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IC
circuitry in a chip.
See Also: Integrated Circuit, Chip, Digital IC Testers, IC Test, IC Clips, IC Probes
- TEAM SOLUTIONS, INC.
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DC-to-60MHz 1:10 Oscilloscope Probe Kit (HP-9060 Or HP-3060)
PRB-HP-9060
Up to 60MHz, Includes a handy storage pouch and includes an IC test-hook adapter for the probe., The BNC connector rotates to avoid cable tangle or kink., Cable length is 1.4 meters.
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Kelvin IC Clip Lead
16089C
Measure odd-shaped components that you cannot measure using conventional fixtures
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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ST VL53L0X Time-of-Flight Range/Distance Sensor
SEN-36003
Highly integrated breakout board for the ST Micro VL53L0X Time of Flight (ToF) range finder sensor, which builds on the absolute ranging technology introduced with the VL6180X. The VL53L0X drops the ambient light sensing capability of it's predecessor for a 10X improvement in absolute ranging capability, bringing the maximum possible range to 2 meters! As a result, this sensor has even more uses in the robotics, cell phone and gesture recognition space. The SEN-36003 includes the VL53L0X IC mounted between two 4-40 sized mounting holes with on board 2.8V LDO and high-speed signal translation to handle interface voltages from 3V to 5V. The board is interfaced via an I2C interface and function pins have been broken out to a 0.1" pin header. All pins are translated to allow interfacing with any microcontroller in the 3V to 5V operating range.
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5G 256-Element Active Antenna Innovator’s Kit
AWA-0134
The AWA-0134 is an active array for 5G wireless applications developed using planar antenna technology resulting in a very low profile, lightweight unit. The surface mount assembled antenna board is based on Anokiwave’s AWMF-0108 Silicon Quad Core IC and demonstrates the performance achievable using low power silicon integration and efficient antenna layout and design. Using the AWMF-0108, the antenna provides +60dBmi (1000 W) of EIRP. The electronic 2D beam steering is achieved using analog RF beam forming, with independent phase and gain control in both Tx and Rx operating modes. The AWA-0134 antenna leads the way in showing how 5G coverage can be rolled out by network operators using the mmW bands, with low power footprint and high energy efficiency, while meeting key operating specifications for data rate, latency, coverage, and reliability.
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Develop - Simulate - Validate JTAG / IJTAG based IP
NEBULA
You, your vendors and your customers being able to use one common interface to control and observe on-chip IP, resources and instruments. The figure below shows an example IC. The new IEEE 1149.1-2013 standard supports an init-data register for configuring the analog paramaters of I/O as well as controlling on-chip PLLs. The standard further extends this by defining in BSDL user test data registers or 'scan chains'. These registers enable the ability of generic software to control and observe mission mode IP and instruments simply by describing the register interface in BSDL.
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uSD Logger Shield
IFB-11001
This micro SD logger shield enables time-stamped logging of any signals measured by your Arduino project! Whether sensor shields, breakout boards or datalink connections, this shield will get your logger project up and running quickly. We've included an MCP79410 Real-Time-Clock module for flexible supply voltage timekeeping, which includes an on-board battery holder for a CR1220 battery (included, and is installed). In addition, the micro SD card is interfaced through a high-speed translator IC and supplied with a high-current LDO to meet the demands of the SD standard. Each pin of the Arduino has an offset pin attached for easy wiring to the massive 13x9 pin prototyping area, including the pins connected to the ICSP header! Whether you're using a Mega, Due or Uno, this board has your interfacing needs covered! Finally, the micro SD holder is a push to lock, push to unlock type, which makes it really easy to both install and uninstall your card.
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AMIDA 3001XP Tester
AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.
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Open Top BGA Sockets
Ironwood has the most comprehensive collection of open top BGA and QFN sockets that can be used for qualification application, silicon FIB testing, system development, thermal characterization, burn-in application, etc. IC socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. Typical packages include BGA, LGA, QFN, QFP, WLCSP, etc. Open top allows access to the top side of IC. Below is an example BGA socket that uses low cost elastomer contact technology.
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Electronics Failure Analysis System
Sentris
Due to the continued decrease in integrated circuit feature size and supply voltages, detecting and locating the miniscule amount of heat generated by failure sites has become increasingly difficult. Sentris pinpoints low-level infrared thermal emissions from IC faults such as short circuits and leakage current.
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Temperature Probes
Used for immersion temperature measurement in liquids, air, gas, or wells in solid material, Omega offers a large variety of probe styles in thermocouple, RTD, thermistor, and IC technologies.
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Module Sockets
Ardent Optical Engine
The scalability of SP connector technology is enabling the next generation of optical device IC manufactures to allow for solder-less high speed optical Electrical Module replace-ability. These connectors offer high speed input data rates in cost effective and real-estate friendly form factors.
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Analog Custom IC Design Solution
Silvaco offer a full IC-CAD design flow including design capture, circuit simulation, layout design, physical verification, parasitic extraction and reduction, and post-layout analysis including statistical variation, IR-drop/EM.
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RF Front-End ICs
Analog Devices offers RF Front-End ICs for phased array antenna solutions. These RF Front-End ICsare placed right at the antenna element and can quickly switch between transmit and receive functions in radar applications. The power amplifier on the transmit side is highly efficient operating in short pulse durations. The low noise amplifier on the receive side has a low noise figure with high linearity so that it won’t distort the incoming return signal. The RF Front-End IC also incorporates a high performance switch to toggle between the transmit and receive paths. Highly integrated planar phased array antennae need small form factor solutions, and Analog Devices has integrated the switch, low noise amplifier, and power amplifier into a small surface mount package as well as the decoupling capacitors, providing an optimal solution.
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Light-to-Analog Sensors (Current)
Renesas' light-to-current silicon optical sensors combine a photodiode array and current amplifiers on a single monolithic IC. These devices are ideal for display and keypad dimming, as well as industrial and medical light sensing applications.
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Silicon heavy-doped Tweezer Tester
HS-MRTT
Mini resistivity tweezer tester is used to check heavy-dope silicon. adaptable for little granular material, little broken IC Wafer and other little silicon material. When the resistivity is lower than the set value, it will make alarm.
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InCarrier Loader/Unloader
NY32-LU
NY32-LU™ loader unloader provides a high parallel single solution for singulated and strip IC testing with controlled and sensitive handling. The system is scalable; one system can be used as a Loader or Unloader, or can be reconfigured as a dedicated Loading or Unloading system.
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DCDC
DP Series
The DP family is an economically priced high performance series of regulated DC/DC converters offering single and dual outputs. Features include MOSFET design operating at a switching frequency of 100Khz, continuous short circuit protection, LC input filter, 500 Vdc I/O isolation, and an operating temperature range of -25°C to +71°C with no derating. These miniature converters maintain excellent regulation over varying line and load conditions (0.2% for line and 0.5% for load). They are packaged in an IC compatible 24 pin DIP configuration measuring 1.25” x 0.8” x 0.4” high.
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Semiconductor & Electronic Systems Test and Diagnostics Services
Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
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DS18B20 TO-92 Digital Thermometer Temperature IC Sensor
604-00070
The DS18B20 digital thermometer is a high-resolution (9-bit to 12-bit) Celsius temperature sensor with a built-in alarm and user-programmable alarm level. The sensor uses a 1-Wire bus that requires data, power and ground. Each sensor has a unique ID, allowing them to be configured and identified on the same bus. Distributed machines, buildings, and process control are common applications. This sensor was brought into Parallax inventory for use in the P2 Quick Byte series as a demonstration device for the 1-Wire Object. This part is easily wired into a breadboard, too.
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ESD & Latch-Up Test Service
MASER Engineering has automatic test equipment for the most common ESD test pulse models. MIL - JEDEC - ESDA - IEC standards. IC level Human Body Model. IC level Machine Model. IC level Charged Device Model. System level IEC 61000 HBM. AEC-Q100 Field Induced Gate Leakage test. Static Latch-Up test. Dynamic Latch-Up test.
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VLSI Test System
3380P
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (512 I/O pins to test 512 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Light-to-Analog Sensors (Voltage)
Renesas' light-to-voltage silicon optical sensors combine a photodiode array, a non-linear current amplifier and a micropower op amp on a single monolithic IC. Applications for these devices include display backlight control, keypad dimming, anti-glare mirror systems, and industrial and medical light sensing applications.
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Inbuilt External Controller ATE with Touch Screen Features
QT 200NXT
Qmax Test Technologies Pvt. Ltd.
QT 200 nxT is a ultra modern stylish Inbuilt external controller ATE with touch screen features, is now available as a desktop unit with the cost, flexibility, and performance demanded by a large number of users in research, design, manufacturing, and repair & maintenance industry. It is a combinational-mixed signal board tester for PCBAs designed to cater the needs of PCB test and repair depots, keeping in mind the changing PCB technology and challenges in testing them offline with the combination of all such complex test methodologies in a single test hardware platform with simple to use graphical user interface software. The vast library support helps you to functionally test host of different IC families. Other features like user-friendly Windows based software, add-on utilities like oscilloscope, RCV meter circuit tracer, etc. makes it a favorite and makes very effective for repairing PCBs without schematic/ circuit diagrams. All these tests are carried out using simple BUT Interface like multipin test clips, probes or custom test fixture
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MAX31855 K-Type Thermocouple Arduino Shield
SEN-30004-K03
Four channel MAX31855 digital thermocouple Arduino Shield. Two versions of this shield are avaliable for each thermocouple type: either 'Ch 0-3' (CS pins use Uno/Mega IO pins 7-10) or 'Ch 4-7' (CS pins use Uno/Mega IO pins 3-6), with the only difference being which set of zero-ohm resistors are populated on the board. This allows use of other SPI devices that may be 'hard coded' to specific digital pins on the Arduino, or simply stacking one of each type together to get a total of eight thermocouple channels on one Arduino. The MAX31855K supports a measured temperature range of -270C-1372C with known thermal characteristics and output resolution of 0.25C. Included thermocouple connectors are type-specific to provide proper material continuity as close to the IC as possible. The SEN-30004 is interfaced via 3 or 4-wire SPI and a high-speed level shifter is included to allow the board to plug directly into an Arduino Uno or Mega
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Dip Clip, 14 Pin With Nickel Silver Contacts
5114
Pomona DIP Clip? test clips are designed fortesting dual-in-line IC packages on PC boards. Thesedevices incorporate many built-in features that assurea positive electrical connection as well as hands freetesting.
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100 MHz 32-CH High-Speed Digital I/O Card
PCIe-7360
ADLINK's PCIe-7360 is a high-speed digital I/O board with 32-CH bi-directional parallel I/O lines. Data rate up to 400 MB/s is available through the x4 PCI Express® interface. Clock rate can support up to 100 MHz internal clock or 200 MHz external clock, ideally suiting applications of high-speed and large-scale digital data acquisition or exchange, such as digital image capture, video playback and IC testing.
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Water Meters
Shenzhen Star Instrument Co., Ltd.
IC cold/hot water meter manages perches and consumption by using a contact IC card as data medium.
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Hall Effect Sensor
The hall effect sensor products are manufactured according to international standards. Being an ISO 9001:2008, ISO 14001 and OHSAS 18001 certified company, DER EE is capable of designing and producing superior products to the highest standards of customers' requirements. Hall effect sensors we provided are a device containing both the sensor which produces a very low signal level and contains the vacuum tube amplifier and a high gain integrated circuit (IC) amplifier in a single package. hall effect sensor offer many applications to sense position and motion, to control electric motor control, to sense wheel rotation and so on.
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Heavy Duty Dynamometers
MD-250-HD
The MD-250-HD series dyno (SE/DE) was designed to be a performance dynamometer first with the added benefit of being able to test 2-wheel-drive heavy-duty vehicles such as truck, buses and commercial vehicles in addition to the standard car or light duty pick-up. The 250-HD is certified in the states of Colorado, Nevada and Utah for use in loaded-mode diesel smog testing programs because of its accuracy and reliability. No other dyno in its class offers more value or better in-house motor vehicle testing capabilities than the Mustang MD-250-HD. For starters, the MD-250-HD boasts a 1,500 horsepower measurement capacity at a top speed of 175 mph and a powerful air-cooled eddy current brake provides the MD-250-HD-SE with 900-hp worth ofloading capacity for steady state testing. Loading capacity can be increased to 1,500-hp via the optional DE model. The 250-HD can be upgraded to the 250-HD-SE-M via the addition of a 100 or 200 hp AC motor for transient testing of electric buses to measure range and regeneration or for emissions testing of IC engines. Do not be fooled by its compact size – the MD-250-HD is a serious dynamometer with serious tuning capabilities. The MD-250-HD uses a powerful eddy current power absorber, a frictionless, air-cooled braking device, to enable it to apply variable and steady state loading. A complete control and data acquisition system lets you design a wide range of tests or select from a host of pre-configured tests included with the standard system. The 250-HD’s four roller design makes setting up vehicles a snap – simply drive onto the 250-HD and let the tires settle in between the rollers. The 250-HD can be installed above-ground or below-ground, it’s your choice. The above-ground system utilizes an optional premium platform and ramp system with an above-ground restraint kit. The addition of an axle pull-down kit help keep the tires from slipping or trying to “climb out” of the rollers.
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Test Socket Based Elastomeric Matrix Connectors
Z-Axis offers a wide range of high performance test sockets, which are based on our elastomeric matrix connectors, for wide range of IC packages (BGA sockets, LGA sockets, etc.), coaxical, and wafer level; and for testing high speed, digital, analog, and RF signals etc.
