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Test Pattern
Test signals for the calibration and alignment of TV broadcast and reception equipment.
- Taylor Dynamometer, Inc.
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500 HP Complete Bench Hydraulic Test Center With High Flow Supply
HTC-500-HFS
The Hydraulic Test Center (HTC) is a versatile machine designed to test heavy-duty, off-highway hydraulic components. The 500 hp (373 kW) HTC Complete Bench is for the dealer that services components from a predominately larger machine size mix such as large mining machines and large excavators. The Complete Bench offers full functionality to test all types of pumps and motors including: transmissions, hydraulic motors, hydraulic cylinders, valve blocks, torque converters, open and closed loop pumps.
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Video Test Generator
701A
If you’re testing digital or analog computer monitors, video projectors, multimedia monitors, or TVs, the 701A Video Test Generators provides the signals, test patterns, and audio to do your job, easily and accurately. Field technicians and factory people on the move will appreciate the convenience of battery power and small size. The 701A Video Test Generator is designed to go where you go.
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Digital/Pattern/PE Card
PE16S
The PE16S represents a new level of performance and capabilities for PXI-based digital instrumentation. Based on the proven architecture of the PE16, the PE16S offers high performance pin electronics and an enhanced timing generator in a compact, 3U PXI form factor. Each card can function as a stand-alone digital subsystem or if required, multiple cards can be interconnected, supporting up to 256 bi-directional pins (16 boards). The PE16S offers 16 programmable level input or output channels with 2 PMU . The PE16S also supports deep pattern memory by offering 32 M of on-board vector memory with per channel dynamic direction control running test rates up to 66 MHz.
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Pattern Converter for WGL/STIL to ATE
VectorPort
VectorPort is a versatile, low-cost test development tool for converting WGL or STIL vectors to targeted ATE tester formats, including pattern, timing, and pinmap data. VectorPort can read and write all major formats in both parallel (Flat) vectors and serial (SCAN) vectors.
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Bennewart Flex Tester
UI-FT26
Bennewart Flex Tester, also named as Whole Shoe Sole Flexing Tester, is used to test outsole flexing resistance. The whole shoe sole flexing tester is intended to know the effect of sole materials and surface patterns on cut growth by flex sample in 90°as per ISO 20344, ISO 17707, DIN 53543 and etc.
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Test Patterns
DisplayMate Multimedia Edition
DisplayMate Technologies Corporation
DisplayMate Multimedia Edition is the most advanced and powerful version of DisplayMate ever, with lots of proprietary and highly innovative suites of test patterns for setting up, tuning-up, calibrating, testing, evaluating, diagnosing, and analyzing CRTs, analog and digital LCD, Plasma, DLP, LCoS, and SXRD monitors and projectors, microdisplays, video boards, color printers, TVs and HDTVs, NTSC/PAL Television encoders and decoders, and more.
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Dual Channel Bit Synchronizer for Rates up to 45 Mbps
LS-45-DB
The Lumistar LS-45-DB Dual Channel Bit Synchronizer Daughterboard provides optimal reconstruction of a serial PCM data stream that has been corrupted by noise, phase jitter, amplitude modulation, or base line variations. The all-digitaldesign assures a high performance, consistent product, with excellent reliability and long-term stability. Dual channel design can feed each channel of the LS-55-DD dual decom. The LS-45-DB also has a post D combiner that allows for optimal ratiocombining of the two input signals A unique Built-in-Test feature allows performance verification for the Bit Synchronizer to ensure the highest level of operation. Auto-test BIT is performed for a short duration on the application of power and tests more than 90% of the Bit Synchronizer components. This test verifies that power is properly applied, verifies that there are no internal bit errors, and performs other tests to ensure that the bit synchronizer is fully operational with status indication of results. Command-test BIT performs the same functions and can be initiated by the user at any time through the Lumistar software when used on Lumistar PC products. The user has the ability to generate internal pseudo-random patterns and calculate internal bit error rates with or without the injection of forced errors.Various status indicators are also available through the software. The Bit Synchronizer also contains a BER reader as well as frame sync pattern indicator.
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RF & Microwave
Data Patterns has a strong RF and Microwave engineering capability, featuring a team of enthusiastic engineering talent, substantial investments in RF test and measuring instruments, and attitude to utilise the latest technologies.An in-house manufacturing capability and an insatiable demand for fulfilling requirements of Radar, Electronic Warfare and Communication domains, Data Patterns has developed a whole line of building blocks including TR Modules, Up and Down Converters, Power Amplifiers, Transmitters, Combiners and Dividers for specific requirements. A list of products is given below.
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Broadband Antenna
Vivaldi
The dbDIRECT Broadband Antenna features a broad frequency range of operation, high gain, small form factor and directional radiation pattern, making it highly attractive for widespread use in test and measurement of emerging wireless technology devices and radars. Contrary to conventional Vivaldi antennas limited to operating only at higher frequencies, the dbDIRECT Broadband Antenna design is optimized to operate at a frequency as low as 700 MHz up to 6 GHz. This lightweight and compact antenna design provides excellent matching over a broad frequency range.The antenna is designed to be placed in a DVTEST's portable anechoic chamber such as the dbSAFE enclosures for OTA (Over the Air) testing of DUTs. The antennas can be mounted in fixed positions to facilitate repeatable results. When used in conjunction with a rotary positioning mechanism, customers are able to detect the highest point of power sensitivity for enhanced accuracy and repeatability in measurements. In this configuration, both the antennas and DUTs can be positioned in order to facilitate the measurement.
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Display Color Analyzer
Model 7123
Luminance and chromaticity measurement of Color Display0.005 cd/m2low luminance measurement (A712301)Wide luminance range: 0.0001 to 25,000 cd/m2 (A712301) 0.01 to 200,000 cd/m2 (A712302)High accuracy measurementMaximum 9 display modes: xyY, TΔuvY, u’ v’ Y, RGB, XYZ, Contrast, ProgramAble to control Video Pattern Generator and UUT (Unit Under Test)Built-in contrast measurement function to calculate the contrast ratio directlyEquipped with programmable test items that can complete the planned tests with one single buttonSupport USB flash disk that can copy the test procedures to other station for useJudgment function embedded to judge the test result automatically with one single buttonCalibration period setting and reminding functionMemory for storing 100 channels of standard color data and calibration dataBuilt-in flat display calibration data LCD-D65 & LED-D65* to be applied for chromaticity measurement instantlyOptional display white balance alignment system can be used to integrate all optical test stations to one single station
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Full Wafer Test System
FOX-1P
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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PCB Test Fixture Kits And Customized Fixtures
Mirotech manufactures portable benchtop PCB test fixture kits and provides customized test fixture solutions for the electronics industry. Our innovative, streamlined designs are compact in size and feature a linear collapsing system, interchangeable and reusable plate design, top and bottom probing, and are affordably priced. All fixtures are built using high quality hardware and materials and manufactured using the DATRON M8Cube, known for its precision and accuracy. Each of our custom designs are unique to our customer’s particular project requirements. Fixture kits come pre-assembled, and include blank plates ready for you to drill your test pattern.
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Test Pattern Generator Delay & AV Sync Analyzer
VQDM-100
Versatile compact and robust multi-purpose tool for R&D and glass-to-glass QA/QC Instant visual-aural quality estimation plus automatic latency, AV sync and 3D LR sync measurement Multi-channel time-line analysis, including video frames continuity testing 4 Light Sensors with vacuum caps, 4 Audio inputs (standard line levels) 2 channels of AV timing analysis, simultaneous measurements of Video and Audio Latencies Real time multi-channel data acquisition via USB port Unique sophisticated set of static and dynamic test patterns up to 1080p@60fps - see more details in separate VQL page Source of VQDM, VQMA2, and VQMA3 Test Patterns for VideoQ Analyzers Multi-format digital and analog AV outputs: HDMI, YPrPb, S-video, SPDIF, LR analog audio Networkable unit, easy expansion with any external USB storage device: live clips, user content, etc.
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Pattern Generator
PI-2005
As a test engineer or digital designer you must have state-of-the-art tools to test, characterize and verify your complex semiconductor devices and digital circuit boards. The PI-2005 Pattern Generator will generate a wide range of simple or complex digital patterns for any test application that requires a serial or parallel digital data stream. To meet the requirements of complex devices and digital circuits, the pattern generator can be configured from 16 to 64 output channels.
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Day Camera Testing
CI Systems' CCD test stations are used to carry out all the necessary tests to verify and compare the quality of a CCD based camera. These stations are based on CI Systems' reflective collimators, Visible Radiation Sources, special targets and integrated software, to project standard patterns with known geometry and intensity to the Unit Under Test. As a result, these stations are turnkey solutions for the CCD camera testing needs.
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Test Pattern Generator Software
ScanExpress TPG
To deliver a product meeting the highest standards of quality and reliability, design engineers and test engineers alike must maintain test capabilities throughout the entire product life cycle, from prototype to manufacturing. Automation in test generation is essential to ensure that tests keep up with the rapid development of modern products.The ScanExpress TPG™ Intelligent Test Pattern Generator Software provides a highly advanced, automated boundary-scan test design environment—perfect for quick and efficient creation of complete boundary-scan tests for all IEEE-1149.1 and IEEE-1149.6 compliant circuit boards.
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DisplayMate Multimedia with Motion Bitmaps Edition
DisplayMate Technologies Corporation
DisplayMate Multimedia with Motion Bitmaps Edition includes a Motion Engine that moves a special set of test patterns and test photos to measure and evaluate response time, motion blur and motion artifacts in displays for different speeds, directions, intensities and colors for all monitors, projectors and HDTVs. It has everything in the standard Multimedia Edition including all of its 500+ test patterns up through 3072 x 3072 resolution.
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370MHz To 4GHz Radiation Measurement System
RMS-0440
The MegiQ Radiation Measurement System (RMS) is a compact test system that performs 3-axis radiation pattern measurement in non-anechoic spaces.
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Test Pattern Generators
Video Test Pattern Generator, Portable Monitor Tester, Test Video Audio Signals, HDMI, DVI, SDI, Component Video, HDCP
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ICT/FCT-Fixtures, Max UUT 250 × 180 mm (wxd)
CK-1-228X-S (Small IF) / 230514
The series of In-Circuit testers that are Teradyne for the 228x and TestStation are dedicated tools that rely on the tester hardware for diagnostics and test pattern delivery. The integration of the stand-alone BTS with the Teradyne ICT can enhance the system’s capability. In other words, it can provide access to additional tools. It provides the user with a common platform and portability of test patterns from stand-alone to ICT and later on to functional test and depot test stations.
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ISO Test Charts
ISO has been the governing body for Image Quality Testing all over the world. To that end, APPLIED IMAGE is proud to be a participant in assuring that the industry has products that meet or exceed the requirements of ISO. Since ISO covers many levels, we provide test patterns of various types that can be used for Image Capture and Evaluation of Optical and Imaging systems of all types.
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Multi-Wafer Test & Burn-in System
FOX-XP
The key features of the new FOX-XP test cell that contribute to the cost-effectiveness of the solution include the ability to provide up to 2,048 "Universal Channels" per wafer, which allows the system to test all the devices on the wafer in parallel. The new "Universal Channel" architecture allows any channel to be any function (I/O, Device Power Supply (DPS) or Per-pin Precision Measurement Unit (PPMU)). This enhanced architecture now allows customers to perform per pin parametric testing, more extensive digital pattern test with deeper data stimulus / capture memory (32M per pin), and deeper scan (768M) optimized for BIST/DFT testing.
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4 Channel 24.5~ 29.0 Gb/s Pulse Pattern Generator and Error Detector
CA9808
The UC INSTRUEMNTS CA9808 4 Channel 24.5 ~ 29.0 Gb/s (100Gb/s) Pulse Pattern Generator and Error Detector is a high performance, flexible and cost effective four channel Pulse Pattern Generator and Error Detector that can operate from 24.5 Gb/s to 29 Gb/s each Channel. 4 channel 29.0 Gb/s make it total up to over more than 100 Gb/s testing capacity. It is also a standalone Bit Error Rate test solution that incorporates an internal full rate clock synthesizer.
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Emulate Test in simulation
STIL-VT
Emulate test patterns in simulation environment with DUT simulation model. The simulation allows pre-silicon debug of test patterns. Reads the intermediate STIL format of tester patterns and creates a Verilog /VHDL simulation test bench. (A sub-set of Virtual tester solution)
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12 Channels 1.0 ~ 17.0 Gb/s (200Gbps) Pulse Pattern Generator and Error Detector
CA9806-12
The UC INSTRUEMNTS CA9806-12 is a highp erformance, flexible 12 channels Pulse Pattern Generator and Error Detector that can operate from 1.0 to 17.0 Gb/s (200 G). It is combined with three sets CA9806 4 CH 1.0 to 17.0 Gbps Pulse Pattern Generator and Error Detector that incorporates an external one by 4 rate clock synthesizer. Its small size allows it to be placed close to the device under test, it can also be placed further away using the TX driver pre and post emphasis controls features to compensate for cable and interconnect losses. It also has a non destructive, integrated eye outline capture feature along with a quick eye height and width measurement capability. Build-in 8.5 ~ 15 Gb/s eye diagram testing function.
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Vector Translation Platform
Solstice-TDS
New, casual, or advanced users can be productive right away with Solstice-TDS test engineering centric GUI. WaveMaker+ makes simple vector translation tasks simpler, and massive enterprise multi-group pattern conversion projects easy to coordinate and manage in a flow-based use model.
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Computer Monitor & LCD Analyzer
MonitorTest 2.2
PassMark MonitorTest is a tool that allows users to investigate the quality and performance of their computer monitor or LCD flat panel screens. With more people spending more time in front of computer monitors it is important to purchase a quality monitor that will provide crisp, bright images, while reducing the strain on your eyes. The MonitorTest software generates test patterns on the screen at a variety of different resolutions and color depths to test for optimum visual performance.
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Boundary Scan
TurboBSD
TurboBSD is SynTest high-performance Boundary Scan Designer. It is 100% compliant to the IEEE 1149.1 Boundary Scan Standard. TurboBSD performs Boundary Scan logic synthesis, creates BSDL (Boundary Scan Description Language) file, and generates Boundary Scan test patterns
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NTSC PATTERN GENERATOR
PG-38
Model PG-38 NTSC Pattern Generator can be use to quickly and easily troubleshoot, test, and align NTSC television. Features a wide selection of popular video patterns including Color Bars, Crosshatch, Dot, Staircase, Circle, Center Cross, Window, and Raster for accurate and comprehensive TV troubleshooting and testing. Supports both progressive and interlace scanning system. Composite video and S-Video output. RF video output on Channel 3 with 1KHz audio tone for audio troubleshooting. User friendly interface for easy operation.
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DFT Validation And Silicon Debug Platform
NEBULA Silicon Debugger
NEBULA provides advanced features for performing early validation of DFT infrastructure and ATPG patterns in first silicon. The NEBULA solution directly imports test pattern formats and DFT information from leading EDA vendor tools, such as Synopsys' TetraMAX and Cadence's Encounter Test.
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FUEL INJECTOR CANISTER CLEANER
FIT470B
*Cleans carbon from intake valves, fuel passages and cylinders with a professional carbon cleaning solution*Will restore the original spray pattern more effectively, giving improved performance, fuel economy and emission tests*Uses shop air with any professional canister cleaning solution on the market
