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RF Probes
Coaxial Probes are said to offer repeatable performance up to 3 GHz in custom or standard configurations.
See Also: Test Probes
- Pickering Interfaces Inc.
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PXI/PXIe RF Switch, Hex SPDT, 3GHz, 75Ω, MCX
42-830A-106
The 40-830A-106 (PXI) and 42-830A-106 (PXIe) are 75Ω RF switches with 6 separate SPDT relays slot. They have been designed to exhibit low insertion loss and VSWR through the use of modern RF relay technology at an affordable cost. The switch banks have been carefully designed to ensure excellent and repeatable RF characteristics to frequencies of 3GHz with each path having a nominally equal insertion loss.
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EMC Probes
The Beehive Electronics 100 series EMC probes allow the accurate measurement of magnetic and electric fields. They are useful for EMC troubleshooting, field strength measurement, and troubleshooting of RF circuits.
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Diode Power probe
The COMM-connect 3026 Diode based temperature compensated probe is designed for use with the COMM-connect range of Power Monitors. The probe will handle from 50µW to 100mW . Used with external couplers and the our measurement system application from 1W to 1MW, a high dynamic range can be configured. The 3026 Diode based probe gives excellent stable results along with the COMM-connect Power Monitor variants. This gives our customers a number of applications to monitor and control the last part of your RF network installation from transmitters to the antenna.
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High-Frequency Probe, 300 kHz to 3 GHz
85024A
85024A high-frequency probe makes it easy to perform in-circuit measurements. An input capacitance of only 0.7 pF shunted by 1 megohm of resistance permits high frequency probing without adversely loading the circuit under test. Excellent frequency response and unity gain guarantee high accuracy in swept measurements with this probe. High probe sensitivity and low distortion levels allow measurements to be made while taking advantage of the full dynamic range of RF analyzers.
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Mixed Domain Oscilloscope
3 Series MDO
With the largest display in class, improved low-level signal measurement accuracy and industry-leading probe performance, the 3 Series MDO sets a new standard for bench oscilloscopes. Whether you’re testing your baseband design for IoT or just for simple EMI sniffing, the 3 Series has a unique true hardware spectrum analyzer built right in with superior RF test performance and guaranteed RF specifications.
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Digital RF Power Monitor
3024
The COMM-connect 3024 RF Power Monitor from LBA Technology can control up to 8 external RF Measuring heads. The high dynamic range with external couplers and RF measuring heads cover from 1W to 1MW. The Power conversion algorithms handles multi carrier, multi mode, peak, average and RMS signals. The power readout is auto scaled and VSWR can be calculated between any probes. Also the measured and calculated results along with alarms can be shown in the local LCD. The instrument has SNMP support to allow network management. The instrument can be configured for VSWR and Power limits to give alarms. The alarms can be configured to operate relay drivers or isolated Optcouplers. The alarms can also be configured as SNMP traps sending relevant information to the network control center. The COMM-connect 3024 WEB enabled RF Power Monitor gives an unlimited number of applications to monitor and control the last part of your RF network installation from transmitters to the antenna.
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Nano Technology Products
We are instrumental in offering quality range of nano technology products that find application in defense research and development organization. Our range encompasses probe station, microscope, extension cable, adopter and RF probing, and vibration isolation products. We have the ability and resources to design products in line with the exact specifications provided by the clients.
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RF Near Field Probe Set DC to 9GHz
EMF & RF close field sniffer-set for use with any Spectrum Analyzer or Measurement Receiver. The EMC Near Field probe set allows for straightforward pinpointing and measurement of interference sources in electronic component groups as well as execution and monitoring of generic EMC measurement. Our RF near field probe set is especially suitable for: - Pinpointing interference sources - Estimation of interference field strength - Verification of shielding and filtering measures - Identifying faulty components - Detecting circuitry overly sensitive to interference.
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Near Field Probes 30 MHz - 6 GHz
XF Family
The XF family consists of 4 passive magnetic field probes and 3 passive E field probes designed for measuring magnetic and E-fields in ranges from 30 MHz to 6 GHz during the development phase. Due to their integrated impendance matching the probes are less sensitive in the lower frequency range than the RF type probes.
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LISN & Voltage Probes
All commercial LISNs include an artificial hand connection and a transient limiter. This adds a 30dB insertion loss. A 30dB pre-amplifier is included which can be connected in the RF output feed to return the insertion loss to 0dB. The Voltage Probe requirement is covered by our PLIP (Power LIne Interference Probe). This fully meets the requirements of CISPR16, but has additional features:*Fully galvanic isolation between input and output (>1kV), for the safety of operator and analyser!*Shrouded safety clips for attachment to the line to be measured.*Filtered frequency response matched to Band A and B.*Current limiting on the output.*Visual indication of high voltage input.
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Calibration
RF Test Equipment
We calibrate following types of RF test equipment:EMF test systems (frequency selective)EMF test systems (broadband)Field strength transfer standards (e.g. RefRad)Line Impedance Stabilisation Network (LISN)Cable, attenuator, couplerAntennaField Probe
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RF High Frequency Probes
*Low impedance*High bandwidth up to 20 GHz*Repeatable measurements*Coaxial design*Interchangeable center conductor
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RF Capacitance Level Switches
ABB's RF Capacitance level switches feature one-step external calibration, immunity to material build-up, and a wide selection of probes for even the most challenging applications from low dielectric bulk solids to sticky slurries.
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Enhanced Probe Station
EB Series
Comprehensive prober for DC and RF. The EB series contains features to step-up your usability to acquire the accurate data you need from your devices. It has a built in probe card slot.
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Testing Services
Howland & Lawrence Chamber Services
RF shield testing: IEEE-299, MIL-STD-285, NSA 65-6CTIA CATL certification testing: Probe symmetry and amplitude ripple measurements following Test Plan for Wireless Device Over-the-Air PerformanceAnechoic material test, inspection, remediation: VSWR, inverse spherical nearfield testing of installed material and NRL arch screening tests of individual absorber pieces We can also provide in-process testing of welded steel shielded enclosures with a test technique based on ASME BPVC vacuum box testing—confirm quality of RF welds before the shield envelope is complete. We developed this method for testing the Navy’s Advanced System Integration Lab (ASIL) chamber at Patuxent River, shaving weeks off the construction/testing schedule.
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Test Contactor/WLCSP Probe Head
ACE
ACE™ test sockets offer optimal RF performance for fine pitch FBGA, QFN and wafer-level packages for Power Amplifiers, RF switches and mobile communications. Supporting pitches down to 0.4 mm, ACE features an innovative design that provides superior performance, improved yields and power efficiency.ACE probe heads deliver exceptional electrical performance, both DC and RF. Manufactured from HyperCore™ base material, a proprietary material of Cohu’s Everett Charles Technologies, ACE probes have the electrical properties of BeCu with the non-oxidizing properties of a precious metal. The short signal path, sharp tips, and large contact area between plungers provide high current conductance and reliable contact with less force.
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Probe Cards
Ceramic Blades
SV TCL offers a variety of ceramic blades and blade probe cards. We have patented ceramic microstrip blade probes available in low leakage and low capacitance for optimal signal transference, while SV TCL's blade cards are ideal for parametric and RF testing.
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Probing Solutions
ES62X-CMPS
The ES62X-CMPS compact manual probe station is a rugged wafer probing solution designed for high reliability, compact size and low investment cost. It enables manual wafer level measurements up to 300 mm wafers. The probing station can also be used for TLP, HMM, HBM, LV-Surge, RF, S-parameter and DC-measurements. Micro positioners with vacuum as well as magnetic base can be attached. The chuck has a vacuum interface for the wafer and is electrically isolated. Multiple 4 mm connectors can be used to connect a voltage potential to the wafer backside.
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4-Channel Broadcast Monitor
The COMM-connect Entry Level Broadcast Power Monitor type 3025 can control two external RF Measuring heads. The high dynamic range with external couplers and RF measuring heads cover from 1W to 1MW. Equipped with the RMS Probes the Power conversion algorithms handles multi carrier, multi mode signals. With the 3026 Diode base probe the power readout gives good repeatable results. The power readout is auto scaled and VSWR will be calculated between the two probes. The COMM-connect Entry Level Power Monitor gives a number of application to monitor and control the last part of your RF network installation from transmitters to the antenna.
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RF Helmholtz Coil
The Beehive Electronics 135A RF Helmholtz coil generates a well-controlled, uniform magnetic field. It can be used to calibrate magnetic field probes, such as the Beehive 100 series, or for testing the susceptibility of other devices to magnetic fields. The Helmholtz coil comes supplied with a fixture that makes it easy to calibrate Beehive 100 series probes.
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RF Coaxial Probes & Probe Positioner
Fairview Microwave’s line of coaxial RF probes and RF PCB probe positioner are ideal for use with chip evaluations, signal integrity measurements, coplanar waveguide, substrate characterization, gigabit SERDES and test fixture applications. The RF coaxial probes provide return loss better than 10 dB and a maximum operating frequency of 20 GHz. The probes have a 3.5mm female interface, a pitch of 800 or 1500 micron and they can be cable-mounted. They feature gold-plated contacts and can be used by hand, with or without a probe positioner. Compliant coaxial GSG (or GS) pogo pins allow for a broad range of probing angles. The RF PCB probe positioner can hold coaxial probes, has articulated joints and delivers multi-axis positioner control. This positioner also boasts a magnetic mounting plate with on-off positioner switch.
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SMART III RF Probe
Finna Sensors’ Smart III RF Moisture Probe is appropriate in those situations where NIR use on conveying systems/web applications or RF flat plate sensor use on board type products are not sufficient. Examples include tanks, bins, barrels, drums, Super Sacks™, silos, etc. These applications require a probe type moisture meter where the probe is inserted into, and is surrounded by product. Since the probe generates a 3 inch diameter radio frequency field around the length of the probe, a significant volume of product is measured. As the product is slowly removed from the silo, and refilled from the top, it passes by the RF Probe, thereby providing a constant real time moisture measurement. Typical applications would include starches, distillers and brewers grains, granulated chemicals or food ingredients, whole grains such as corn kernels, rice, soybeans, tree nut stockpiles, etc.
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Snap-on RF Current Monitoring Probe
TBCP2-250
The TBCP2-250 is a snap-on RF current monitoring probe. The probe has a very flat response with a 3dB bandwidth of 250 MHz and is characterized over the frequency range from 30kHz to 300 MHz. Upon request, it can also be supplied with a test protocol covering the frequency range 1 kHz to 350 MHz. The aperture of the RF current monitoring probe is 32 mm. Its transfer impedance is > 12 dB Ohm in the range from 700 kHz to 300 MHz.
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Deep Access RF Probes
GigaTest Microwave Probes are perfect for device characterization and modeling. GigaTest Probes have a high tolerance allowing them to land repeatedly and take high-quality data.
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6TL36 Plus In-line Test Handler w/Bypass
EA923
- Test handler 6TL36 Plus.- Dual line (bypass)- 1096 x 1875 x 1851mm [WxDxH]- Expandable to form a group with several 6TL36 modules (adapt line to production volumes).- ICT, FCT with RF, ISP or Combined test (ICT+FCT)- Servocontrolled DUT stop (stopper-less system)- Exchange time 3,2s- Max. PCB dimension 600x450mm- 19” rack space for instruments integration: 28UH- Receiver 25 slots in probe plate + 4 slots in push plate- Automatic Conveyor width adjustment- Optional Return Conveyor- High dynamics conveyors (1500 mm/s)- 90mm Top-30mm Bottom Component clearance- SMEMA and Hermes standard- CE
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TEM Cells
Transverse Electro Magnetic (TEM) cell or Crawford cell (named after its inventor) is used to generate accurate electromagnetic waves over a wide frequency range: DC (0 Hz) to GHz., EM waves generated in the cell propagate in transverse mode and have the same characteristics as a plane wave. It can be used to calibrate E-field broadband probes for testing radiated E-field immunity as well as for measuring radiated emission from a product with a spectrum analyzer/EMI receiver.TEM cell generates a consistent electromagnetic field for testing small RF devices such as wireless pagers, receivers, portable phones, etc.
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Eddy Current Probes and Drivers
Proximity sensors work on the eddy current principle. A proximity system consists of an eddy current probe, extension cable and driver. A high-frequency RF signal is generated by the driver, sent through the extension and probe cables and radiated from the probe tip. The tip consists of a precision wound copper coil inside a chemical and temperature resistant PEEK case.
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MPI Fully Automatic Probe Systems
MPI Advanced Semiconductor Test
Addressing the RF and High Power communication devices and discrete passive components production test market requirements, MPI introduced the TS2500 200 mm fully automatic probe system series. The system is based on industry leading production equipment from the Photonics Automation Division and incorporates decades of experience in RF and High Power measurement techniques from the MPI’s Advanced Semiconductor Test (AST) Division in combination with other AST products such as RF Probes, related calibration technology, and High Power accessories.
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Data Loggers
ThermoWorks temperature and humidity loggers are perfect for food processing, transportation, and restaurant fridge and freezer storage, including cold chain management, cook chill, and critical control points (HACCP). They are also used in labs and for pharmaceutical applications like VFC. Wirelessly pair multiple network-connected units to a single base station through WiFi, Bluetooth, or RF and store your temperature or humidity readings in the cloud. Our USB probes and USB data transfer loggers are also popular and come with integrable software. Specialized loggers are also made for harsh environments, including extreme low and high temperatures.
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Test Contactor/Probe Head
xWave
Highest performance and most robust RF broadband production solution for package, wafer, or Over-the-Air (OTA) test for 100 GHz.The xWave™ test contactor / probe head utilizes patented hybrid contacting technology to optimize RF performance and provide robustness for production testing of the most challenging cmWave and mmWave devices. Inside the xWave test contactor / probe head are embedded patch antennas and coplanar waveguides for both wireless and wired communication.
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Probe Head
cViper
cViper™ is an ultra-fine pitch probe head for RF and high speed digital WLCSP. cViper is ideal for lab and large volume production test for precision analog, RF, sensors and mobility devices. Low loop inductance and high bandwidth up to 27 GHz, cViper offers low and stable contact resistance for singulated devices or wafer-level test. A variety of contact materials to optimize performance are available with device pitch down to 100 µm.
