JTAG Technologies Inc.
We are a solutions company specializing in PCB assembly testing, fault diagnosis and device programming. We develop innovative products built upon boundary-scan (IEEE Std 1149.x) standards and supply our software and hardware products and services world-wide.
- 877 FOR JTAG
+31 (0) 40 295 0870 - +31 (0) 40 246 8471
- info@jtag.com
- Boschdijk 50
Eindhoven, 5612 AN
Netherlands
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product
64-Channel Boundary-Scan Digital I/O Scan Module
JT 2111/MPV DIOS IDC
The JT 2111/MPV is a 64 channel boundary-scan digital I/O scan module enclosed in an impact resistant housing. The module is designed to test and control edge connectors, on-board connectors and logic clusters in boundary-scan applications. Multiple modules can be connected serially to increase the number of I/Os. Available with 96-pin DIN 41612 connectors and 20-pin 0.1″ pitch IDC connectors.
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ATE Integration
Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).
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I/O Modules
JTAG Technologies designers have been developing high-speed digital test equipment for well over 30 years. The current range of controllers ranges from the compact, stylish and reliable JT 3705/USB to the rugged, dependable DataBlaster family and variants that have been developed for industrial use. The latest addition, JT5705/USB adds analog measure and source capabilities to provide a true mixed-signal tester platform.
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BSD (Test Diagnostics)
BSD Test Diagnostics software can be added to either developer or factory run-time systems to further improve the location of faults such as net bridges (short-circuits), open pins, open nets and even ''twisted'' connections that can occur within cable assemblies. BSD Test diagnostics reports faults in a verbose English language statement with pin level information included and can easily interpret multiple fault conditions.
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JTAG Live Controller
The JTAG Live Controller is USB connected and powered and features a single test access port in JTAG Technologies standard 10-way IDC pin-out. The JTAG Live controller is a smart, low-cost and easy-to-use USB JTAG/Boundary-scan interface.
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DDC (Dual DIMM Carrier) DIOS Adaptor
JT 2702/DDC
The JT2702 Digital 256 channel JTAG I/O module. JT2702/DDC (Dual DIMM Carrier) is a DIMM DIOS accessory product. It is typically used in custom test adapters or fixtures where a large number of digital I/O channels are required with a minimum space overhead.
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Production Stand-Alone
PSA
Using PSA, test engineers can build sequences of applications in the built-in AEX (Application EXecutive) manager using if then else goto capabilities. Sequence builders can also include additional capabilities through DOS/Win command line calls, create serial number logged test reports, export tests results to a database etc.. PSA includes drivers for all JTAG Technologies controller hardware past or present.
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Flex Socket Test Module
JT 2127/Flex Socket Test Module
The JT 2127/Flex STM memory socket tester is a family of hardware adapters specifically designed for the testing of of PCB-mounted DIMM & SODIMM sockets using a JTAG/boundary-scan controller and supporting software. The testing of memory sockets has always been troublesome for test and production engineers using JTAG/boundary-scan systems. Even when it is possible to create memory writes/reads from a boundary-scan compliant access device on the UUT (Unit Under Test), the initialization process may fail leaving you with little diagnostics information. What’s more it can still be uncertain whether fault lays with the DIMM module itself or the socket. Using the new JT 2127-Flex system from JTAG Technologies you get pin-point diagnostics from a known-good test interface so you can be certain that your socket is soldered correctly.
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product
USB Explorer (Two Port)
JT 3705
The JT 3705/USB Explorer is a low-cost two port USB powered boundary-scan controller interface specifically suited for low volume testing and in-system programming of (C)PLDs. Explorer supports two fully-compliant boundary-scan test access ports (TAPs) which can be synchronized for test purposes.
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Training Board
The JT 2156 training board has been devised to demonstrate all the latest features and test techniques available to users of JTAG Technologies’ ProVision & JTAG Live application development systems. As well as a modern ARM Core processor, the design also includes an Altera Cyclone FPGA, DDR Memory, Ethernet PHY, and several SPI and I2C peripheral parts. The JT2156 is shipped with a comprehensive self-study manual for getting to know the in-depth features of ProVision and/or JTAGLive Studio. For Altium users the design also serves as an example of how to adapt the Nano board into a realistic custom design.
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eDAK For MAC Panel
JT 2147/eDAC for MAC Panel
The JT 2147/eDAK is a new variant of the JTAG Technologies QuadPOD signal conditioning interface specifically designed for use within a MAC Panel ‘Scout’ mass interconnect interface. The unit integrates both the JT 2148 transceiver circuitry plus four independent, programmable TAP modules (two of type JT 2149 and two of type JT2149/MPV) on a single board that matches the MAC Panel Direct Access Kit (DAK) form factor. Overall this configuration offers four Test Access Ports, 64 Digital IO Scan channels and reconfigurable (SCIL) capabilities
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Digital/Analog/Frequency Measurement Module
JT 2149/DAF
The JT 2149/DAF is a compact, mixed-signal (Digital/Analog/Frequency) measurement module for use in JTAG Technologies’ widely-used JT 2147 (QuadPod) signal conditioning interface. The DAF module has been designed to replace a regular TAP Pod and provides 28 measurement channels plus a clock generator. When connected to a circuit board via edge connector or test fixture/jig test pins, the module enhances standard digital boundary-scan tests by enabling a series of analog and frequency measurements to be made.
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Development Software Suite
JTAG ProVision
The JTAG ProVision software suite is used to generate boundary-scan tests and in-system programming applications for assembled PCBs and systems. This professional development tool is fully automated and supports the import of design data from over 30 different EDA and CAM systems. Other key data inputs are JTAG device BSDL models and a large, well-maintained model library describing thousands of non-JTAG devices.
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ScanBridge
JT 2154
The JT 2154 is an experiment board based on National Semiconductor’s STA111 device, aimed at users looking to utilise addressable bridge/multiplexors within their designs, and thus set-up ‘system level’ JTAG access. The unit can also be used in semi-permanent installations to expand the TAP (Test Access Port) count on JTAG Technologies controllers in order to address highly segmented designs. Built-in support for ScanBridge-type devices within ProVision allows easy set-up of TAP assignments and device addressing.
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Boundary-Scan Controller for PXI-Express 'Hybrid' Slots or Plug-In Controller for PXI-Express Peripheral Slot
JT 37×7/PXIE
High speed and performance JTAG Boundary-scan controller for PXI-Express ‘hybrid’ slots or plug-in controller for PXI-Express peripheral slot.The controllers are targeted at demanding manufacturing test applications, fast in-system flash memory programming and programmable logic configuration. The JT 37×7 is available in different operating levels (memory options) to suit your specific environment and application. Each unit is supplied with a four TAP port signal conditioning module the JT 2147 ‘QuadPOD‘The JT 37×7 DataBlasters are a family of high speed and performance, up to 40 MHz TCK, boundary-scan controllers. Besides being available as bench-top unit with USB/E-net/FireWire interface, these controllers also come as 19″ rack-mountable instrument with the same three interafces and as plug-in cards in PXI(e)and PCI(e) formats.
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Corelis, Inc.
Corelis is a pioneer in the rapid development of innovative IEEE-1149.x-compliant products and services in support of the JTAG/boundary-scan market. As a result of our ingenuity and contributions to the industry, a growing number of customers have been able to incorporate boundary-scan technology into their product development processes in order to gain a competitive edge in today’s marketplace.
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Virginia Panel Corporation
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DFT - MG-Products BV
DFT, Designed for Testing. is part of MG-Products and is specialized in the delivery of functional Testfixture solutions from both MG-products and 6TL. DFT also stands for Design For Test, perhaps the most important step in the development process of your product. DFT ensures that your product can be contacted and tested efficiently and reliably.
