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Probe Systems
use programmable motorized staging to position contacting pin s.
See Also: Probe Stations, Flying Probes
- Advanced Telemetrics International
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Prop Shaft Torque Measurement Systems
Advanced Telemetrics International
ATi Telemetry Systems are typically used to transmit data from rotating shafts or machinery to a stationary receiver. The Miniature Strain Gage Transmitter can be attached to strain gages adhered to your shaft in order to transmit shaft torque and thrust while the system is running.
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Instrument Systems General Accessories
Konica Minolta Sensing Americas, Inc
Instrument Systems General Accessories current range of optical probes and measurement adapters using fiber optics as a means to transport light in the spectrometer was a primary goal sought by Instrument Systems from the beginning of their product development.
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Differential Voltage Probes
DP150/DP200pro
The DP differential isolation probes are an important accessory for any laboratory involved in power electronics and high voltage systems. These probes allow isolated and floating measurements with any oscilloscope or data recorder, whilst the oscilloscope can remain grounded. Using a DP150 or DP200pro probe, differential and floating measurements can be made on a variety of ac power systems like 230V/110V ac input power supplies, chopped and switching power supplies, thyristor controllers, variable speed motor drives (PWM signals), motor inrush current and measurement across current shunts. The isolated input is made via two 4mm/banana safety sockets. The BNC output allows easy connection to an oscilloscope. The DP probes can be powered from a 9V battery or external power supply.
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MPI Manual Probe Systems
MPI Advanced Semiconductor Test
manual probe systems are open, easy to use and cost effective yet highly accurate. These systems are designed for precision analysis of substrates and wafers up to 150, 200 and 300mm.
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Fully Automatic MRAM Probe System
*This system can measure MRAM characteristics automatically.*Generates strong and constant magnetic fields. (Max 1.5T, the highest in the industry)*Performs high speed sweep of magnetic field by using non-magnetic materials wafer chuck. (Max 4Hz, ±1T, the highest in the industry)
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Manual Fixture Kit
230373 – CMCSK-04-01
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Pitot Static Tester / AoA TESTER
ADSE 744
This tester was specifically designed for the new-generation pitot tubes that integrate sensing probes, pressure sensors and powerful air data computer processing to provide all critical air data parameters including Pitot and static pressure, airspeed, altitude, and angle of attack. This Pitot Static tester is designed primarily for flightline use to cover the testing of all barometric and manometric pressure instrument systems. The AoA Channel behaves as a second Ps channel, in order to create a differential pressure between the 2 Ps Channel, allowing to performsimulations of different Angles of Attack. The large touch screen display, with on-screen help, enables all checks to be carried out easily on the flight deck or in the cockpit, by a single operator. The ADSE 744 is robust and housed in amobile weatherproof case. An attached bag contains the pressure hoses and electrical cables.
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BGA Sockets
Our BGA socket platform takes advantage of the H-Pin®, a high-performance stamped spring probe pin, to provide a pure vertical contact system that meets all BGA design challenges at an enabling cost.
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Reverse Test Probe
I-Stop
The I-Stop Reverse Test Probe is a test accessory designed for use with most signal level meters and with the Trilithic 9580 Return Maintenance System. Screw the probe into a distribution tap's unused KS port and a spring-loaded "stinger" connects a 20 dB resistive test point circuit to the hardline.
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Calibration Substrates
The GGB Industries, Inc., line of CALIBRATION SUBSTRATES allows the user to calibrate any GGB Industries, Inc., microwave Picoprobe® at the probe tip. The underlying principal of the calibration of a measurement system is to provide accurate known standards to which the measurement system can be connected
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Cryogenic Probe Station
TTPX
The TTPX probe station is an affordable, entry-level probe station capable of making a wide variety of non-destructive, standard electrical device measurements. The compact tabletop design is perfect for academic and laboratory research settings. The TTPX provides efficient cryogenic temperature operation and control with a continuous refrigeration system using either liquid helium or liquid nitrogen.
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Isolated Hall Effect Current Sensors
Isolated Hall Effect current sensors provide accurate high bandwidth current sensing. Vektrex offers models to 320A. For use, the 50-ohm voltage output is connected directly to an oscilloscope or data acquisition system. VCS sensors are magnetically isolated like clamp-on oscilloscope probes. With secure cable attachment, repeatability is ensured.
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Recirculating Chillers
Recirculating chillers from Lake Shore offer high performance for improved cooling capacity for your Hall measurement system, VSM, probe station, or electromagnet application.
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CAMGATE Test Kits
Series 453
LThe GR Series 453 CAMGATE mechanical kits, utilizing the patented CAM mechanism, offer precise Z axis linear motion when testing higher point count and finer pitch test centers. By using the Z axis motion, side load of the test probes is minimized thus increasing probe life and performance. The Series 453 provides interface compatibility using the GR2270 Style, 12 block interface. This interface accepts the industry standard I/O, power, and coax blocks. The CAM/GATE utilizes a cam roller system for precision guiding and smooth operation and 1.00” push plate movement. The gate assembly is movable to three different positions which allows for the versatility of top side probing, or relocating the frame assembly for PCA’s the have tall components.
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ATE Integration
Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).
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Complete Power Analysis System
PK3564-PRO
PK3564-PRO complete Power Analysis System includes PS3550 Power Analyzer, AC charger, Quick-Start manual, deluxe voltage leads, four eFX6000 flexible current probes, SD memory card, CAS3 hard-shell carrying case, PSM-A Software, Mini Line-to-DC Converter, Bluetooth Adapter, USB Communications Cable, and 1-year deluxe warranty.
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Adjustable Press Plate Bed of Nails Testers
Protector Adjustable Family
Designed for testing heavy massive boards. Boards with heavy components like large transformers and inductors can destroy normal test fixtures. This design utilizes a 3 plate system where an internal lever actuated sub plate containing the test pins raises to probe the circuit board when the handle is pulled. Heavy boards can bend and break exposed test pins. Similarly large boards which need to be probed by very small delicate test pins can also benefit from this protected test fixture design. This fixture is recommended in situations where there is a high board mass to pin size ratio and pin protection is required. Front and rear panel modular inserts allow for easy updates and customizations to the user hardware interface.
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Controlled impedance test system
CITS900s4
CITS900s4 is the seventh generation of Impedance test system from polar, and typically the most popular model for customers who are new to impedance control. CITS900s4 provides both differential and single ended measurement capability along with 4 channels to provide flexible probe connection.
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Voltage Probe
Shortsniffer
The ShortSniffer Voltage probe evolved as an effective troubleshooting tool for a small set of problems, but has been quite useful in a variety of non-obvious circuit design, development, troubleshooting, and optimization efforts. Let me tell you about the characteristics of the system and of a few of the successes with the non-traditional uses, and maybe you will find this tool useful in your design or troubleshooting efforts.
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Remote Test Unit (RTU) Expert
RTU Series
VeEX’s Remote Test Units (RTU) are self-contained, scalable test and monitoring probes for communications networks. When used as part of the VeSion cloud-based monitoring system, these rackmount probes are optimized to work with a centralized server system. In addition, the probes can be operated in standalone mode via web browser.
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Calibration
RF Test Equipment
We calibrate following types of RF test equipment:EMF test systems (frequency selective)EMF test systems (broadband)Field strength transfer standards (e.g. RefRad)Line Impedance Stabilisation Network (LISN)Cable, attenuator, couplerAntennaField Probe
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Near Field Probe Set
RF100
The RF100 probe set consists of a passive E field probe and H field probe, BNC adaptor and carry case. The output is via a BNC socket. These are general purpose probes which are ideal for use in conjunction with an EMC measuring system. They are sensitive to sources in close proximity, but are insensitive to background signals. This makes them ideal for the identification of emission frequencies in noisy environments... thus making measurements easier and quicker. The proximity requirement also enables sources to be located and the exit route identified.
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Supported Test Systems
TTCI is a leading solutions provider of application development for test systems from Seica, Keysight, Teradyne, Digitaltest, and XJTAG. We offer a wide variety of testers and test solutions to meet your needs. Our Seica Pilot and Digitaltest Condor flying probe systems can handle all of your low- to mid-volume production, prototypes, and PC boards with accessibility issues. The Keysight 3070 and Teradyne TestStation can address your larger production runs and fixture requirements. In addition, we can also address your functional and boundary scan needs.
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AirTech Test Systems
Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
Hillger NDT has developed AirTech testing technology for the requirements of air-coupled testing. Our USPC 4000 AirTech ultrasonic testing system and our robust AirTech sensors consisting of optimized transmit and receive probes deliver optimal results under demanding conditions.
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SIP-90-3 Test System Interface Probe
SIP-90-3
Overall Length (mil): 700Overall Length (mm): 17.78Rec. Mounting Hole Size (mil): 55Rec. Mounting Hole Size (mm): 1.40Recommended Drill Size: #54 or 1.40 mm
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Changeable Cassette
230354/1 – CMK-05
Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Flying Probe Electrical Testers
Gardien has been present in the PCB industry since the advent of the personal computer. In our beginning Mania, the company that pioneered some of the first electrical grid testers used by PCB fabricators. We still produce class leading equipment to this day, such as our line of Gardien Flying Probe Testers and our Acceler8 Scanning System.
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Semiconductor Test
Smiths Interconnect’s test socket and probe card solutions utilize IDI contact technology to ensure superior quality and reliability in semiconductor test applications. Our best-in-class engineering, development and technical expertise ensure support of automated, system level and development test platforms.
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DDR4 X16, 2-Wing, Small KOV, BGA Interposer For Logic Analyzers
W4636A
The W4636A DDR4 x16 – 2 wing BGA interposer for 96 ball DDR4 DRAM is designed for data rates up to and including 2.4 Gb/s. The W4636A probes all ADD/CMD/CNTRL and partial DQ/DQS, and it is designed for minimal KOV for space limited systems under test. The W4636A is the least expensive DDR4 BGA interposer for a logic analyzer.
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InfiniiMax III+ Series Probe Amplifier, 4 GHz
N2830A
The N2830A Series InfiniiMax III+ probing system is the next generation of InfiniiMax probing, greatly expanding the measurement capability and usability of a probe capable of measuring all components of a differential signal. The built-in InfiniiMode technology allows customers to switch differential, single-ended, and common mode without adjusting probe tip connections.
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Hub of the System
Net-ESVR
The Enterprise Server NET-ESVR is a hub of the system. Its central role is to receive every 5 seconds the alarm status of each probe NET-XXX and to store the status and update system alarm matrix. It also provides communication with the multiple Clients NET-NMSC.
