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- Grund Technical Solutions, Inc.
product
Manual Test Solution
Titan
Grund Technical Solutions, Inc.
Titan is an easy to use, low cost Human Body Model (HBM) or Machine Model (MM) manual test solution. It can be used for design, engineering, and characterization of your devices. Ranging from 50 V to 16,000 V the Titan will have the largest voltage range of any HBM tester.
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Nanomechanical Test Instruments for Microscopes
Bruker has developed a comprehensive suite of nanomechanical and nanotribological test instruments that operate in conjunction with powerful microscopy techniques. Combining the advantages of advanced microscopy technologies with quantitative in-situ nanomechanical characterization enables an accelerated understanding of material behavior at the nanoscale.
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Temperature Calibration Software v5.1
MET/TEMP II
MET/TEMP II software allows you to easily automate the calibration of a wide range of temperature sensors. It provides a comprehensive temperature calibration solution that allows you to test large quantities of sensors, calculate characterization coefficients, and print calibration reports. You can standardize comparison or fixed point calibrations and use multiple temperature sources or references in one test.
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Bit Error Rate Tester - MATRIQ
The BERT is 2 or 4-channel PPG and Error Detector for the design, characterization and production of optical transceivers and opto-electrical components at data rates up to 30 Gb/s.With scalability and exceptional signal fidelity, it is a cost effective test solution for 400 Gb/s communication eco-systems.
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Deep-Level Transient Spectroscopy System
FT 1030
The Deep-Level Transient Spectroscopy has grown up to a most powerful tool for semiconductor characterization with unbeaten sensitivity in trap concentration detection and high efficiancy in impurity parameter determination.
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3D Optical Profilers
ZYGO's 3D Optical Profiler instruments enable precise, quantitative, ISO-compliant, non-contact surface measurement and characterization of micro- and nano-scale surface features, capturing up to two million data points in just seconds. Applications range from topography and waviness to roughness and microstructure characterization on samples as that vary from ultra-smooth sub-angstrom optical surfaces, to extremely rough and diffuse 3D printed surfaces.
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Static Image Analysis System Particle Size
PSA300
The HORIBA PSA300 is a state of the art turn-key image analysis solution. Seamless integration of Clemex's powerful particle characterization software and an automated microscope with high-resolution camera creates an intuitive, easy-to-use imaging workstation. Addressing a need in the field of particle characterization, the PSA300 is a versatile particle size and particle shape analysis tool that can be used in a wide range of applications in the pharmaceutical industries and material science. It is a turn-key solution for labs that want to maintain an analytical microscopy environment with minimum intervention by the operator yet still yield maximum detail in the results.
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High Voltage Optically Isolated Probe, 350 MHz Bandwidth. Includes soft-carrying case.
DL03-ISO
The DL-ISO enables highest confidence in GaN and SiC device characterization with highest accuracy, best signal fidelity, and comprehensive connectivity.
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Open Top BGA Sockets
Ironwood has the most comprehensive collection of open top BGA and QFN sockets that can be used for qualification application, silicon FIB testing, system development, thermal characterization, burn-in application, etc. IC socket can be defined as an electromechanical device, which provides removable interface between IC package and system circuit board with minimal effect on signal integrity. Typical packages include BGA, LGA, QFN, QFP, WLCSP, etc. Open top allows access to the top side of IC. Below is an example BGA socket that uses low cost elastomer contact technology.
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Power Measurements For The 3000A/T/G X-Series
D3000PWRB
The power software package for Keysight’s InfiniiVision 3000A, 3000T, and 3000G X-Series oscilloscopes enables a broad range of automated power supply characterization measurements including critical frequency response measurements (3000T/G X-Series only) such as power supply rejection ratio (PSRR) and control loop response. This package also enables hardware-based pass / fail mask testing and USB PD triggering and decode (3000T/G X-Series only).
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Image Sensor Characterization Systems
Image Sensor QE and Spectral Responsivity Characterization
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Variable Angle Spectroscopic Ellipsometer
VUV-VASE
The VUV-VASE variable angle spectroscopic ellipsometer is the standard in optical characterization of materials used in lithography applications. Its measurement range spans vacuum ultraviolet (VUV) to near infrared (NIR). This provides incredible versatility to characterize numerous types of materials: semiconductors, dielectrics, polymers, metals, multilayers and now liquids such as immersion fluids.
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Pulse Pattern Generator, 3.35 GHz, dual-channel
81134A
When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. On top of that, it allows to generate application-specific signal levels like pre- and de-emphasis (PCI Express) or squelch (Serial ATA). The Keysight 81134A lets you test your DUT instead of the pulse or data source!
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OTDR
EXFO-100
Hangzhou Softel Optic Co., Ltd.
* Top user-friendliness: one-button testing, combined with EXFO’s proprietary FTTx software package (macrobend/fault finder, pass/fail indicators)*Multiple options, including power meter, visual fault locator (VFL), fiber inspection probe, printer and IP testing*Fault Finder mode, for quick identification/location of a fiber break*Complete connectivity flexibility: USB stick compatibility and USB cable data download via ActiveSync**Advanced TFT transflective color display, for assured legibility under direct sunlight or in other demanding outside conditions*Handheld, small, lightweight unit: 1 kg (2.2 lb)*Built-in ruggedness for outside-plant usage*Troubleshooting option, enabling in-service, out-of-band network testing *EXFO’s AXS-100 Access OTDR combines the industry’s leading OTDR technology with power meter functiona lities in one powerful handheld unit.Optimized for testing passive optical networks (PON) within FTTx architectures, it offers several wavelength configurations and a wide range of options, for first-class flexibility. Use it at the optical network terminal(ONT), drop terminal or fiber distribution hub (FDH) for FTTH distribution(F2) fiber characterization, troubleshooting and fault locating.
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Terahertz Spectroscopic System
TAS7400
The TAS7400 product line offers a series of low-cost, all-purpose spectroscopic systems that enable spectroscopic measurements using terahertz (THz) waves. The tools are capable of performing non-destructive analysis on a wide variety of sample types, making it applicable to a broad range of fields from life sciences to electronics, where precise chemical and material characterization is critical. The systems are ideal for settings ranging from basic research to product development, as well as for manufacturing and quality control, and employ easy-to-use spectroscopic methods that do not require specialized knowledge of THz wave generation or optics.
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Switches
Whether you are performing high-accuracy, low-speed measurements on a dozen test points or high-channel, high-frequency characterizations of integrated circuits, National Instruments delivers a flexible, modular switching solution based on PXI or SCXI to help you maximize equipment reuse, test throughput, and system scalability.
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Unitary Tests
High accuracy Schering bridge for the measurement of capacitance and dielectric dissipation factor (tan d) for the characterization of dielectric insulators, calibration of standards and manufacturing test of all industrial equipment.
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Autocorrelators
From material processing to scientific and medical base research, ultrafast laser systems are used in many areas of their high peak intensity and extremely short pulse width. One relevant area of application is time resolved spectroscopy. The pulse width is a critical factor for the adjustment of these laser systems and the characterization of experiments.
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Active Device Characterization Solution Up To 67 GHz
N5247BM
The N5247BM provides the N5247B 67 GHz PNA-X network analyzer, application software and accessories for active device characterization up to 67 GHz.
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Liquid Cooling High Amp
qCf 12 High Amp
qCf Liquid Cooling High Amp: Our system for the professional characterization of fuel cells for high current densities and direct flow field cooling.
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Antenna Characterization
Radiometrics Midwest Corporation
Radiometrics Open Area Test Site and 10 Meter Anechoic chamber provide ideal test sites for antenna characterization.
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TF Analyzer
The TF Analyzer platform is the heart of the modular and flexible measurement systems for the characterization of piezoelectric materials.
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TLP Tester
Tokyo Electronics Trading Co., Ltd.
A method for semiconductor characterization of Electrostatic Discharge (ESD) protection structures.
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Fiber Geometry System
2400
The 2400 Fiber Geometry System is designed to provide high-speed automated measurements of optical fiber end-face geometry. Repeatable and accurate measurement of parameters such as core and cladding diameter, core and cladding non-circularity, as well as core-cladding concentricity provide invaluable process control information, and ensure that customer demands for low loss fiber splices are satisfied. Measurement options are available for both side view coating geometry measurement and fiber curl characterization.
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Probe Card
T40™ Series
Ultra low noise and fast settling modeling and characterization tests are made possible by Celadon’s patented ceramic probe cards.
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Frequency-Resolved Optical Gating Pulse Analyzer
IQFROG
The IQFROG measures pulse intensity and phase in both spectral and temporal domains, yielding a complete pulse characterization. With its long delay arm and high resolution spectrometer, it measures chirped pulses up to 50 ps wide, or up to 10 ps wide if the pulse is transform limited. The IQFROG is available in 1.0 and 1.5 micron wavelengths.
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Arbitrary Load-Control Device Characterization
S94522B
The S94522B Arbitrary Load Control Device Characterization application. Ideal for bare transistor compact modeling. Generate Keysight’s DynaFET compact model or use large signal waveform data to generate models.
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PNA-L Microwave Network Analyzer
N5231B
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to 13.5 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
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Modulation Distortion Up To 70 GHz
S930707B
S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
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Test House Services
Microtest provides complete test house services in a clear room equipped with the state of the art handler and wafer probing system using its own innovative ATE.The test house operates in hot, cold and room temperature for both production and characterization test.Innovative reliability system for Burn In and HTOL ServicesStatistical analysis is performed for digital and mixed-signal devices.Microtest Pacific Test house is located in Malacca (Malaysia).
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Nanomechanical Test Systems
Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
