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LED Test
Universal LightProbe Penta sensors are Optomistic Products' most popular LED test sensor, relied upon for their versatility in accommodating most LED test applications for color and intensity. The Penta Sensor provides analog voltage outputs, and features built-in color binning, eliminating the need to convert LED wavelength to visual color in the ATE software, and saving valuable processing time. For use with any of the Universal LightProbe Fiber-Optic Probes.
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Standards Reference for Test Systems PXI Card
GX1034
The GX1034 offers PXI system designers the capability to develop a system re-certification strategy that employs only internal system resources. By incorporating the GX1034 as part of a system configuration, it is possible to develop a system accuracy verification strategy that can recertify a system's source and measure baseband instrumentation resulting in simplified support / maintenance logistics and improved system availability.
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Bi-Directional Differential-TTL I/O PXI Card
GX5641 Series
The GX5641 is a 3U PXI instrument card that can be used for general data acquisition, process control, Automatic Test Equipment (ATE), functional test, and factory automation applications. The GX5641 consists of 64 bi-directional TTL-differential I/O channels. Each channel has two ports (TTL and differential) which can be individually set to operate in either conversion or static I/O modes.
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Multi Protocol Boards
The EXC-4000 carrier board series was developed to meet the needs of avionic testers for multi-protocol integrated, digital bus testing. Modules may be selected out of a growing list which currently includes MIL-STD-1553/1760, MMSI, H009, ARINC-429, ARINC-708/453, Serial (232/422/485), Discrete and CAN bus. Additionally, an IRIG B decoder implements a global time stamp relative to the IRIG B pulses. The need for higher density, different protocols, and multi-channel on one integrated test card has made the EXC-4000 series very successful.
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PXI Switching Instrumentation
3U PXI
Marvin Test Solutions’ switch card portfolio includes matrix, multiplexer, and RF multiplexer configurations. 3U and 6U PXI switch cards feature easy to use, reliable, and integration-friendly D-sub style interface connectors – a feature unique to Marvin Test Solutions PXI switch cards. GENASYS switch cards are compatible with MTS’s family of GENASYS Switching and Switching/Digital Subsystems, featuring integrated MAC Panel SCOUT receivers.
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HPGL Plotter Emulator software
Plottergeist
Plottergeist "the phantom plotter" emulates all the common HPGL plotters. It runs on a standard PC equipped with a GPIB card or using RS-232, and connects to test equipment or another computer. The software behaves like a real plotter, with the exception that the PC screen is the paper.
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RS232 9 Way D-Type lead
1081-001
Pickering Interfaces Series 1000 SIM Reed Relay Cards offer a choice of switching configurations using low cost industry standard SIM connectors. They are ideal for placing switching systems in fixtures close to the unit under test.
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Digital/Pattern/PE Card
PE16S
The PE16S represents a new level of performance and capabilities for PXI-based digital instrumentation. Based on the proven architecture of the PE16, the PE16S offers high performance pin electronics and an enhanced timing generator in a compact, 3U PXI form factor. Each card can function as a stand-alone digital subsystem or if required, multiple cards can be interconnected, supporting up to 256 bi-directional pins (16 boards). The PE16S offers 16 programmable level input or output channels with 2 PMU . The PE16S also supports deep pattern memory by offering 32 M of on-board vector memory with per channel dynamic direction control running test rates up to 66 MHz.
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256 Channel Power Supply
IDPS750
Salland Engineering’s Independent Device Power Supply (IDPS) can expand your existing Automated Test Equipment (ATE) with up to 256 independent DPS sources to increase parallel testing. It offers Force Voltage (FV) and Measure Current (MI) that can be used for continuity tests, parametric supply current (IDD) and quiescent supply current (IDDQ) measurements or simply for powering devices under test. The IDPS750 is targeted to reduce test costs for a wide range of applications including smart cards, memory, microprocessors and FPGA’s. Its design makes it useful in applications where many resources are required, or were the original ATE supplies do not meet your required specifications.
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VPX Interposer
VPX850
The PCIE850 provides a complete test and debug solution for PCI Express Bus. Interposers and probes connect to the PCIE850 providing access to PCI Card, AMX, XMC and VPX systems.
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3U CPCI 32-bit Test Extender
Measurement and testing of CompactPCI® assemblies in the 3U Euro-board form factor is greatly facilitated by the use of this test adapter. Easy access to the DUT is guaranteed because the adapter has plug-in connections on 3 sides. The Modern BRIDGE design permits up to 3 CompactPCI® cards and one standard PCI® card to be inserted in one CompactPCI® slot. This allows system developers to implement a large number of tests with little effort and enables you to achieve vital time to market.
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PCI Express 5 CEM Receiver Test Automation
N5991PC5A
The N5991PC5A is the receiver test automation software for bit error ratio testers, allowing you to test, debug and characterize PCI Express 5.0 CEM Add-In Cards and systems.
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Probe Card
VS Series
Japan Electronic Materials Corp.
*Vertical contact Probe Card with Spring*Suitable for Area array Bump Test
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PCI Intelligent Interface Card
IIB-1553-PCI
The IIB-1553-PCI is an intelligent interface card giving full MIL-STD-1553 test, simulation and bus analysis capability on the PCI bus, providing 1553A, 1553B, McAir and STANAG 3838 variants in a single card.
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Boundary-Scan Controller for PXI-Express 'Hybrid' Slots or Plug-In Controller for PXI-Express Peripheral Slot
JT 37×7/PXIE
High speed and performance JTAG Boundary-scan controller for PXI-Express ‘hybrid’ slots or plug-in controller for PXI-Express peripheral slot.The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.
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Memory Burn-In Test
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
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PCI High Density Pecision Resistor Card, 4-Channel, 3Ω To 26.7kΩ
50-298-132
The 50-298-132 is a high density programmable resistor card with 4 channels which can be set between 3Ω and 26.7kΩ with 0.5Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Probecard testers
MANAGER
Today more complex probe cards are being used. More pins,higher density and larger array requires a new approach inprobe card analysis. With the soaring cost of new generationprobe cards, repair of defective cards becomes an necessity.BE Precision Technology offers all capabilities with the newMANAGER V. Future proof, up to 450 mm full wafer contactprobe cards can be analyzed with up to 88.000 test channels.High-end materials are used to stand extra tough requirements—such as 500 mm diameter diamante viewing window,ultra stiff carbon flip-table, high power Z–stage to generate 600Kg of contact force
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3U VPX RL Thermal Load Simulation Module
The 3U power test module is an ideal solution for evaluating heat dissipation in a rugged conduction cooled VPX cage or chassis. This card is a thermal load in the chassis to evaluate the heat dissipation. The chassis can be monitored with temp sensing probes and or FLIR imaging. Different wattages are selected by setting dip switches. The +5 and 3.3V loads are on the top of the module. The +12V and -12V loads are on the bottom side of the module.
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Hipot Tester
NX Hipot+
50 to 1500VDC Hipot Testing, 50 to 1000VAC (optional), Expandable to 1024 test points, 5Mohm to 1Gohm Insulation Resistance, Simple 4-button user interface, Tests for continuity and shorts, Tests a variety of components, Precision resistance measurements, Continuous high speed scanning for real time complete status information of harness assembly progress, Keyed security access and control, Built for rough industrial environments, 2 serial ports for connection to printers and scanners, Standalone operation, Uses a high capacity memory card, Available from 64 to 1024 test points, Networkable
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PCI Resistor Card 4-Channel 1 Ohm To 63.7 Ohm With SPDT
50-293-111
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Backplane & Cable Test
Backplane and cable test systems from Terotest include LINX, a fixtureless test system. Each LINX test card plugs directly into the unit under test, which removes the necessity for long test cables and fixtures. This is called distributed testing and results in dramatically lowered costs. LINX is extremely easy to use, with a self-learn function or input from CAD.
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Powered VME64x Crates
6U VME64x 6023
The WIENER VME 6023 crate series is the newest generation of 19" integrated packaging system for standard VME/VME64 bus systems with 6Ux160mm cards. Designed primarily for applications in data acquisition, control and test instrumentation it combines superior mechanical quality with lowest noise power supply technology.
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PCI Programmable Resistor Card 4-Channel 2 Ohm To 510 Ohm
50-294-014
The 50-294 series of PCI Programmable Resistor cards are available with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single card. These cards are ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
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Compact PCI Multi-function Decommutator
LS-50-cP
The Lumistar LS-50-cP 3U Compact PCI Multi-function PCM Decommutator offers the greatest flexibility in the industry by incorporating up to 10 functions typically encountered in flight test applications in a single 3U Compact-PCI card slot. Five functions are achieved on the main board (PCM Simulator which can also operate as a BERT, PCM Decommutator, IRIG Time CodeReader, IRIG Time Code Generator, and the same 5 functions can be achieved on the LS-55-DB Multi-Function Decom Daughterboard. CVSD Voice Decoding and h.261 Video Decoding are achieved through software.
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SWB-2833, 4x71, 2 A, Electromechanical Relay Matrix Module for SwitchBlock
781420-33
4x71, 2 A, Electromechanical Relay Matrix Module for SwitchBlock - The SWB‑2833 is an electromechanical relay matrix card for SwitchBlock systems. Designed for high power, it can operate as an individual relay card or expand in a single carrier or single PXI chassis. You can connect any input to any output, individually or in combination. You can use matrix switches to route signals from oscilloscopes, DMMs, arbitrary waveform generators, and power supplies to various test points on a unit under test (UUT). The primary benefit of matrix switches is simplified wiring—the overall test system can easily and dynamically change the internal connection path without any external manual intervention.
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Probe Card
T40™ Series
Ultra low noise and fast settling modeling and characterization tests are made possible by Celadon’s patented ceramic probe cards.
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Full Wafer Test System
FOX-1P
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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Tx/Rx BenchBlade
This ATCA compatible test card offers the flexibility to verify the performance of Advanced TCA fabric and base channels. The set of four Transmit pairs and four Receive pairs allows access to a full channel's eight pairs for logic card characterization. The card includes a HM-ZD male right angle connector segment for access to the Zone 2 connectors of a switch fabric or node card. Edge-launch SMA connectors are utilized for ease of test cable attachment. SMT pads are included on the receive pairs.
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ARINC825 Cards
AIM’s ARINC825 cards can work either with full functionality as an active CAN node for testing and simulating or in listening only mode for monitoring and recording purposes of Avionic CAN bus (ARINC825) applications on up to 4 electrically isolated CAN bus nodes concurrently. All nodes are in conformance with the ISO11898-1/-2 standard. They are accessible by software separately and can be used as 4 independent CAN bus nodes. An onboard IRIG-B time decoder allows users to accurately synchronize single or multiple modules to a common time source. All supported signals are available through front I/O and rear I/O interface. ARINC825 cards consist of FPGA based CAN interface controllers as well as a FPGA based 32-bit microcontroller core and a separate processor for IRIG-B synchronization with high resolution time stamping. All nodes are operating concurrently at CAN bus high speed bit rate of up to 1Mbit/s with the intelligence to process scheduling of CAN frames in real time onboard to significantly off-load the host processor.For embedded applications the AMC825-4 PMC module is available in a conduction cooled version. Using AIM’s family of PCI, CPCI (3U and 6U) and VMEbus carrier cards for PMC our clients have off the shelf solutions in a broad range of card formats. ARINC825 (CAN bus) modules are delivered with an Application Programming Interface (API) and Driver Software compatible with Windows, Linux and VxWorks.An ARINC825 Resource Component is available for AIM’s PBA.pro™ databus test and analysis tool including Tx and Rx simulation capabilities, a Chronological Bus Monitor and support for decoding of payload data within CAN messages. This allows to implement a powerful ARINC825 (CAN bus) analyzer or a complete test system in conjunction with other AIM avionics databus interfaces and PBA.pro™ supported 3rd party hardware.
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PCI Resistor Card 2-Channel 2 Ohm To 131 Ohm With SPDT
50-293-134
The 50-293 is a Programmable Resistor card with either two channels of 16-bit or four channels of 8-bit resistor chains in a single PCI card. The card is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.
