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Data Pattern
Produce data patterns for the assurance of logic circuits and digital semiconductors.
- Pickering Interfaces Inc.
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PXI 36 Channel Data Comms MUX, 96-pin SCSI
40-735-912
The 40-735 data communications multiplexer is designed for switching the data lines of serial interfaces (RS232, USB). Careful attention to the design of the module ensures that the switching system minimizes its impact on the transmission distance of USB1.1 interfaces. The MUX is available in 36:1 or 18:1 formats and enables a single source of serial data to be switched to one of 36 or 18 devices under test. This allows the data source to load information to, or receive information from, the device under test. This 36:1 version can be software configured into two independent 18 way MUXs enabling two separate sources of serial data to be connected to separate banks of 18 devices. The module is ideal for performing bulk testing of any device that relies on a serial data communications port to load software or control the device operation. It can also be used for a variety of other applications where ever a 2-pole low power MUX is required.
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Windows Driver & SDK for ADLINK USB DAQ Series Data Acquisition Modules
UD-DASK
ADLINK DASK drivers are the device drivers for custom data acquisition applications for Windows. The DASK driver libraries provide API sets for ADLINK PCI ExpressR, PCI, CompactPCI, PXI and USB data acquisition cards, to access full hardware functionalities, such as buffered/double-buffered data acquisition, pattern generation, digital input/output and etc. For novice users, the built-in CodeCreator utility helps you create your first program in just a few minutes.
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Bi-Sector Array Antennas
*Dual 33 degree beam antennas with a 65 degree pattern foot print*Multi-band capable*IIndependent tilt control for each beam**RemoteElectricalTilt (AISG 2.0)*Increase site capacity & data throughput
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Compact Anechoic Chambers
If you have mmmwave or THz antenna phased-array that require Over the Air measurements, MilliBox has the equipment and tools that you need. With the help of MilliBox compact anechoic chamber system, you can plot radiation pattern , collect data from those plots, and assess your antenna performance easily and precisely.
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Direct conversion from cycle driven simulation data
Test program generator
Direct conversion from cycle driven simulation data (ATPG scan patterns) (WGL/TDL/STIL) to tester. TDL/WGL/STIL to tester conversion Supports STIL ext 0,1,2 constructs Easy to use and cost effective conversion solution Optimize tester resources usage Supports advanced tester features (Such as Xmode, Multi-port etc’) Compress and minimize vectors count Allow direct tester binary patterns creation
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Acute 48-Channel, 16-Event, 400Mbps, 256Mb/channel, Data/Pattern Generator
Acute DG3064B
Model / Data Channel / Event Channel / Pattern DepthDG3064B / 48 / 16 / 256Mb/ch (max)DG3096B / 80 / 16 / 256Mb/ch (max)DG3128B / 112 / 16 / 256Mb/ch (max)
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Pattern Converter for WGL/STIL to ATE
VectorPort
VectorPort is a versatile, low-cost test development tool for converting WGL or STIL vectors to targeted ATE tester formats, including pattern, timing, and pinmap data. VectorPort can read and write all major formats in both parallel (Flat) vectors and serial (SCAN) vectors.
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Acute 112-Channel, 16-Event, 400Mbps, 256Mb/channel, Data/Pattern Generator
Acute DG3128B
Model / Data Channel / Event Channel / Pattern DepthDG3064B / 48 / 16 / 256Mb/ch (max)DG3096B / 80 / 16 / 256Mb/ch (max)DG3128B / 112 / 16 / 256Mb/ch (max)
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ARM Elevator Board
MS 1517
- Works with 2 wires, supplied with landing displays and communication with "CAN" processor- Provides field-proven perfomance, lifetime support commitment.- Remote communication with modem and suitable software enables user to download the system history from remote location- Monitor and control elevators inn real time-across campus or country.- Group Control Available upto 64floors and 6 cars.- Displays car and hall calls, waiting times and Data Log Information on a color screen.- Stores information during the working day.- Self learning call allocation, allows system to read day by day call history and respond to the unexpected travel patterns from previous experience
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Dual Channel Bit Synchronizer for Rates up to 45 Mbps
LS-45-DB
The Lumistar LS-45-DB Dual Channel Bit Synchronizer Daughterboard provides optimal reconstruction of a serial PCM data stream that has been corrupted by noise, phase jitter, amplitude modulation, or base line variations. The all-digitaldesign assures a high performance, consistent product, with excellent reliability and long-term stability. Dual channel design can feed each channel of the LS-55-DD dual decom. The LS-45-DB also has a post D combiner that allows for optimal ratiocombining of the two input signals A unique Built-in-Test feature allows performance verification for the Bit Synchronizer to ensure the highest level of operation. Auto-test BIT is performed for a short duration on the application of power and tests more than 90% of the Bit Synchronizer components. This test verifies that power is properly applied, verifies that there are no internal bit errors, and performs other tests to ensure that the bit synchronizer is fully operational with status indication of results. Command-test BIT performs the same functions and can be initiated by the user at any time through the Lumistar software when used on Lumistar PC products. The user has the ability to generate internal pseudo-random patterns and calculate internal bit error rates with or without the injection of forced errors.Various status indicators are also available through the software. The Bit Synchronizer also contains a BER reader as well as frame sync pattern indicator.
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RF & Microwave
Data Patterns has a strong RF and Microwave engineering capability, featuring a team of enthusiastic engineering talent, substantial investments in RF test and measuring instruments, and attitude to utilise the latest technologies.An in-house manufacturing capability and an insatiable demand for fulfilling requirements of Radar, Electronic Warfare and Communication domains, Data Patterns has developed a whole line of building blocks including TR Modules, Up and Down Converters, Power Amplifiers, Transmitters, Combiners and Dividers for specific requirements. A list of products is given below.
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Display Color Analyzer
Model 7123
Luminance and chromaticity measurement of Color Display0.005 cd/m2low luminance measurement (A712301)Wide luminance range: 0.0001 to 25,000 cd/m2 (A712301) 0.01 to 200,000 cd/m2 (A712302)High accuracy measurementMaximum 9 display modes: xyY, TΔuvY, u’ v’ Y, RGB, XYZ, Contrast, ProgramAble to control Video Pattern Generator and UUT (Unit Under Test)Built-in contrast measurement function to calculate the contrast ratio directlyEquipped with programmable test items that can complete the planned tests with one single buttonSupport USB flash disk that can copy the test procedures to other station for useJudgment function embedded to judge the test result automatically with one single buttonCalibration period setting and reminding functionMemory for storing 100 channels of standard color data and calibration dataBuilt-in flat display calibration data LCD-D65 & LED-D65* to be applied for chromaticity measurement instantlyOptional display white balance alignment system can be used to integrate all optical test stations to one single station
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PCIe-6536B, 32-Channel, 25 MHz, 100 MB/s Digital I/O Device
782630-01
The PCIe-6536 can continuously stream data over the PCI Express bus. It's an ideal solution for interfacing and testing image sensors or display panels. The module is also well-suited for other common digital applications such as pattern I/O, change detection, protocol emulation, or other custom digital interfacing. It features selectable voltage levels and per-channel directional control of the digital lines.
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Full Wafer Test System
FOX-1P
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Test Pattern Generator Delay & AV Sync Analyzer
VQDM-100
Versatile compact and robust multi-purpose tool for R&D and glass-to-glass QA/QC Instant visual-aural quality estimation plus automatic latency, AV sync and 3D LR sync measurement Multi-channel time-line analysis, including video frames continuity testing 4 Light Sensors with vacuum caps, 4 Audio inputs (standard line levels) 2 channels of AV timing analysis, simultaneous measurements of Video and Audio Latencies Real time multi-channel data acquisition via USB port Unique sophisticated set of static and dynamic test patterns up to 1080p@60fps - see more details in separate VQL page Source of VQDM, VQMA2, and VQMA3 Test Patterns for VideoQ Analyzers Multi-format digital and analog AV outputs: HDMI, YPrPb, S-video, SPDIF, LR analog audio Networkable unit, easy expansion with any external USB storage device: live clips, user content, etc.
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Film Thickness Mapping Systems
Angstrom Sun Technologies, Inc.
Spectroscopic reflectometer mapping (SRM) tools are for industry or lab routine thin film uniformity measurement. This is relatively low cost and easy to use setup. Mapping size can be configured from 2" to 18" if needed. Dependent on film thickness range, a broad wavelength range can be configured within DUV, Vis and/or NIR range. A user-friendly software interface allows you to define various mapping patterns to map. A CCD array based detecting and data acquisition mechanism offers fast measurements. 2D/3D data presentation gives user option to quickly generate reports.
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PXIe-6537, 32-Channel, 50 MHz, 200 MB/s PXI Digital I/O Module
779989-01
32-Channel, 50 MHz, 200 MB/s PXI Digital I/O Module—The PXIe‑6537 can continuously stream data over the PXI Express bus. It's an ideal solution for interfacing and testing image sensors or display panels. The module is also well-suited for other common digital applications such as pattern I/O, change detection, protocol emulation, or other custom digital interfacing. It features selectable voltage levels and per-channel directional control of the digital lines.
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Pattern Generator
PI-2005
As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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PCIe-6535B, 32-Channel, 10 MHz, 40 MB/s Digital I/O Device
782629-01
The PCIe-6535 can continuously stream data over the PCI Express bus. It's an ideal solution for interfacing and testing image sensors or display panels. The module is also well-suited for other common digital applications such as pattern I/O, change detection, protocol emulation, or other custom digital interfacing. It features selectable voltage levels and per-channel directional control of the digital lines.
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Microsoft Graph Data Connect
Microsoft Graph is the Microsoft 365 data that describes the patterns of productivity, identity, and security in an organization. Microsoft Graph Data Connect offers developers a highly secure, efficient way to copy Microsoft Graph datasets, at scale, into Azure Data Factory. It's an ideal way to train AI and machine learning models that uncover rich organizational insights and deliver new value to your productivity solutions.
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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Read-Write Analyzers
Guzik Read/Write Analyzers (RWA) work in conjunction with Spinstands to write data to the disk media and read back the signal for detailed analysis. We have two RWA-4000 series available for For Two Dimensional Magnetic Recording (TDMR) and non-TDMR technologies. The RWA 4000 series offer upto 8Gbit/sec maximum write data rate and 3.5 GHz analog bandwidth for all parametric measurements. Each RWA features a pattern generator with 1psec resolution of bit pre-compensation and supports PRML chip integration. Servo writing and processing is provided for Guzik Spinstand models. Select the pre-amplifier (UP14) as well as a variety of enhancements including programmable filters and PRML chip adapters.
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CMOS/CCD Production Test System
System 1828
The basic system consists of a 225 MHz pattern generator, 10 clock drivers, 6 DC biases, 1-4 channels of 10 MHz 14 bit analog data acquisition and/or 1-4 channels of digital acquisition. Additional options can be added to customize the system to meet your requirements.
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Infrared Thermometer Smart and Wireless Probe
805i
The testo 805i Smart Probe is an infrared (IR) thermometer that provides non-contact temperature readings; great for checking breakers, motors, ducts, and registers from a distance. The measurement area is indicated by a circular laser pattern which asssures accurate targeting measurement. Use the testo Smart Probes App to take photos of objects and include the laser pattern and the temperature reading for your reference. Easily adjust the emissivity within the App and store data as files or share via text or email. The testo 805i works on smart devices with either Android or Apple operating systems.
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kSA 400
The kSA 400 puts the power of Reflection High-Energy Electron Diffraction (RHEED) at your fingertips. Whether analyzing a static diffraction pattern, or acquiring data during high-speed substrate rotation, the kSA 400 helps you exploit the valuable wealth of information contained within the RHEED pattern.
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PAM4 Bit Error Rate Tester
Shenzhen Golight Technology Co.,Ltd
Golight PAM4 BERT integrates a 4-CH or 8-CH multistage pulse pattern generator (PPG) and a highsensitivity error detection (ED) to achieve BER measurement of data transmission in 200Gbps and 400Gbps. PAM4 BERT provide the best solution for automated production testing of 200G and 400G highspeed optical transceiver.
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FMC, XMC & PMC
The FPGA Mezzanine Card is used by Data Patterns to implement signal interface with external world compatible FPGAs mounted on the FMC carrier there are primarily used for high speed analog interface for digitization (ADCs) and waveform generation (DACs). This form factor is also utilized for special I/O Interfaces such as various avionic protocols and buses. FMC I/O signals may be routed via front panel connectors or through Mezzanine connectors that route the signal back to the carrier board for routing through rear I/O of the Chassis. The system interface is designed for routing to FPGAs using a VITA 57 0.05 Pitch Terminal Array Assembly.
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Signal, Spectrum, & Modulation Analyzers
A tool used to analyze data. For example, a gas analyzer[1] tool is used to analyze gases. It examines the given data and tries to find patterns and relationships. An analyser can be a piece of hardware or software.
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PXI Digital Waveform Instrument
PXI Digital Waveform Instruments feature up to 32 channels, can sample and generate digital waveforms at up to 200 MHz, and interface with various standard TTL and low-voltage differential signals (LVDS), as well as settable voltage levels. These devices offer per clock cycle, per channel bidirectional control, and phase shifting. They include deep onboard memory with triggering and pattern sequencing. Some models also support doubledatarate (DDR) technology and real-time hardware data comparison. You can use Digital Waveform Devices to create device simulation and complex stimulusresponse tests.
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3D Inline Solder Paste Inspection System
TROI 7700 SERIES
Using Moire' pattern, Pemtron's three-dimensional lead applicationdosage tester combines 2D color images with 3D measurement data toprovide more detailed, near-real PCB images, unlike traditionalcolor maps. We will also provide you with the best solution forhigh-quality and high-precision PCB production with a varietyof statistical programs, along with information you need toquickly and accurately judge positive/failure.
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PXIe-6535, 32-Channel, 10 MHz, 40 MB/s PXI Digital I/O Module
780695-01
32-Channel, 10 MHz, 40 MB/s PXI Digital I/O Module—The PXIe‑6535 can continuously stream data over the PXI Express bus. It's an ideal solution for interfacing and testing image sensors or display panels. The module is also well-suited for other common digital applications such as pattern I/O, change detection, protocol emulation, or other custom digital interfacing. It features selectable voltage levels and per-channel directional control of the digital lines.
