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- Pickering Interfaces Inc.
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PXI Instrumentation Modules For Automated Test Systems
PXI-based test systems often require a variety of general-purpose instrumentation such as digital I/O, waveform generators, voltage & current sources and DUT power supplies.
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Bit Error Rate Tester
100G NRZ BERT
The C-BERT 2810-4 is a complete bit error rate tester dedicated for 100G Ethernet applications. The four independent channels enable an actual operating environment with traffic on all lanes. The simultaneous testing of 4 channels is much faster than testing each channel individually saving time and money. The BERT eye scan reveals low-probability events and shows the true performance of the DUT to aid troubleshooting. The high RF port density eliminates long cable length which degrades the signal at 25 Gb/s. The OS independent GUI is easy to install and enable remote control from everywhere. The complete and compact C-BERT is a powerful and cost efficient test solution for 100G Ethernet.C-BERT MI-PE2810-4 Product sheet_rev05.
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DUT Matrix 32 DUT Matrix Channels
40-530-021
The 40-530-021 is a high density 32x8 1 pole reed relay matrix. Typical applications are signal routing in functional ATE and data acquisition systems. It consists of highly reliable sputtered ruthenium reed relays that offer >10e9 switching cycles to ensure maximum switching reliability with a long service life and stable contact resistance. Larger arrays can be built by daisy-chaining the common signals from multiple PXI modules
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Multichannel Source Measurement Unit
AXS844x
Run tests simultaneously on 4 channels with up to 400 V. Carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for direct testing of high-voltage RGBW LEDs
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Flexible Cable Set, 2.4 Mm To 7 Mm
85135F
Achieve phase stability with these 62.9-cm cables when a DUT is connected between cable ends
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3U CPCI 32-bit Test Extender
Measurement and testing of CompactPCI® assemblies in the 3U Euro-board form factor is greatly facilitated by the use of this test adapter. Easy access to the DUT is guaranteed because the adapter has plug-in connections on 3 sides. The Modern BRIDGE design permits up to 3 CompactPCI® cards and one standard PCI® card to be inserted in one CompactPCI® slot. This allows system developers to implement a large number of tests with little effort and enables you to achieve vital time to market.
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Shock Testing
Shock testing typically involves calibrated, repeatable, violent events. The resulting energy is then absorbed transferred through the test specimen or Device Under Test (DUT)
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Text-Based Way to Connect & Disconnect Relays on ABex Modules
ABex Switching
The ABex Switching features a text-based way to connect and disconnect relays on ABex modules. Alias names for channels could be defined in a DUT specific topology file and then be used for text-based switching. These alias names are also shown in the Konrad System Manager allowing easy debugging of test sequences. The ABex Switching functionality could be either used out of NI Teststand with the provided test steps or via API from other programming languages.- Text-based switch routes- XML based topology for Alias mapping- Switch routes with support for Alias names- Seamless integration into Konrad System Manager
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Power Management & MMI Module
H73000700
This module, named “6TL-MMI”, is designed to be the interface between an operator and a SYSTEM as well as being a metered power distribution unit (PDU) for it. The module is providing also safety controls, data bus interfaces, temperature control and timers. The 6TL-MMI is suitable for any ATE, and specially for those based on CAN bus controlled devices, because in addition to the above functionalities, this module is also providing galvanic isolation up to 1500V for the CAN bus. This isolation will block potential disturbance towards the DUT.
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CTL503
The CTL503 Curve Tracer is a low-cost transistor (BJT and FET) computer controller curve tracer. Unlike other simple curve tracing units the CTL503 is designed to measure devices to 100V and upto 3A. Four collector resistors (relay selected) allow the user to test the smallest of BJT’s and FET’s as well as extracting meaningful curves from larger TO3/TO247 packaged devices. Limits on both peak test voltage and peak test current can be easily set to prevent exceeding device parameters.Pulse testing (80us/300us) is used to minimise device heating and to ensure the CTL503 can be powered via USB. This may be disabled for smaller parts.Connected and powered via USB and running our own free software the CTL503 is easily configured using a built in wizard (for quick results), or the user can adjust every instrument parameter to suit. Works with EPIC 21.010 and above.Users can save data from runs, as well simply grab images directly from EPIC.Connections are made to the DUT (device-under-test) with the built-in colour coded test leads with crocodile clips.
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Pulse Pattern Generator, 3.35 GHz, dual-channel
81134A
When timing and performance requirements are critical, for example in high-speed serial bus applications like PCI Express or Serial ATA, its fast rise times and low intrinsic jitter allow the precise and in-depth characterization of devices, e.g. receivers or backplanes. On top of that, it allows to generate application-specific signal levels like pre- and de-emphasis (PCI Express) or squelch (Serial ATA). The Keysight 81134A lets you test your DUT instead of the pulse or data source!
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Memory Burn-In Test
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies.
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JESD22-A115 Machine-Model (MM) Pulse Emulator
MM-10A
High Power Pulse Instruments GmbH
- Pulse unit to generate JESD22-A115 machine-model (MM) waveforms with TLP- Extremely stable and reproducible machine-model (MM) waveforms- Compatible with HPPI TLP-3010C/4010C/8010A/8010Csystems which have installed pulse width of 25 ns and rise time of 100 ps to 300 ps- Up to ±10 A machine-model peak current with TLP-3010C, which is equivalent to ±667 V (MM)- Up to ±15 A machine-model peak current with TLP-4010C, which is equivalent to ±1000 V (MM)- Up to ±30 A machine-model peak current with TLP-8010A and TLP-8010C, which is equivalent to ±2000 V (MM)- Same measurement procedure as TLP including DC test of the DUT- Compatible with HPPI TLP software and waveform data storage and management- 50 Ω SMA input and output connectors- Compact size: 61 mm x 25 mm x 17 mm
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PXIe-4112, 2-Channel, 60 V, 1 A PXI Programmable Power Supply
782857-01
The PXIe‑4112 is a programmable DC power supply with isolated outputs. It helps simplify the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and component test—by eliminating the need to mix multiple instrumentation form factors in a given test rack. It also has standard output disconnect functionality that allows isolation from the device under test (DUT) when not in use, and remote sense to correct for losses in system wiring.
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Plane Wave Converter
PWC200
The R&S®PWC200 Plane Wave Converter is a bidirectional array of 156 wideband Vivaldi antennas placed in the radiating near field of the device under test (DUT). The phased antenna array can form planar waves inside a specified quiet zone within the radiating near field of the 5G massive MIMO base station for realtime radiated power and transceiver measurements (EVM, ACLR, SEM, etc.).
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Sound Harmonics and Current Analyzer
H74050100
This analyzer is used as end of line control for electro mechanic components with electric motors, with or without mechanical reduction. While the motor is running at nominal speed, a spectrum and temporal analysis of the sound as well as a current consumption test is performed. Statistical analysis of the data acquired is also performed real-time, expediting the PASS/FAIL decision of the DUT.
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DC Power Analyzer, Modular, 600 W, 4 Slots
N6705C
The N6705C DC Power Analyzer provides unrivaled productivity gains for sourcing and measuring DC voltage and current into the DUT by integrating up to 4 advanced power supplies with DMM, Scope, Arb, and Data Logger features. The N6705C eliminates the need to gather multiple pieces of equipment and create complex test setups including transducers (such as current probes and shunts) to measure current into your DUT. The DC Power Analyzer also eliminates the need to develop and debug programs to control a collection of instruments and take useful measurements because all functions and measurements are available at the front panel. For even greater control and analysis functions, the DC Power Analyzer can be used with the 14585A Control and Analysis Software. When automated bench setups are required, the N6705C is fully programmable over GPIB, USB, LAN and is LXI Compliant. 14585A Control and Analysis Software
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Single Board Source/Meter/Switch
SMSU
SMSU Series SourceMeterSwitch Unit (SMSU), introduced by SW Link Ltd, is single-channel voltage/current sourcing, 4X6 switch matrix and measurement instruments. Each Series 100 SMSU instrument tightly integrates highly accurate stable DC power source and a true instrument-grade programmable gain amplifier and 18bits ADC on a 100x100mm PCBs. It can output up to 20V, sub-uA to 1A current to device under test (DUT)
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Pump Test System
This automated test system evaluates a wide range of performance metrics for a cooling pump assembly. The LabVIEW based system programs the DUT then initiates a series of tests to check:Serial communication verificationMotor voltage & currentImpeller speed and flowAir and water temperaturesLeak and level sensor functions
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Signal Analyzer
bsw TestSystems & Consulting AG
The simplest way to measure the phase noise is to compare the Device-Under-Test (DUT) to the source of a spectrum analyzer. With the SA set at the same frequency as the OUT, you see the sum of the SA's and DUT's sideband-power spectrum on the SA display. It is a simple and straight forward method well suited for free running VCO's where the SA is easily an order better.You can improve on this method by establishing a Phase Lock (PLL) between the DUT and the Local Oscillator and create a zero-IF or base-band spectrum analyzer system.
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±6 kV ANSI/ESDA/JEDEC 2-Pin HBM Tester
HBM-S1-B
High Power Pulse Instruments GmbH
*±6 kV Human-Body-Model (HBM) 2-pin tester according ANSI/ESDA/JEDEC JS-001 standard with C = 100 pF, R = 1.5 kΩ discharge network*True HBM: the classical discharge network of the HBM-S1-A according the standard ensures compliant waveforms for all load conditions*Optionally available upgrade for all HPPI TLP-3010C, 4010C, 8010A, and 8010C hardware systems and software (upgrade on request)*Suppression of trailing pulses*Integrated 10 kΩ charge removal resistor*Integrated DUT voltage and DUT current sensor for real time voltage and current monitoring*Integrated DC test DUT switchIntegrated hardware 50 Ω trigger output for high speed digital oscilloscopesIntegrated overvoltage protection of voltage sense and DC test interfaces for oscilloscope and SMU protection during high voltage HBM testing*Fast and efficient HBM measurements including transient waveform data management using the HPPI TLP software*Compact size 145 mm x 82.5 mm x 44 mm
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High-Performance Autoranging DC Power Module, 50V, 10A, 100W
N6752A
The Keysight N6752A is a 100 W high-performance, autoranging DC power module that provides low noise, high accuracy and programming speeds that are up to 10 to 50 times faster than other programmable power supplies. Optional high-speed test extension offers an oscilloscope-like digitizer that increases measurement accuracy when viewing high-speed transient or pulse events within the device-under-test (DUT).
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Milliohm Meters
Chroma 16502
Chroma Systems Solutions, Inc.
With a basic accuracy of 0.05%, Chroma 16502 offers a 0.001mΩ ~1.9999MΩ wide measurement range. It provides measurement range with 4 1/2 digits resolution. The fast measurement time is 65 ms. It suits component evaluation on production line. Pulsed test current output mode is used to reduce thermal EMFs affection on milliohm measurement. DC test current output mode is used to fasten measurement speed for inductive DUT. Dry-circuit test current output mode is used to measure such contact resistances where the maximum open-circuit voltage must be limited to 20mV.
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High Current SMU 600/1200/2400 A
AXC85xx
Generate extremely short, fully regulated current pulses in 4 ranges. At the same time, carry out measurements directly on the DUT with the integrated VMU and CMU. Perfect for rapid semiconductor tests during production.
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Arbitrary Load Control For Modulation Distortion
S94570B
Extend the modulation distortion application by computing figure of merits such as EVM and ACPR for any desired load with arbitrary load control (ALC). Modulation distortion with ALC integrates the powerful capabilities of the PNA-X with an electromechanical tuner so a non-50 Ω load can be presented to the DUT and changes in device performance or sensitivity to varying load conditions can be accurately measured.
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Graphical Waveform Editor and Instrument
PI-PAT
Much more than just a visualization tool, PI-PAT is a full-fledged graphical waveform editor that allows you to spend more time testing and less time programming. PI-PAT doesn't require any programming experience or complicated syntax. Just draw or type patterns directly into the pattern window. Move a clock edge by dragging it. Adjust integration times by entering a single number. Change the output to your DUT by clicking the Update button. You'll never have to wrangle DSP or FPGA code with PI-PAT.
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High Current SMU Family 2000 A
AXC76xx
Generate very short, fully regulated current pulses from 2 ms to DC with up to 2000 A. Carry out measurements directly on the DUT with the integrated CMU and VMU.
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Security Testing
Security/negative testing is typically conducted during development to highlight how a DUT handles abnormal conditions like very high traffic load, different frame sizes (incl. undersized and oversized frames), framed with different IFG settings, various types of errors and deviation of the signal frequency, as well as various DDoS attacks.
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PXIe-4113, 2-Channel, 10 V, 6 A PXI Programmable Power Supply
782857-02
The PXIe‑4113 is a programmable DC power supply with isolated outputs. It helps simplify the task of designing automated test systems for a wide range of applications—from aerospace and defense to automotive and component test—by eliminating the need to mix multiple instrumentation form factors in a given test rack. It also has standard output disconnect functionality that allows isolation from the device under test (DUT) when not in use, and remote sense to correct for losses in system wiring.
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Emulate Test in simulation
STIL-VT
Emulate test patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test patterns. Reads the intermediate STIL format of tester patterns and creates a Verilog /VHDL simulation test bench. (A sub-set of Virtual tester solution)
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RF Shield Box
CMW-Z10
The R&S®CMW-Z10 has excellent shielding effectiveness and superior coupling characteristics.The shield box can be used for frequencies up to 6 GHz.The antenna structure is optimized to enable excellent radio connections between the DUT and tester.The highly broadband spiral antenna allows a wide variety of applications.These outstanding features combined with modular options make the RF shield box indispensable for any radiocommunications tester.
