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Logic Probes
Analyze the logic state of a digital circuit.
- Optomistic Products
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Probe “Socket” Clamps
LCP-S12
A simple and cost-effective option for mounting Small-aperture Probes in the probe plate. A Socket Clamp tool is needed for insertion and removal of the clamp in the probe plate
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LPDDR3 178-ball BGA Interposer For Logic Analyzers
W3301A
The W3301A LPDDR3 rigid BGA interposer for LPDDR3 178-ball DRAM enables capture of simultaneous read and write traffic at data rates in excess of 1866 Mb/s. E5406A Soft Touch probes and U4201A cables connect the W3301A LPDDR3 BGA interposer into the U4164A logic analyzer module. The W3301A LPDDR3 178-ball rigid BGA interposer allows signal access to the LPDDR3 signals critical to your debug and validation effort through a U4164A logic analyzer. The probe works in existing designs and eliminates the need for up-front planning or redesign. The probe connects directly to the balls of the DRAM using a LPDDR3 178-ball riser (included) or an optional 3rd party socket (not provided), enabling operation and acquisition of LPDDR3 signals.
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LASAR Post Processor, Run Time And Diagnostic Test Solution
DtifEasy Series
DtifEasy is a full-featured tool set for importing, converting, and executing IEEE-1445 compliant digital test vectors generated by a LASAR simulation. All four IEEE-1445 file types - UUT model group, Stimulus and Response group, Fault Dictionary group, and Probe group are supported by DtifEasy; providing the user with the ability to execute go/no-go, fault dictionary, and guided probe sequences. DtifEasy supports MTS' 3U PXI GX529x series of dynamic digital instrumentation to 200 MHZ as well as the 6U PXI GX5960, 50 MHz digital instrumentation. All of these instrument families are compatible with the digital logic probe.
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Logic Analyzer
TLA7000
The modular TLA7000 Logic Analyzer Series provides the speed and flexibility you need to capture logic detail on today's fastest microprocessors and memory designs. Pinpoint the source of elusive errors and gain the visibility you want with large easy-to-read displays, fast data throughput, and time-correlated views of analog and digital signals through the same probe.
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Logic Analyzer Probe
FS2512
The FS2512 is a logic analyzer probe used to test DDR4 SO-DIMM memory. When used with the triggering and analysis capabilities of Keysight’s U4154A/B/64A logic analyzer modules, it gives the user an extremely effective tool for debugging, testing and verifying DDR4 SO-DIMMs.
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Complete Data Acquisition System
ScopeLogicDAQ
ScopeLogic - complete data acquisition system - consists of Digital Oscilloscope and Logic Analyser. This small instrument is making the accurate analysis of complex analog-digital signals possible - thanks to simultaneous sampling finding relationship between these signals is easy. The user is able to simultaneous use 16 digital channels and 2 analog channels with standard scope probes.
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Semiconductor Test Equipment
Wewon Environmental Chambers Co, Ltd.
Probe card manufacturing need the semiconductor test equipment. When we designed the thermal testing equipment, Only some commonly used test items are packaged into the IC tester, and the logic function of the verification chip is implemented in a fixed test mode. But as chip products diversify, Some thermal inducing system can no longer do it alonehttps://www.wewontech.com/semiconductor-test-equipment/
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Logic Analyzers
Verification and debug of today's high speed, low voltage digital signals requires probing solutions that can accurately acquire from a wide variety of electronic designs and protect signal fidelity. Tektronix logic analyzer probes contain a variety of connectivity options that are engineered to ensure that signal acquisition is a true reflection of your design's performance. Compare and learn more about Tektronix logic analyzer probe solutions.
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T3DSO2000HD Series Oscilloscopes
T3DSO2000HD Series
The Teledyne Test Tools T3DSO2000HD Oscilloscopes feature four channel bench models with analog bandwidth options of 100 MHz, 200 MHz and 350 MHz all with 12 bits of vertical resolution. The series offers both DSO and MSO configured models with the MSO units having a 16 channel logic probe as standard. Each model offers a maximum sample rate of up to 2 GSa/s sample rate (interleave mode), and a maximum memory depth of 200 Mpts in interleave mode.
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Probing Adaptors
Accessories primarily enable the connection between an industry standard logic analyzer footprint (D-Max, Mictor, P6860, etc) and an instrument probe. For example, a connection between a D-Max footprint and the digital channels of an MSO (Mixes Signal Oscilloscope). They can also enable the interconnect of a probe to a different industry standard footprint. Adding flying leads to a probe designed for a mictor footprint and a probe tester are also some of the accessories that are available.
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S2 Blinx Digital Sensors
ULP-S2 BLINX
The Universal LightProbe S2 Blinx Digital is designed for the simple ON/OFF test of any color blinking or steady-state LED, for fast results with a digital output. The Universal LightProbe S2 Blinx Digital Sensors check the ON/OFF status of any color LED, whether stable or blinking/pulsed, up to a rate of 15 Hz, and provide a Logic “1” output (5 volts) only if the LED is “ON” and a Logic “0” if the LED is “OFF.”Operating temperature range: 0oC to 70oCPower consumption: Operates from +5, 12, 24 or 28 volts D.C., at 6mA max.Voltage protection: Withstands up to +40 volts, & reverse polarity to -18 voltsSignal Output Load: 20mA max. (Source/Sink). Non-inductiveOutput Pins: 3 gold-plated standard wire-wrap pins (0.025 in. sq.)Sensor Size: 0.560 in. dia x 1.38 in. longOperating Temperature Range: 0hC to 70hCTypical response times: <66mS, shorter for brighter LEDsFiber-Optic Probes: Wide Aperture Fiber-Optic Probe recomended
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Protocol Analyzer
BusFinder
*PC-based, 64 channels*USB 3.0 interface, 12V power adaptor*32Gb total memory*Protocol Analyzer：eMMC5.1, NAND Flash, SD3.0, SD 4.0 (UHS-II)*Logic Analyzer：eMMC5.1, NAND Flash, SD3.0, Serial Flash, SPI NAND, SPI*Each protocol has its own probe for easier connection, higher capture quality*Two sets of voltage detects to detects voltage changes
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Cantilever Probe Card
MPI Cantilever Probe Card is widely applied on gold bump and pad wafer testing for display driver, logic, and memory device. MPI’s cantilever probes are the corresponding answer to the demands of fine pitch, small pad size, high speed, less cleaning, multi-DUT, high pin count, and ultra-low leakage requirements. With outstanding craftsmanship, innovative architecture and proven methodologies based on mechanical and electrical simulation/measurement results, making MPI the top cantilever provider worldwide.
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Eclipse Test Development Environment
The Eclipse Test Development Environment automatically creates tests that are used to bring up new products in the lab. Failures can be quickly debugged using software tools such as the Eclipse Timing Diagram Analyzer and the Schematic Logic Probe.
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Oscilloscope, 200 MHz, 2 GS/s interleaved, 4 CH, 200 Mpts/Ch DSO, Fully Loaded with 10.1" Color Display
T3DSO2204HD
The T3DSO2000HD series of Bench Oscilloscopes feature 4-channel models with analog bandwidth options of 100 MHz, 200MHz and 350 MHz. The T3DSO2000HD Oscilloscopes use 12-bit high resolution ADCs and a low noise front end which provides an impressive noise performance to cover a wide range of measurement applications. Each model offers a maximum sample rate of 2 GSa/s (interleaved) and a maximum memory depth of 200 Mpts in interleave mode. The MS configured models also include a 16 channel logic probe as standard.
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Logic Analyzer Probe, 20 MHz, 4VDC to 18VDC
72-190
A compact and lightweight probe for the analysis and troubleshooting of logic circuits. The probe will recognise high, intermediate and low level pulses in DTL, TTL, HTL and CMOS logic circuits. Works as a pulse detector, pulse stretcher and a pulse memory.
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Active FET Probe Kit 1.2 GHz, 10x, ±40 V
CT4121
The CT4121 is a compact FET probe with very high input resistance and low input capacitance. With a 1.2 GHz bandwidth, this probe is ideal for timing analysis or troubleshooting high speed logic circuits, for design verification of disk drives, as well as for wireless and data communication design.
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Computer Safe Automotive Logic Probe
TE6-0718
Hangzhou Tonny Electric & Tools Co., Ltd.
*For use on 6V, 12V and 24V DC systems*Tests high and low voltages on all vehicle circuits, including computerized engine and body controls*Dual color LED indicates red for power and green for ground
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Cantilever Probe Cards
Venture
Nidec SV Probe’s VentureTM line of cantilever probe cards represents the finest epoxy technology on the market and are perfect for logic testing. The Venture line includes an extensive array of cantilever cards, single to multi-die for a variety of test systems. Other capabilities include: • 3K Points • Pad Pitches as Tight as 35µm • Up to 32 DUTsContact your Nidec SV Probe sales representative to determine which VentureTM product is right for your testing application.
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DIMM Interposer Probe
FS2361
The FS2361 is a logic analyzer probe used to test DDR3 DIMM memory. When used with the triggering and analysis capabilities of Keysight’s U4154/64 Logic Analyzer modules, it gives the user an extremely effective tool for debugging, testing and verifying DDR3 DIMMs.
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BitScope Micro Oscilloscope & Analyzer
BS05
20 MHz Bandwidth.40 MSps Logic Capture.2 Analog Scope Channels.2 Analog Comparator channels.6 Logic/Protocol Analyzer channels.8 & 12 bit native analog sample resolution.Decodes Serial, SPI, I2C, CAN and more.Windows, Linux, Mac OS X & Raspberry Pi.Built-in analog waveform & clock generators.User programmable, C/C++, Python, VM API.Tiny, light weight (14g) and water resistant.Standard oscilloscope probe adapters available.
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Programmable Multifunction Generator
IST 5800/5850
IST Information Scan Technology, Inc.
The IST-5800 series programmable multifunction generator is an exceptionally versatile and economical instrument for applications in R&D, Manufacturing Test, Service Repair and Training. Featuring an adjustable triple output power supply and waveform generator, it has the ability to provide power and signal sources for a circuit while the universal logic probe, auto-ranging frequency counter, and digital voltmeter allows you to simultaneously analyze and measure circuit activity.
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Logic Analyzer Probe
FS2510AB
The FS2510AB is a logic analyzer probe used to test DDR4 DIMM memory. When used with the triggering and analysis capabilities of Keysight’s U4154A/B/64A logic analyzer modules, it gives the user an effective tool for debugging, testing and verifying DDR4 DIMMs.
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Logic Analyzer
FS2352B
The FS2352B is a logic analyzer probe used to test DDR3 DIMM memory. When used with the triggering and analysis capabilities of Keysight’s Logic Analyzer modules, it gives the user an effective tool for debugging, testing and verifying DDR3 DIMMs. This logic analyzer probe has a CKE qualification circuit that allows for the use of older Keysight logic analysis modules when testing systems using power saving modes.
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Microprocessor Development System
DS-85
* Real-Time and Transparent In-Circuit Emulator * Windows Debugger - Update 2009 * Symbolic Debugger compatible with Intel Object Files * 64K Hardware Breakpoints * 64K of Internal Memory * 32K x 32 Bit Trace Memory and Logic Analyzer with External Probes * Serially linked to IBM PC or Compatible Hosts * On-line Assembler and Disassembler * Source and Listing Windows
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DDR5 Logic Analyzer
FS2601
The FS2601 is one of our newest and fastest logic analyzer probes used to test DDR5 memory. It is designed to work exclusively with 4 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR5 UDIMMs running above 4000MT/s.
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Logic Analyzer Probe
FS2520
The FS2520 is our newest and fastest logic analyzer probe used to test DDR4 DIMM memory. It is designed to work exclusively with 3 Keysight U4164A logic analysis modules operating in either Quad Sample State or Quarter Channel 10GHz timing modes. This gives the user an extremely effective tool for debugging, testing and verifying DDR4 DIMMs running above 4000MT/s. It’s like having a 100 channel scope.
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Logic Probes
Logic probes allow you to capture signals using the logic portion of a mixed signal instrument. Yokogawa offers low and high voltage, isolated and non-isolated logic probes.
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DDR3 X16 Non-Stacked DRAM BGA Interposer For Logic Analyzers
W3636A
The W3636A DDR4 x16 BGA interposer allows you to gain signal access to the DDR3 signals critical to your debug and validation effort through a logic analyzer. The probe works in existing designs and eliminates the need for up-front planning or redesign. The probe connects directly to the balls of the DDR3 x16 non-stacked DRAM or with an optional 3rd party socket (not provided) enabling operation and acquisition of high-speed DDR3 signals without impacting the performance of your design.
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Digital Oscilloscope
DS1000Z
The DS1000Z series of digital oscilloscopes use the Ultravision technology platform, which continues the characteristics of deep storage and high waveform capture rate, and has an excellent cost performance advantage. The innovative DS1000Z Plus series comes standard with a digital channel interface that can be upgraded to a full-featured MSO with the addition of an RPL1116 logic probe.
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Oscilloscope, 100 MHz, 2 GS/s interleaved, 4 CH, 200 Mpts/Ch DSO, Fully Loaded with 10.1" Color Display
T3DSO2104HD
The T3DSO2000HD series of Bench Oscilloscopes feature 4-channel models with analog bandwidth options of 100 MHz, 200MHz and 350 MHz. The T3DSO2000HD Oscilloscopes use 12-bit high resolution ADCs and a low noise front end which provides an impressive noise performance to cover a wide range of measurement applications. Each model offers a maximum sample rate of 2 GSa/s (interleaved) and a maximum memory depth of 200 Mpts in interleave mode. The MS configured models also include a 16 channel logic probe as standard.
