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Surface Roughness
the texture of a surface; Ra value.
See Also: Roughness, Surface Roughness Testers, Profilometers, Surface Profile
- Virginia Panel Corporation
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Tool, Extraction, 50 Ohm Coax & Power Surface
910112112
Tool, Extraction, 50 Ohm Coax & Power Surface
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Spectroscopic Ellisopmeter for Simple Thin Film Measurement
Auto SE
The Auto SE is a new thin film measurement tool that allows full automatic analysis of thin film samples with simple push button operation.Sample analysis takes only a few seconds and provides a complete report that fully describes the thin film stack – including film thicknesses, optical constants, surface roughness, and film inhomogeneities.
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Optical Tensiometers
Theta Topography
Theta Topography is an innovative system capable of separating the effect of surface roughness to the contact angle result. As a result, roughness-corrected contact angles can be better compared with each other for research and quality control purposes.
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3D Optical Profilers
ZYGO's 3D Optical Profiler instruments enable precise, quantitative, ISO-compliant, non-contact surface measurement and characterization of micro- and nano-scale surface features, capturing up to two million data points in just seconds. Applications range from topography and waviness to roughness and microstructure characterization on samples as that vary from ultra-smooth sub-angstrom optical surfaces, to extremely rough and diffuse 3D printed surfaces.
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Profilometer
MicroCam™
MicroCam™ fiber-based optical non-contact 3D profilometers deliver: High-Speed Non-Contact Surface and Cross-Sectional Inspection 3D Online Measurements, GD&T and Imaging Long Stroke Profilometry with Sub-Micron Resolution Thickness, Roughness and Vibration Measurements Fiber-based Probes which reach into Bores, Tubes, and Crevices
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CMP Tester
CP-6
The state of the art Rtec CMP tester CP-6 allows to study and characterize CMP process like never before. In addition to polishing wafers & substrates the tester comes with inline surface profilometer. This combinations sheds information on why and how the surface, friction, wear etc. changed. Tester also measures several inline parameters such as friction, surface roughness, wear volume etc. to understand the process in detail.
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Surface Roughness Gauges & Testers
Surface roughness gauges are used for measuring the surface roughness of a material. GAOTek’s surface roughness gauges are reliable, high quality, and affordable instruments that provide an accurate measurement. They are an efficient and quick means for inspection or testing. Our gauges are compact, easy to carry and portable, allowing the user to work in complex conditions, and are available for sale to the United States, Canada and globally.
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Roughness Testers
Roughness is an important parameter when trying to find out whether a surface is suitable for a certain purpose. Rough surfaces often wear out more quickly than smoother surfaces. Rougher surfaces are normally more vulnerable to corrosion and cracks, but they can also aid in adhesion. A roughness tester is used to quickly and accurately determine the surface texture or surface roughness of a material. A roughness tester shows the measured roughness depth (Rz) as well as the mean roughness value (Ra) in micrometers or microns (µm). Measuring the roughness of a surface involves applying a roughness filter. Different international standards and surface texture or surface finish specifications recommend the use of different roughness filters. For example, a Gaussian filter often is recommended in ISO standards.
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Contour And Surface Measuring Machines
The contour and surface measuring machines from ZEISS offer different, sometimes combinable sensors for roughness measurements, contour measurements or both. The contact-free linear drive makes these machines highly efficient and low-maintenance.
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Optical Tensiometers
Theta Flex
Attension® Theta Flex is a contact angle meter that enables all measurements in one instrument for both research and quality control. It measures static and dynamic contact angle, 3D surface roughness, surface free energy, surface and interfacial tension, and interfacial rheology.
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Solar Radiation (Sunshine) Test
This test determines the effects of direct solar radiation on components and material. The heating effects of solar radiation differ from those of high air temperature in that the amount of heat absorbed depends on the roughness and color of the surface on which the radiation is incident and the angle of incidence to the sun. Variations in the intensity of solar radiation over the surface of the component, may cause components to expand or contract at different rates, which can lead to severe stresses and loss of structural integrity. In addition, degradation due to photo-chemical changes can occur such as fading of color, deterioration of natural and synthetic elastomers and polymers. The test items that are subjected to solar radiation testing are those that are exposed to solar radiation during its life cycle, in the open, in warm climates.
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Stylus Profilometers
Tencor™
KLA Instruments™ Alpha-Step®, Tencor P- and HRP®-series stylus profilometers deliver high-precision, 2D and 3D surface metrology, measuring step height, surface roughness, bow and stress with industry-leading stability and reliability for your R&D and production requirements.
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Widefield Confocal Microscope
Smartproof 5
The versatile ZEISS Smartproof 5 widefield confocal microscope is your integrated system for surface analysis: fast, precise and repeatable. Put it to work on a wide range of industrial applications - such as roughness and topographical characterization - that come up every day in QA/QC departments, production environments and R&D labs. This high quality confocal system is driven by the powerful software ZEISS Efficient Navigation (ZEN) to bring you the added benefits of maximum user comfort and increased productivity.
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Optical 3D Measuring Systems & Devices For Your Quality Assurance
As a manufacturer of optical industrial metrology, we offer a broad portfolio of optical 3D measuring systems & devices to support companies in various industries with precise quality assurance in production. Based on Focus Variation technology, our measuring systems not only enable surface roughness measurement, but also the detection of micro-geometries, shapes and structures.
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Surface Roughness Testers
Widely used in production site to measure surface roughness of various machinery-processed parts, calculate corresponding parameters according to selected measuring conditions and clearly display all measurement parameters.
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Line Scan Camera
Piranha4 Polarization
The Piranha4 Polarization™ camera is a breakthrough in the machine vision industry. This high-speed polarization camera features three native polarization states plus an unfiltered channel.The Piranha4 polarization camera extends detection capability in machine vision and is ideal for detecting stresses, surface roughness, film thickness, alloy composition, and 3D profiles.
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Surface Roughness Meter
Shenzhen Graigar Technology Co.,Ltd.
Surface Roughness Tester is powerful, accurate and easy to use. It is ideal for checking large components, structures, auditing batch prior to shipment and production line process control.
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Analytical Services
Atomic Force Microscopy (AFM) allows for sub nanometer resolution imaging of surface topography and is able to quantify surface roughness at the angstrom scale. Our team can give you highly accurate measurements such as surface topography, dopant distribution, magnetic domain features, and a wide variety of other sample properties to give you the information you need to do great work.Park can provide measurements in the following areas:● Topography (surface roughness, grain size, step height, etc.)● Mechanical Properties (stiffness, etc.)● Electrical properties (capacitance, conductivity, etc.)● Thermal properties ● Magnetic properties These properties can be measured in air or liquid, depending on your needs.
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Scanning Probe Microscopy/Atomic Force Microscopy (SPM/AFM Analysis)
Rocky Mountain Laboratories, Inc.
Scanning probe microscopy (SPM) refers to a family of measurement techniques that utilize a scanning probe. The most common measurement is Atomic Force Microscopy (AFM Analysis), which measures surface topography. Imaged areas can be from the nm scale to as large as 100 µm X 100 µm. Heights and depths of features can be measuredand many surface roughness parameters, e.g Ra, can be calculated. 3-D images can also be produced for dramatic data presentation. Magnetic and electrical response can also be measured with SPM.
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Portable Surface Roughness Tester Profilometer
SRG-4000
The latest in state-of-the-art surface roughness testers profilometer, the SRG-4000 is designed with the shop environment in mind. These surface roughness testers profilometer are distinguished by a high level of accuracy, multiple parameters and simplicity of operation. Extremely sensitive and highly accurate readings from this Phase II surface roughness tester are offered via multiple surface roughness profilometer parameters, Ra, Rq(Rms), Rt and Rz.
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kSA BandiT PV
Harness the power of this patented technology to improve your process control. Measure and control uniformity, thickness, band gap, temperature, surface roughness and more.
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Surface Roughness
Surface Roughness: these consist of a stylus attached to an arm which moves over the surface to record and measure the roughness over a specified distance, recording peak-to-valley average.
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Surface Roughness Tester
A precision instrument used to evaluate the texture of a surface, determining whether it is rough or smooth.
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Areal Confocal 3D Measurement
µsurf
The measuring system of the µsurf-product line enable automated 3D surface measurements of roughness, topography, layer thickness and volume. µsurf-measuring systems are available in different designs: from compact mobile systems and laboratory solutions up to multisensor setups on granite portal for use near production lines.
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Rope Testers
The LMA Signal measures loss of metallic cross-sectional area (LMA) caused by corrosion, abrasion, etc. The LMA Signal is quantitative and can be calibrated. (Typically, a rope must be retired when the LMA exceeds 10%).The WRR Signal measures wire rope roughness (WRR). WRR is defined as the aggregate surface roughness of all wires in a rope. WRR is typically caused by and indicates internal and external corrosion pitting, broken wires and clusters of broken wires. The WRR signal is quantitative, and it is calibrated together with the LMA Signal.The LF Signal can indicate localized flaws (LF), for example, broken wires, corrosion pitting, etc. Because it is only qualitative - and cannot be calibrated - it is of limited value for assessing rope deterioration and for making rope retirement decisions.
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Digital Surface Profile Gauge
NOVOTEST SP-1M
Digital Surface Profile Gauge NOVOTEST SP-1M is designed for profile measuring on either flat or curved surfaces. Also it can be used for measurements of surface roughness (Rz), after abrasive blasting pre-painting work.
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Substrate Thickness, Warp, and TTV Measurement
413 Series
Substrate Thickness, Warp, and TTV Measurement- with or without Tape- for Wafer Backgrind and Etch Thinning processes.Non-contact Echoprobe Technology.Thin film and surface roughness options.
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Roughness Tester
Compatible with four standards of site to measure surface roughness ofvarious machinery-processed parts, calculate corresponding and clearly display allmeasurement parameters. When measuring the roughness of a surface, the sensor is placed on the surface and then uniformly slides along the surface by driving the mechanism by the sharp built-in probe. This roughness causes displacement of the probe which results in change of inductive amount of induction coils so as to generate analogue signal, which is in proportion to the surface roughness at output end of phase-sensitive rectifier.
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PCB Material Characterization
N19308B
PLTS N19308B extends the N19301B base product to perform PCB material Dk/Df and surface roughness characterization.
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Spectroscopic Ellipsometry
Spectroscopic ellipsometers measure film thickness and refractive index of single layers, and multi‑layer stacks. Related properties of bulk materials, isotropic and anisotropic materials, surface and interface roughness as well as gradients can be analysed.
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Stylus Profilometry
Dektak®
Bruker's Dektak stylus profilers are the product of over four decades of proprietary technology advances. They provide repeatable, accurate measurements on varied surfaces, from traditional 2D roughness surface characterization and step height measurements to advanced 3D mapping and film stress analyses. Dektak surface profilers have been widely accepted as a superior solution for measuring thin film thickness, stress, and surface roughness and form in applications ranging from educational research verification to semiconductor process control.
