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- Pickering Interfaces Inc.
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PXI Resistor Module Dual 16 Bit
40-290-021
The 40-290 Series Programmable Resistor Modules comprise a Dual 16-bit or Quad 8-bit resistor chain together with 16 optional SPDT Reed Relays. Connections are made via a front panel SCSI 2 type 68 pin male connector. Programmable resistors may be connected together either in series or in parallel to form many types of configuration.
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PXI Resistor Module Quad 8 Bit
40-291-021
The 40-290 Series Programmable Resistor Modules comprise a Dual 16-bit or Quad 8-bit resistor chain together with 16 optional SPDT Reed Relays. Connections are made via a front panel SCSI 2 type 68 pin male connector. Programmable resistors may be connected together either in series or in parallel to form many types of configuration.
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USB Modular Source Measure Unit
U2722A
The U2722A USB Modular Source Measure Unit is a 3-channel 20V/120mA that can operate in a 4-quadrant operation. The channels could be connected in series or in parallel to achieve up to 60 V/360 mA. It uses the common non-proprietary standard high-speed USB 2.0 interface that provides ease of connectivity allowing users to set up and configure their tests swiftly with its plug and play feature.
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VLSI Test System
3380D
The 3380D/3380P/3380 test system have 4 wires HD VI source and any-pins-to-any-site high parallel test (multi-sites test) functions (256 I/O pins to test 256 ICs in parallel) that can meet the upcoming higher IC testing demands.
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Battery Testing Machine
Dongguan Kejian Instrument Co., Ltd.
Test method is to use test sample cell on a plane, a diameter of 15.8 mm (5/8 inch) rods on the cross placed in the center of the sample.one 9.1 kg or 10 kg weight from a certain height (610 mm or 1000 mm) fell to the samples.Cylindrical or square battery in accepting the impact test, the vertical axis parallel to the plane, vertical steel column longitudinal axis.The longest axis vertical steel column square battery, the bedding face perpendicular to the direction of impact, each battery only accept an impact test.
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Programmable Gain Amplifiers
Analog Devices programmable gain amplifiers (PGAs) provide excellent gain accuracy, channel-to-channel matching specifications, and low 1 ppm/°C drift. Set your gain with a simple serial or parallel interface from 1 V/V to over 4000 V/V.
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Window Tint Meter
Guangzhou Amittari Instruments Co.Ltd
The Window Tint Meter is applicable to measure the transmittance or haze of all kinds of transparent, translucent samples with parallel plane (such as automobile manufacturing, aerospace, glass products, plastic sheet, sheet, etc). Also can be used to determine the turbidity or clarity of liquid sample (water, drinks and so on).
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Confocal FLIM System
DCS-120
*FLIM Upgrade for Existing Conventional Microscope*Two Fully Parallel TCSPC FLIM Channels*Compact bh Simple-Tau or Power-Tau System*Scanning by Fast Galvanometer Mirrors*Channel Seperation by Dichroic or Polarising Beamsplitters*Individually Selectable Pinholes and Filters*One or Two BDL-SMN or BDS-SM ps Diode Lasers*Two Fully Confocal Detection Channels*Two HPM-100-40 GaAsP Hybrid Detectors*Optional: Two HPM-100-06 Hybrid Detectors, IRF Width < 20 ps FWHM*Optional: HPM-100-50 Hybrid Detectors for NIR FLIM*Optional: Multi-Wavelength FLIM*Excellent Time Resolution: Electrical IRF Width 6.5 ps FWHM*Time Channel Width Down to 813 fs*Megapixel FLIM, Up to 2048 x 2048 Pixels at 256 Time Channels*Simultaneous FLIM/PLIM*Wideband Version, Compatible with Tuneable Lasers*Electronic Pinhole Alignment*Z-Stack FLIM Acquisition with Zeiss Axio Observer Z1*Optional: Spatial Mosaic FLIM via Motorized Sample Stage
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256 Channel Power Supply
IDPS750
Salland Engineering’s Independent Device Power Supply (IDPS) can expand your existing Automated Test Equipment (ATE) with up to 256 independent DPS sources to increase parallel testing. It offers Force Voltage (FV) and Measure Current (MI) that can be used for continuity tests, parametric supply current (IDD) and quiescent supply current (IDDQ) measurements or simply for powering devices under test. The IDPS750 is targeted to reduce test costs for a wide range of applications including smart cards, memory, microprocessors and FPGA’s. Its design makes it useful in applications where many resources are required, or were the original ATE supplies do not meet your required specifications.
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Dielectric Material Test Fixture
16453A
The 16453A is designed for accurate dielectric constant and loss tangent measurements on the E4991A/4291A/B. It employs the parallel plate method, which sandwiches the material between two electrodes to form a capacitor. The E4991A/4291A/B measures the capacitance created from the fixure, and option 002 firmware calculates the relative complex permittivity as described in the 16451B. Adjustment to insure parallel electrodes is required when using the 16451B. This adjustment is not required with the 16453A because the fixure has a flexible electrode that adjusts automatically to the material surface.
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Logic Analyzer & Protocol Decoder
SP209
SP209 series logic analyzers and protocol decoders offer in depth analysis of logic signals and protocols with 200MHz (5ns) timing resolution. 9-channel logic analyzer allows 8-bit parallel data to be captured along with a clock or strobe signal.
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AMIDA 3001XP Tester
AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.
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Digital Source Capture Unit
DIO2
The DIO-II module is a multimode digital source and capture unit. In Low Speed Mode it provides a 20-bit parallel or 24-bit serial I/O capability running at speeds up to 50 MHz. In High Speed Mode, the DIO-II provides a 16-bit parallel I/O capability up to 200 MHz. In both Modes, the Clock is generated by a low jitter PLL source that is capable of generating clocks from 320 kHz up to 1 GHz.
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Power Supply, 60 V, 85 A, 5,100 W
N8757A
The Keysight N8757A is a 60 V, 85 A, 5,100 W, single-output power supply in a small 2U package. It offers flexible AC input options, analog / resistance control of output voltage and current, and parallel and series connection of multiple supplies to achieve more output current or voltage.
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"Soft Grid" and Parallel Operation AC Generator Excitation Regulator
svrsp
The Kinetics model SVRSP Exciter/Regulator rectifier is designed and rated in capacity and operating parameters for the application of exciting the DC fields on an AC generator operating in parallel with other AC generators and the power system is a "soft system" in relation to loading. A "soft system" is a generating system that may not be able to sustain the rated AC voltage under impulse/step loading conditions and results in voltage reduction when tan impulse/step load is applied.
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Content Uniformity >
PrepEngine
The PrepEngine was developed through collaborations with leaders in the biotech and pharmaceutical industry to speed up the sample preparation process. The result - a process that is ultra-fast with multiple drives so up to 10 samples can be prepared in parallel.
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Digital Test Instruments
Conduct pattern-based digital tests incorporating the latest parallel, digital, serial, and bus protocols with the PXIe-6943 digital test instrument.
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Digital Backplanes
MSXB 034
Digital Backplanes provide expansion slots to accommodate compatible digital external boards. Digital Backplanes are passive, and connect all signals in each of the expansion slots in parallel. All expansion slots are identical.
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Dynamic Test System
3430-SW
The Dynamic Test System 3430-SW measures dynamic characteristics of IGBT/MOSFET devices at high speed. Maximum of 4 parallel measurement is available by connecting the 3430-SW mainframe test stations for each test items ( normal 2stations). One PC controls the whole system.
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USHIO Blue Violet Laser Diodes (375nm - 405nm)
The Optoelectronics Company Ltd
The USHIO HL40071MG is a single transverse mode 405nm laser diode which offers 300mW optical output power in a 5.6mm package with typical optical and electrical characteristics, (Tc=25 degrees C, cw), of 50mA threshold current, operating current of 280mA, operating voltage 6.0V, 6 degrees beam divergence parallel to the junction, 15 degrees beam divergence perpendicular to the junction, laser diode reverse voltage of 2V and operating temperature of 0 to +70 degrees C.
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Semiconductor
Copper Mountain Technologies USB VNAs provide a low-cost semiconductor testing option, offering measurement speeds on the order of 10,000 points per second while maintaining 80-90 dB dynamic range, are uniquely suited for deployment into such demanding scenarios. Additional considerations for these applications include availability of external trigger inputs and outputs, amenability to external program control, size of the instrument, and parallel processing capability.
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Analog Backplanes
MSXB 030
Analog Backplanes provide expansion slots to accommodate compatible analog external boards. Analog Backplanes are passive, and connect all signals in each of the expansion slots in parallel. All expansion slots are identical
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InCarrier Loader/Unloader
NY32-LU
NY32-LU™ loader unloader provides a high parallel single solution for singulated and strip IC testing with controlled and sensitive handling. The system is scalable; one system can be used as a Loader or Unloader, or can be reconfigured as a dedicated Loading or Unloading system.
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Pattern Converter for WGL/STIL to ATE
VectorPort
VectorPort is a versatile, low-cost test development tool for converting WGL or STIL vectors to targeted ATE tester formats, including pattern, timing, and pinmap data. VectorPort can read and write all major formats in both parallel (Flat) vectors and serial (SCAN) vectors.
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3D Measurement
PSD-Array
The PSD array consists of 16 parallel one-dimensional PSD elements on the same chip. By utilizing the triangulation technique the reflection of a laser line or multiple laser spots onto the PSD array will provide information about the contour of the illuminated object. The possibility for simultaneous readout of the 16 elements together with the fast response of each element makes the PSD array suitable for applications like high speed 3D contour measurements and measurements of parallel, moving objects such as cantilevers.
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In-Line Flashing Station
AR302
The 6TL AR302 In-Line Flashing Station is designed with the most innovative numeric movement control technologies and ensures reliability and precision.With multiple flash programmer options, it offers a high PCB transfer speed and includes a stopperless system. Up to 40 devices in parallel can be programmed and no compressed air is required for operation.
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Solution For Test-in-Strip
InCarrier
The InCarrier process is based on a strip-like device carrier for single devices that combines the advantages of the singulated device test with the advantages of high parallel strip test. Leveraging the strip like design the InCarrier ensures robust test-handling for even smallest devices and supports high parallel test.
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Parallel NTDS Isolation Tap Box
IXI’S NTDS parallel isolation tap box is the ideal solution for relibility tapping NTDS parallel type A, B, C, and H interfaces. It connects easily to existing cables forming a tee connection that can be used for data monitoring and acquisition over long distances without interference with your system.
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Data Acquisition (DAQ) And Real-time Control Systems
Our data acquisition devices are capable of storing hundreds of analog and digital channels at full speed while allowing in parallel data to be sent out in real-time to any 3rd party EtherCAT master controller. We have brought the worlds of data acquisition and real-time control closer together which will save you time and money in a big way.
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Digital I/O Card
PCI-DIO-120
The PCI-DIO-120, PCI-DIO-96 and PCI-DIO-72 are parallel digital input/output cards designed for use in PCI-Bus computers. The same printed circuit board is used for all three models and is populated for 120 bits, 96 bits and 72 bits respectively. The card is 12.2 inches (310 mm) long and may be installed in any 5-volt PCI slot in IBM and compatible computers.
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Hyperspectral Cameras With USB3 Vision
XiSpec
*Smallest Hyperspectral camera - Compact, lightweight with only 26.4 x 26.4 x 31 mm, 32 grams (1)*Cost efficient - Excellent value and price through utilizing new imec hyperspectral imaging technology*Cool economy - Low power consumption with 1.6 Watt, minimal heat dissipation, ideal for UAV / UAS*All-around support - USB 3.0 support for Windows 7 and 10, macOS, Linux, ARM*Powerful potential - Highest spatial and spectral resolution, possible with 5Gb/s interface*Optimized - 2048 parallel, "on-chip" integrated spectroscopes with 100 points of spectral resolution each*AIA standard - USB3 Vision standard compliant*Industry standard interface - Compatible with USB 3.0 SuperSpeed specification*Fastest Hyperspectral camera - High speed, high frame rate: based on 170 fps at 2.2 Mpix resolution*Connectivity and Synchronization - Programmable optoisolated input and output, 3 status LEDs*Easy deployment - Range of accessories and wide hardware and software integration*Highly Customizable - Variety of sensor options, which can be further adjusted to match requirements*Interoperability increase - Continuous embrace of new software and hardware partners
