to the next test as quickly as possible.
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PXI/PXIe Fault Insertion Switch, 74-Chan 2A, N/C Through Relays, Fault Buses on M & U
42-190C-012
The 40-190C-012 (PXI) and 42-190C-012 (PXIe) are fault insertion switches with 74 channels. They are part of a range of modules available with 74, 64 or 32 channels and are primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers.
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PXI/PXIe 1000Base-T1 Fault Insertion Switch, 3-Channel
42-203-001
The 40-203-001 (PXI) and 42-203-001 (PXIe) are designed to simulate common faults on high-speed two wire communication interfaces such as 1000Base-T1. They support 3 channels of two wire serial interfaces. Each channel pair can simulate an open fault in either or both wires, and using the fault bus switches can simulate short between both wires or a short to one of two externally applied fault connections – such as battery supply or ground - via two fault buses.
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PXI 11-Channel 2A Fault Insert Switch
40-202-101
This is the 11 Channel version of the 40-202 Fault Insertion Switch. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. It is designed to be able to insert three different fault conditions between the test fixture and the equipment under test
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PXI Isolated Single Channel Voltage/Current Source, 100V
M9186A
The V/I source lets you source a voltage and measure the resultant current, or source a current and measure the resultant voltage. It consist of two separate amplifiers, denoted "low" and "high" that share a common output connection. The "low" amplifier provides voltages in the range of 16 volts at up to 200ma and the "high" amplifier provides voltages in the range of 100V at up to 20mA.
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Single Bus 75-Channel 2A PCI Fault Insertion Switch
50-190-001
This PCI fault insertion switch range is available with 75, 64 or 36 channels. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers. The Stimulus/Measurement to UUT path is suitable for supporting CAN and FlexRay bus systems.
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PXI Dual Bus 64-Chan 2A Fault Insertion Switch
40-190B-102
The Dual Bus, 64 Channel PXI Fault Insertion switch is part of our family of 2 Amp fault insertion solutions, The range includes modules with 74, 64 or 32 channels and single or dual fault buses. This version has normally closed through relays, so in the default state, there is a path between input and output for all signal channels. It is primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers.
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PXIe 5-channel Precision Source/Measure Unit, 500 kSa/s, 10 pA, 30 V, 500 mA
M9615A
The Keysight M9615A is a PXIe five-channel precision source / measure unit (SMU). It supports accurate measurement up to 30 V / 500 mA with resolution down to 6 uV / 10 pA.
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PXI Source And Measurement Unit Family
PXS840x
The PXS(e)840x is a high precision, high speed source and measurement unit, which is designed for automated high throughput testing.
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PXI/PXIe Fault Insertion Switch, 64-Chan 2A, N/C Through Relays, Fault Buses on M & U
40-190C-112
The 40-190C-112 (PXI) and 42-190C-112 (PXIe) are fault insertion switches with 64 channels. They are part of a range of modules available with 74, 64 or 32 channels and are primarily designed for the simulation of fault conditions in automotive & avionics applications involving the reliability testing of safety critical controllers.
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PXI Fault Insertion Switch, 6-channel, Two Fault Buses, 10 A, Hardware Interlock
40-192A-012-HI
The 40-192A-012-HI is a PXI fault insertion switch with hardware interlock using solid state switching elements and is capable of switching current up to 10A. It is designed to be able to insert three different fault conditions between the test fixture and the equipment under test:
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PXIe-4136, 200 V, 1 A System PXIe Source Measure Unit
783760-01
±200 V, 1 A System PXI Source Measure Unit—The PXIe‑4136 system source measure unit (SMU) delivers high power, precision, and speed. It is ideal for a broad range of applications including manufacturing test; board-level test; lab characterization with devices such as integrated circuits (ICs), power management integrated circuits (PMICs), and radio frequency integrated circuits (RFICs); and discrete devices including LEDs and optical transceivers. The PXIe‑4136 features 4-quadrant operation. The PXIe‑4136 is a hardware-timed instrument with a high-speed sequencing engine for synchronizing acquisitions between multiple SMUs. The module supports direct DMA streaming between the host PC and SMU, so you can stream large waveforms and measurement data at the full update rate and sample rate of the instrument.
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Digital Source Capture Unit
DIO2
The DIO-II module is a multimode digital source and capture unit. In Low Speed Mode it provides a 20-bit parallel or 24-bit serial I/O capability running at speeds up to 50 MHz. In High Speed Mode, the DIO-II provides a 16-bit parallel I/O capability up to 200 MHz. In both Modes, the Clock is generated by a low jitter PLL source that is capable of generating clocks from 320 kHz up to 1 GHz.
